LEAP investigation of hydrogen in SRF Niobium 7 th SRF Materials Workshop, JLAB Newport News, VA July 17, 2012 Yoon-Jun Kim and David N. Seidman Department.

Slides:



Advertisements
Similar presentations
Chapter 12 Additional Analytical Methods. Analytical Methods Technique Type Technique application Subdivisions Specific application DescriptionDestruction.
Advertisements

The Effects of Cr Additions on the Morphologies of  ’(L1 2 ) Precipitates David N. Seidman, Northwestern University, DMR The effects of Cr additions.
Focused ion beam (FIB) 1.Overview. 2.Ion source and optics. 3.Ion-solid interaction, damage. 4.Scanning ion beam imaging. ECE 730: Fabrication in the nanoscale:
UIC Physics Analysis of Al x Ga 1-x N Nanowires through Simulated Methods of Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy.
Electron Microscopy for Catalyst Characterization Dr. King Lun Yeung Department of Chemical Engineering Hong Kong University of Science and Technology.
Effect of Accelerating Voltage on Resolution
Sub-picosecond Megavolt Electron Diffraction International Symposium on Molecular Spectroscopy June 21, 2006 Fedor Rudakov Department of Chemistry, Brown.
Lecture 18. Chemical: XPS.
Emre Ertuğrul Emin Şahin Seçkin Gökçe KMU 396 Material Science and Technology.
Fusion Physics - Energy Boon or Nuclear Gloom? David Schilter and Shivani Sharma.
Atomic Force Microscopy Studies of Gold Thin Films
Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.
Lens ALens B Avg. Angular Resolution Best Angular Resolution (deg) Worst Angular Resolution (deg) Image Surface Area (mm 2 )
Composition and thickness dependence of secondary electron yield for MCP detector materials Slade J. Jokela, Igor V. Veryovkin, Alexander V. Zinovev, Jeffrey.
Scanning Electron Microscopy
Chapter 7 X-Ray diffraction. Contents Basic concepts and definitions Basic concepts and definitions Waves and X-rays Waves and X-rays Crystal structure.
X. Low energy electron diffraction (LEED)
Refining of Liquid Metal by Hydrogen Cold Plasma Shanghai University Weizhong Ding School of Material Science and Engineering Shanghai University.
Investigation of Semiconducting materials using Ultrafast Laser assisted Atom Probe Tomography Baishakhi Mazumder F. Vurpillot, A. Vella, B. Deconihout.
Tzveta Apostolova Institute for Nuclear Research and Nuclear Energy,
Atomic Scale Analysis of Nanostructures Gregory B. Thompson, University of Alabama, DMR Intellectual Merit Ta enrichment at a triple junction grain.
WSO/UV-LSS Detector with large dimension MCP Baosheng Zhao* National Astronomical Observatories of CAS *
Introduction Current and proposed linear colliders, energy recovery linacs and light sources require high quality electron sources. In particular, low-emittance.
High Current Electron Source for Cooling Jefferson Lab Internal MEIC Accelerator Design Review January 17, 2014 Riad Suleiman.
LRT2004 Sudbury, December 2004Igor G. Irastorza, CEA Saclay NOSTOS: a spherical TPC to detect low energy neutrinos Igor G. Irastorza CEA/Saclay NOSTOS.
Updates of Iowa State University S. Dumpala, S. Broderick and K. Rajan Oct-2, 2013.
Detectors and Cross Talk Presented below are cross talk measurements carried out on 2 Burle and 1 Hamamatsu MCP PMTs and 1 Hamamatsu MultiAnode PMT (MAPMT).
BCC Ti/BCC Nb HCP Ti/BCC Nb Phase Stability in Thin Metallic Multilayers Gregory B. Thompson, University of Alabama Tuscaloosa, DMR Intellectual.
Characterization of nuclear transmutations by 638 nm laser beams ( ¹ ) STMicroelectronics, via Tolomeo, Cornaredo Milano-I ( ² ) Applied Electronics.
Atomic Force Microscopy (AFM)
Gregory ClarkeTechnological Plasmas Research Group Time resolved diagnostics for pulsed magnetron plasmas.
Mass Analyzers : Time-of-flight Mass Spectrometry CU- Boulder CHEM 5181 Mass Spectrometry & Chromatography Joel Kimmel Fall 2007.
March 28-April, Particle Acceleratior Conference - New York, U.S.A. Comparison of back-scattering properties of electron emission materials Abstract.
SEM Scanning Electron Microscope
X-ray diffraction and minerals. Is this mineral crystalline?
1 Deuterium retention and release in tungsten co- deposited layers G. De Temmerman a,b, and R.P. Doerner a a Center for Energy Research, University of.
Self-consistent non-stationary theory of multipactor in DLA structures O. V. Sinitsyn, G. S. Nusinovich, T. M. Antonsen, Jr. and R. Kishek 13 th Advanced.
Frank Batten College of Engineering & Technology Old Dominion University: Pulsed Laser Deposition of Niobium Nitride Thin Films APPLIED.
Nanoscale visualization of early  /  '-phase separation NSF Grant MET DMR , Northwestern University, David N. Seidman, PI Aging experiments at.
Lecture 3-Building a Detector (cont’d) George K. Parks Space Sciences Laboratory UC Berkeley, Berkeley, CA.
Atom Probe Tomography of Advanced GaN-based LEDs James Speck, University of California-Santa Barbara, DMR Atom Probe Tomography 3-D atomic scale.
Conductive substrate position-sensitive detector -V pulse 3-d Composition Mapping of Semiconductor Nanowires Semiconductor nanowires (NWs) are one- dimensional.
Rutherford Backscattering Spectrometry (RBS)
Mass Spectrometry Relative atomic masses and the mass of individual isotopes can be determined using a mass spectrometer. The principle behind mass spectrometry.
Phase-partitioning and site-substitution patterns of molybdenum in a model Ni-Al-Mo superalloy David N. Seidman, Northwestern University, DMR Atom-probe.
Step Dynamics in Homogeneous Crystal Growth MATTHEW KOPPA.
Atomic-scale characterization of Nb for SRF cavities using UV
Comparison b/w light and electron microscopes LIGHT MICROSCOPE ELECTRON MICROSCOPE Magnification can be done upto 2000 times Resolving power is less.
The Applied Superconductivity Center The National High Magnetic Field Laboratory Florida State University 7 th SRF MW Investigation: Variation of Surface.
Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.
MICRO-STRIP METAL DETECTOR FOR BEAM DIAGNOSTICS PRINCIPLE OF OPERATION Passing through metal strips a beam of charged particles or synchrotron radiation.
Yongjin Shin Sohee Park, Youngseop Kim, Jangwoen Lee, Woonggyu Jung, Zhongping Chen, and J. Stuart Nelson 1.
1 SIMS Characterization of Impurity Elements in Nb: The Effect of Heat Treatments ncsu.edu/aif jlab.org 1 P. Maheshwari, F. Stevie, D. Griffis, M. Rigsbee.
The atomic scale investigation of Nb for superconducting RF cavity Kevin Yoon, David N. Seidman – Northwestern University Claire Antoine, Chris Boffo -Fermi.
Optical Vortices and Electric Quadrupole transitions James Bounds.
. Atomistic simulations of field evaporation in atom probe tomography S. Parviainen, F. Djurabekova, K. Nordlund.
The Electromagnetic Spectrum High Harmonic Generation
Presentation on SEM (Scanning of Electron Microscope) Represented by:-Ravi Kumar Roll:- (BT/ME/1601/006)
Pulsed Energetic Condensation of Nb Thin Film Cavities at JLab
Acknowledgements Slides and animations were made by Dr. Jon Karty Mass Spectrometry Facility Indiana University, Bloomington.
Ching-Rong “Ada” Chung Mentor: Dr. Jing Zhou Department of Chemistry
Old Dominion University, Norfolk, Virginia 23529, USA
Laboratory equipment Lecture (3).
Experiments at LCLS wavelength: 0.62 nm (2 keV)
Photoreactions of Hybrid Photocathodes Browse EMSL Capabilities at:
Do it with electrons !.
Scanning Electron Microscopy (SEM)
Shukui Zhang, Matt Poelker, Marcy Stutzman
Thermal diffusivity measurement on Nb by
The Experimental Study on Vacuum Breakdowns by Optical Diagnosis
Presentation transcript:

LEAP investigation of hydrogen in SRF Niobium 7 th SRF Materials Workshop, JLAB Newport News, VA July 17, 2012 Yoon-Jun Kim and David N. Seidman Department of Materials Science and Engineering Northwestern University, Evanston, IL Northwestern University Center for Atom-Probe Tomography (NUCAPT) Northwestern University, Evanston, IL

 Cameca (formerly Imago) LEAP 4000XSI  Local Electrode Atom-Probe (LEAP) Tomography V: Applied DC voltage k: Shape dependent factor (~3.3) R: Tip radius (usually <50 nm) The electric field at the tip apex (E) is given by:

Analyze data with Cameca’s (formerly Imago) IVAS and our own programs Can determine spatial positions of individual atoms and their chemical identities with sub-nanometer scale resolution Analyze volumes >10 6 nm x 200 nm 2 viewing area maximum 5 x torr ultrahigh vacuum Specimen T: 20 to 300 K 500 kHz electrical pulse repetition rate 1000 kHz repetition rate for a picosecond UV laser (ultraviolet (UV)) light: wavelength 355 nm 3-D LEAP Tomography Local Electrode Atom Probe (LEAP) Tomography 3

Coordinates of ions (x, y, and z): permits the three- dimensional reconstruction of the lattice in real space Times-of-flight: Mass-to-charge state ratio yields identification of the elements and their isotopes Atomic resolution: depth resolution is equal to the interplanar {hkl} spacing (< 0.1 nm); lateral resolution is ca. 0.2 to 0.4 nm in a given {hkl} plane. Detector efficiency: 50 – 60%. All elements across the periodic table are detected with equal efficiency by a micro-channel plate (MCP). Atom-Probe Tomography (APT) 4

Reconstructed Data Needle-Shaped Specimen Raw Data Atom-Probe Tomography 5

 FEI Helios Nanolab  Tip sharpening done using an ion energy of 30 kV  Final stage is done using a low energy ion-beam at 2 kV in order to remove the damaged portions of the tip.  Sample Preparation –FIB/SEM

(1) Lift-out (2) Mounting (3) Tip-Shaping Pt DepositionTrenchLift-out TransferPt WeldingCut-off InitialFinalFinal-High Mag 20  m 400 nm 20  m 15  m 5  m3  m 2.5  m  Sample Preparation –FIB/SEM

 LEAP analyses for two different laser pulse energies: wavelength = 355 nm (UV)  LEAP tomography of Nb Laser LEAP (High)Laser LEAP (Low)Voltage LEAP Condition RHIT:15765 (1) Pulse rate: 500 kHz (2) Pulse energy: 50 pJ (3) Temp.: 30 K (4) Evaporation rate: %  3M ions (Max Volt = 8 kV) RHIT:15967 (1) Pulse rate: 250 kHz (2) Pulse energy: 10 pJ (3) Temp.: 30 K (4) Evaporation rate: %  2M ions (Max. Volt = 7.3 kV) RHIT:15978 (1) Voltage Pulse rate: 100 kHz (2) Pulse amplitude: 20% (3) Temp.: 30 K (4) Evaporation rate: %  12M ions (Max. Volt = 7.7kV) 3-D image

 Results: 3D-reconstruction (Top-view) -Nb exhibits 100, 010, 111, and 121 type poles. -H is distributed around these poles and 3-fold symmetry is observed for111 type zone. -NbH is most pronounced around 110 type pole for 10 pJ pulses and voltage pulsing  As laser pulse energy is reduced, clear poles are observed.  As laser pulse energy is increased, more H and NbH decorate zones Laser LEAP (50 pJ)Laser LEAP (10 pJ)Voltage LEAP Nb+H NbH  LEAP - Nb 10nm 20nm Nb H

 Indexing  Differences with respect to laser pulse energy may come from field-induced effects, such as surface diffusion of H and field-induced (or stress induced) hydride formation  LEAP tomography - - Nb Nb 50% H 50% Voltage pulsing

 Atom-probe tomography can be used for the characterization of SRF-Nb cavities.  Quantitative hydrogen and niobium hydride analyses are dependent on laser pulse energies – 50 or 10 pJ. H and NbH distributions around different zones behave differently for different laser pulse energies.  In spite of the dependence on laser pulse energy, hydrogen is clearly observed on specific crystallographic planes on the niobium surface.  H and NbH distributions around different zones behave differently as a function of laser pulse energy.  Migration and desorption of H atom can be affected by the electric field or a thermal effect (in case of UV laser pulsing) from the Nb microtips.  Summary and conclusions

 This study is funded by USDOE through Fermi National Accelerator Laboratory (FNAL).  We are grateful to Drs. Lance Cooley and Alex Romanenko in FNAL for supplying samples and valuable discussions.  The LEAP tomographic measurements were performed at the Northwestern University Center for Atom-Probe Tomography (NUCAPT).  The LEAP tomograph was purchased and upgraded with funding from NSF-MRI (DMR ) and ONR-DURIP (N , N , N ) grants.  Acknowledgements