Fig. 6 from High-temperature tensile testing machine for investigation of brittle–ductile transition behavior of single crystal silicon microstructure.

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Fig. 6 from High-temperature tensile testing machine for investigation of brittle–ductile transition behavior of single crystal silicon microstructure (Image 1 of 3) Akio Uesugi et al 2015 Jpn. J. Appl. Phys FP04 doi: /JJAP.54.06FP04

Fig. 6 from High-temperature tensile testing machine for investigation of brittle–ductile transition behavior of single crystal silicon microstructure (Image 2 of 3) Akio Uesugi et al 2015 Jpn. J. Appl. Phys FP04 doi: /JJAP.54.06FP04

Fig. 6 from High-temperature tensile testing machine for investigation of brittle–ductile transition behavior of single crystal silicon microstructure (Image 3 of 3) Akio Uesugi et al 2015 Jpn. J. Appl. Phys FP04 doi: /JJAP.54.06FP04