Drift property in non-uniform B field. T.Sawada June 18, 2004.

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Presentation transcript:

Drift property in non-uniform B field. T.Sawada June 18, 2004

Electron drift in E and non-uniformed B field Drift velocity of electron in E, B field (Langevin equation) First order Runge-Kutta integration was applied

Strategy of correction 1.Determine by the data of B=0 (vd=5cm/usec). 2.Execute Runge-Kutta intergration in non- uniform B

Run # (CR) before correction Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 Layer-dependence of resZ Layer ( at < z < ) resZ (mm) Z-dependence of resZ Z (mm)

Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < ) Run # (CR) before correction resZ (mm) Layer = 0Layer = 1

Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < ) Run # (CR) before correction resZ (mm) Layer = 2Layer = 3

Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < ) Run # (CR) before correction resZ (mm) Layer = 4Layer = 5

Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < ) Run # (CR) before correction resZ (mm) Layer = 6Layer = 7

Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < ) Run # (CR) before correction resZ (mm) Layer = 8Layer = 9

Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < ) Run # (CR) before correction resZ (mm) Layer = 10Layer = 11

Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < ) Run # (CR) before correction resZ (mm) Layer = 12Layer = 13

Run # (CR) after correction Z (mm) resZ (mm) Layer ( at < z < ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 Layer-dependence of resZ Z-dependence of resZ

resZ (mm) Layer = 0Layer = 1 Run # (CR) after correction Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( < z < )

resZ (mm) Layer = 2Layer = 3 Run # (CR) after correction ( < z < ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4

resZ (mm) Layer = 4Layer = 5 Run # (CR) after correction ( < z < ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4

resZ (mm) Layer = 6Layer = 7 Run # (CR) after correction ( < z < ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4

resZ (mm) Layer = 8Layer = 9 Run # (CR) after correction ( < z < ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4

resZ (mm) Layer = 10Layer = 11 Run # (CR) after correction ( < z < ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4

resZ (mm) Layer = 12Layer = 13 Run # (CR) after correction ( < z < ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4

Summary The Mean Value of the residual of Layer(5 ～ 13) aprroached almost 0 !! ( Correction of Layer(0 ～ 1) is parhaps needed consideration of non-uniformity of the electronic field around Target-holder. ) I intend to study the following in future : ＞ improvement of resZ of Layer(0 ～ 4) ＞ Z-dependance of resZ.