Development of thin films for superconducting RF cavities in ASTeC R. Valizadeh and O.B. Malyshev on behalf of collaboration team ASTeC Vacuum Science.

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Presentation transcript:

Development of thin films for superconducting RF cavities in ASTeC R. Valizadeh and O.B. Malyshev on behalf of collaboration team ASTeC Vacuum Science Group, STFC Daresbury Laboratory, UK

R ValizadehCERN-LNL-STFC collaboration kickoff meeting2 Motivation The aim is to develop the PVD and CVD coating technologies of superconducting materials for RF cavities and apply it on the RF cavities Objectives: a systematic study of Deposition parameters Film morphology, structure, chemistry AC and DC superconductivity characteristics such as T c, B c, RRR, etc. RF evaluation of samples Cavity deposition and test

R ValizadehCERN-LNL-STFC collaboration kickoff meeting3 UHV PVD facility Bakeable Load-lock chamber DC and RF bias Three planar concentric targets with the variable distance to the substrate: cm Substrate rotation Ion beam assist, 20  T s  950 ºC Differential RGA pumping to analyse the sputter gas. HiPIMS and Pulsed DC,

R ValizadehCERN-LNL-STFC collaboration kickoff meeting4 Base pressure: 1.5 x mbar at 120 ºC Gas flows: Argon, Max 5 l/min, 200 sccm MFC Hydrogen, Max 1 l/min, 100 sccm MFC Heater tested up to 700 ºC (could go 950 ºC) PECVD/ALD deposition

R ValizadehCERN-LNL-STFC collaboration kickoff meeting5 ALD rig ALD valves: tested with Arduino control, switching <1 ms Plasma waveguide Reactor chamber Sample holder SAES gas purifiers

R ValizadehCERN-LNL-STFC collaboration kickoff meeting6 Multi-Probe UHV XPS, AES, AFM, STM, LEED and ISS

R ValizadehCERN-LNL-STFC collaboration kickoff meeting7 New surface analysis rigs: Auger microscope Spatial distribution of the elements (Auger maps or analysis in lines, points and areas) Secondary electron images with spatial resolution down to 200 nm. XPS facilities with energy resolution ~ 0.9 eV. AES and XPS depth profiling.

R ValizadehCERN-LNL-STFC collaboration kickoff meeting8 New surface analysis rigs: SNMS Secondary neutral mass spectrometry Isotope elemental depth profiling. Good sensitivity for hydrogen using Hydrides

R ValizadehCERN-LNL-STFC collaboration kickoff meeting9 XPS analysis C 1s O 1s Nb 3d 5/2 Nb 3d 3/2 Nb 3p 3/2 Nb 3p 1/2 Nb 3s As received Ar+ bombarded

R ValizadehCERN-LNL-STFC collaboration kickoff meeting10 Nb grain sizes within our films: nm This is similar in size to the grains produced in other studies. The films are polycrystalline and highly textured with the prefered direction of growth depending on the substrate orientation and deposition condition RRR values shows no dependence to a preferred orientation Film Morphology: XRD

R ValizadehCERN-LNL-STFC collaboration kickoff meeting11 Only one sample has been analysed using EBSD EBSD data shows grains larger than 18 nm present in the sample, the largest of which are of the order 250 nm across their longest axis. The larger grains are surrounded by a matrix of smaller grains of a similar size to those described by XRD. Film Morphology: Film Morphology: EBSD

R ValizadehCERN-LNL-STFC collaboration kickoff meeting12 samples deposited with a 50-V bias Film Morphology: SEM samples deposited without a bias

R ValizadehCERN-LNL-STFC collaboration kickoff meeting13 RRR measurements have been performed using a purpose built cryostat housing a four point probe. DC SQUID measurements The measurement gives values for both the first and second critical fields, H c1 and H c2. Superconductivity evaluation

R ValizadehCERN-LNL-STFC collaboration kickoff meeting14 5 samples studied for B perpendicular to the sample surface 2 samples studied for B parallel to the sample surface Superconductivity evaluation: DC SQUID A typical DC magnetic susceptibility measurement with the sample parallel to the magnetic field. Some results are quite unexpectable

R ValizadehCERN-LNL-STFC collaboration kickoff meeting15 H c1 H c2 H c1 H c2 H smp Superconductivity evaluation: DC SQUID

R ValizadehCERN-LNL-STFC collaboration kickoff meeting16 H C2 increases with RRR at T = 6 K RRR vs H c2 fim deposited on Silicon

R ValizadehCERN-LNL-STFC collaboration kickoff meeting17 Mock up 3.9 GHz pill box cavity has been fabricated to validate the simulation results obtained with Microwave Studio. Samples: a 100-mm diam. Nb disk a 100-mm diam. copper disk with thin films of Nb deposited on the surface. Pill BOX Cavity: Aluminium mock up RF cavity test

R ValizadehCERN-LNL-STFC collaboration kickoff meeting18 LHe CAVITY CRYOSTAT Liquid Helium Chamber Liquid Nitrogen Chamber Outer Vacuum Chamber Radiation Shield Sample Chamber Cradle Assembly

R ValizadehCERN-LNL-STFC collaboration kickoff meeting19 Magnetic field penetration measurement experiment suggseted by A.Gurevich MAGNET VAPOUR COOLED MAGNET CURRENT LEADS SAMPLE TUBE HOLDER SAMPLE TUBE RADIATION BAFFLE SET LEVEL PROBLE SAMPLE TUBE POSITIONER FIELD PROBES 1 AND 2 WIRING PORT 1 WIRING PORT 2 GHE EXHAUST LHE TRANSFER PORT SAMPLE TUBE SLIDER MAGNET SLIDER 4.2K LHE CRYOSTAT CRYOSTAT TOP PLATE MAGNET SUPPORT SAMPLE SUPPORT 1T Mini magnet

R ValizadehCERN-LNL-STFC collaboration kickoff meeting20 Largest grains of 73 nm deposited by HiPIMS on MgO Increasing gain size expected to increase Hc1 Hc1 has ranged from 0.1 to 0.18 T on Cu and Si substrate Hc2 for films deposited by HiPIMS has been approx. 0.4 T and lower than for DC sputtered films Low Hc2 expected of large grain films and is approaching values expected of bulk Nb (approx T) More stable pinning for films deposited onto Cu substrate when compared to Si substrate Films deposited onto Si show large flux jumps RRR approximately doubles for films deposited onto Cu when compared to Si however no correlation between RRR and Hc2 Films with higher RRR showed fewer flux jumps PVD SUMMARY of RESULTS

R ValizadehCERN-LNL-STFC collaboration kickoff meeting21 CVD deposition of Nb on Cu Tc = 9.3K RRR = 31 Nb(v) Cl Deposited at 650  C

R ValizadehCERN-LNL-STFC collaboration kickoff meeting22 CVD Nb – Electron diffraction

R ValizadehCERN-LNL-STFC collaboration kickoff meeting23 SEM and TEM of PECVD of Nb

R ValizadehCERN-LNL-STFC collaboration kickoff meeting24 Quality of the film (morphology, RRR, H c2 ) depends on deposition parameters such as Substrate temperature, Ion/atom arrival ratio, Substrate bias, Plasma generation at the target DC pulsed or DC HiPIMS Substrate crystallography For CVD/ALD precursor and deposition Temperature Conclusions

R ValizadehCERN-LNL-STFC collaboration kickoff meeting25 Sample evaluation RF pill-box cavity is the best, however High Cost of manufacturing and cost of LHe, Time consuming AC and DC susceptibility: Not direct for RF (H c1 and H c2 ) and a cost of LHe Quicker T C and RRR is an initial of evaluation RRR > 10-73, but does not corrollate with RF Quick, cheap Surface analysis to determine: Dense or columnar Grain size, Composition and impurity Defects density Conclusions (2)

R ValizadehCERN-LNL-STFC collaboration kickoff meeting26 HiPIMS sample deposition for Nb, NbN, NbCN, Nb 3 Ge MgB 2 Plasma ALD deposition Nb, NbN, NbCN, MgB 2 Continuing RRR measurements AC and DC magnetisation measurements Magnetic field penetration SCI multilayer layer RF pill-box test facility Testing with a bulk Nb disk (July 2015) Sample measurements (August 2015) 3D coating (2016) Future plans

R ValizadehCERN-LNL-STFC collaboration kickoff meeting27 Dr. R. Valizadeh, Dr. O.B. Malyshev, A. Hannah, D.O. Malyshev, S. Pattalwar, J. Herbert A. Wheelhouse, P. McIntosh Dr. G. Stenning The UK’s SRF collaboration team S. Wilde, Dr. B. Chesca P. Pizzol, Prof. P. Chalker F. Lockwood- Estrin, Prof. J. Bradley