Design of the 64-channel ASIC: update DEI - Politecnico di Bari and INFN - Sezione di Bari Meeting INSIDE, December 18, 2014, Roma Outline  Proposed solution.

Slides:



Advertisements
Similar presentations
D. De Venuto,Politecnico di Bari 0 Data Converter.
Advertisements

6 Mar 2002Readout electronics1 Back to the drawing board Paul Dauncey Imperial College Outline: Real system New VFE chip A simple system Some questions.
EE435 Final Project: 9-Bit SAR ADC
Announcements Assignment 8 posted –Due Friday Dec 2 nd. A bit longer than others. Project progress? Dates –Thursday 12/1 review lecture –Tuesday 12/6 project.
Mixed Signal Chip Design Lab Analog-to-Digital Converters Jaehyun Lim, Kyusun Choi Department of Computer Science and Engineering The Pennsylvania State.
Analogue to Digital Conversion
Interfacing Analog and Digital Circuits
18/05/2015 Calice meeting Prague Status Report on ADC LPC ILC Group.
Design and Implementation a 8 bits Pipeline Analog to Digital Converter in The Technology 0.6 μm CMOS Process Eri Prasetyo.
Data acquisition and manipulation
1 Dr. Un-ki Yang Particle Physics Group or Shuster 5.15 Amplifiers and Feedback: 3.
Test of LLRF at SPARC Marco Bellaveglia INFN – LNF Reporting for:
EET260: A/D and D/A converters
Implement a 2x2 MIMO OFDM-based channel measurement system (no data yet) at 2.4 GHz Perform baseband processing and digital up and down conversion on Nallatech.
20 Feb 2002Readout electronics1 Status of the readout design Paul Dauncey Imperial College Outline: Basic concept Features of proposal VFE interface issues.
Analog-to-Digital Converters Prepared by: Mohammed Al-Ghamdi, Mohammed Al-Alawi,
Design Goal Design an Analog-to-Digital Conversion chip to meet demands of high quality voice applications such as: Digital Telephony, Digital Hearing.
Design Goal Design an Analog-to-Digital Conversion chip to meet demands of high quality voice applications such as: Digital Telephony, Digital Hearing.
1 Design Goal Design an Analog-to-Digital Conversion chip to meet demands of high quality voice applications such as: Digital Telephony, Digital Hearing.
Introduction to Analog-to-Digital Converters
Ph. Farthouat CERN ELEC 2002 ADC 1 Analog to Digital Conversion  Introduction  Main characteristics –Resolution –Dynamic range –Bandwidth –Conversion.
A 10 bit,100 MHz CMOS Analog- to-Digital Converter.
Digital data acquisition1 Measuring ? „Wer misst, misst Mist.“ numeric result Sensing, Signal Processing Evaluation Physical/Chemical Property Physical/Chemical.
Data Converters ELEC 330 Digital Systems Engineering Dr. Ron Hayne
Student: Vikas Agarwal Guide: Prof H S Jamadagni
By Grégory Brillant Background calibration techniques for multistage pipelined ADCs with digital redundancy.
1HSSPG Georgia Tech High Speed Image Acquisition System for Focal-Plane-Arrays Doctoral Dissertation Presentation by Youngjoong Joo School of Electrical.
ELN5622 Embedded Systems Class 7 Spring, 2003 Aaron Itskovich
SIGMA-DELTA ADC SD16_A Sigma-Delta ADC Shruthi Sujendra.
Status of the Beam Phase and Intensity Monitor for LHCb Richard Jacobsson Zbigniew Guzik Federico Alessio TFC Team: Motivation Aims Overview of the board.
Data Acquisition ET 228 Chapter 15 Subjects Covered Analog to Digital Converter Characteristics Integrating ADCs Successive Approximation ADCs Flash ADCs.
NA62 Trigger Algorithm Trigger and DAQ meeting, 8th September 2011 Cristiano Santoni Mauro Piccini (INFN – Sezione di Perugia) NA62 collaboration meeting,
CERN, 18 december 2003Coincidence Matrix ASIC PRR Coincidence ASIC modifications E.Petrolo, R.Vari, S.Veneziano INFN-Rome.
SPIROC update Felix Sefkow Most slides from Ludovic Raux HCAL main meeting April 18, 2007.
Erik Jonsson School of Engineering & Computer Science Redundant SAR ADC Architecture and Circuit Techniques for ATLAS LAr Phase-II Upgrade Ling Du 1, Hongda.
L.Royer – Calice Manchester – Sept A 12-bit cyclic ADC dedicated to the VFE electronics of Si-W Ecal Laurent ROYER, Samuel MANEN LPC Clermont-Ferrand.
Analog to Digital Converters
Low Power, High-Throughput AD Converters
Low Power, High-Throughput AD Converters
Status of MAPMT FEE Electronics Boards Connector board – have 5 boards, 1 assembled Readout board (“MUX” board) – layout completed 12/2, but unfortunately.
S. Bota – Calorimeter Electronics overview - July 2002 Status of SPD electronics Very Front End Review of ASIC runs What’s new: RUN 4 and 5 Next Actions.
M. TWEPP071 MAPS read-out electronics for Vertex Detectors (ILC) A low power and low signal 4 bit 50 MS/s double sampling pipelined ADC M.
2/June/2009LHCb Upgrade1 Single ended ADC Differential ADC –Convert single ended signal to differential (use AD8138 amp) –ASIC differential output ADC.
ASIC Development for Vertex Detector ’07 6/14 Y. Takubo (Tohoku university)
VMM Update Front End ASIC for the ATLAS Muon Upgrade V. Polychronakos BNL RD51 - V. Polychronakos, BNL10/15/131.
UPDATE ON CLICPIX2 DESIGN Pierpaolo Valerio Edinei Santin
G.F. Tassielli - SuperB Workshop XI LNF1/11 02/12/2009 Status report on CLUster COUnting activities G. F. Tassielli on behalf of CLUCOU group SuperB Workshop.
Electronic instrumentation Digitization of Analog Signal in TD
Sill Torres: Pipelined SAR Pipelined SAR with Comparator-Based Switch-Capacitor Residue Amplification Pedro Henrique Köhler Marra Pinto and Frank Sill.
1 Progress report on the LPSC-Grenoble contribution in micro- electronics (ADC + DAC) J-Y. Hostachy, J. Bouvier, D. Dzahini, L. Galin-Martel, E. Lagorio,
0 /59 Nyquist Rate ADCs Dr. Hossein Shamsi ECE Dept, K.N. Toosi University of Technology.
Low Power, High-Throughput AD Converters
EE140 Final Project Members: Jason Su Roberto Bandeira Wenpeng Wang.
ASIC Review DCD. ASIC Review DCD is implemented in UMC 0.18 um CMOS technology 3.2mm x 5mm DCD-B uses bump bonding on the UMC technology.
Sampling. Introduction  Sampling refers to the process of converting a continuous, analog signal to discrete digital numbers.
Networked Embedded Systems Sachin Katti & Pengyu Zhang EE107 Spring 2016 Lecture 13 Interfacing with the Analog World.
A high speed 10 to 12 bits pipe line ADC, design proposal for ECAL
- TMS - Temperature Monitoring System in Topix Olave Jonhatan INFN section of Turin and Politecnico P PANDA Collaboration Meeting December 9 th
DCH FEE STATUS Level 1 Triggered Data Flow FEE Implementation &
A 12-bit low-power ADC for SKIROC
ASIC PMm2 Pierre BARRILLON, Sylvie BLIN, Selma CONFORTI,
Design of the 64-channel ASIC: status
R&D activity dedicated to the VFE of the Si-W Ecal
PID meeting SCATS Status on front end design
L. Ratti, M. Manghisoni Università degli Studi di Pavia INFN Pavia
Hugo França-Santos - CERN
CALICE COLLABORATION LPC Clermont LAL Orsay Samuel MANEN Julien FLEURY
BESIII EMC electronics
A 12 bit 50 MS/s Dual Channel Time Domain Two Step ADC
A 12 bit 50 MS/s Dual Channel Time Domain Two Step ADC
Presentation transcript:

Design of the 64-channel ASIC: update DEI - Politecnico di Bari and INFN - Sezione di Bari Meeting INSIDE, December 18, 2014, Roma Outline  Proposed solution for the 10-bit ADC  Status of the design  Planning and schedule

A/D conversion: open issue (from the previous meeting) 2  Dithering, oversampling (with a factor 16) and decimation proposed to increase the resolution of the available 8-bit ADC to 10 bits - If the conversion rate of the 8-bit ADC is 20MHz (rather optimistic) we need about T conv =1  s for the conversion of one channel - If we have only one channel to be converted per event and the event rate is 16kHz, roughly, the probability of losing an event is 2% - If the event rate is increased of an order of magnitude, this probability becomes about 15%  This solution becomes unacceptable in case we have an appreciable probability that more than one channel of the ASIC is over threshold for each event. For instance, the conversion of 64 channels would take 64  s, thus, in this case, we would have a conversion rate of about 15kHz/ASIC (which would worsen if the 8-bit ADC max conversion rate is less than 20MHz)  According to the discussion in Turin, a conversion rate of at least about 30kHz/ASIC (full 64 channels converted) is needed  Multiple ADC operated in parallel in order to generate more samples at the same time can be a solution, but this entails more power consumption and problems of effective management of the ADC resources available among the channels (complex routing and switching)  Alternative solutions must be found Meeting INSIDE, December 18, 2014, Roma

Proposed solution: pipeline ADC 3 Meeting INSIDE, December 18, 2014, Roma  It is possible to exploit very simple 1-bit ADC stages in a pipeline structure to increase the resolution of our 8-bit ADC  Only two 1-bit ADC stages in front of the 8-bit ADC are needed to increase the resolution to 10 bits

Adding redundancy: 1.5-bit ADC 4 Meeting INSIDE, December 18, 2014, Roma  To avoid problems due to offset of the comparator used in the 1-bit structure, we add redundancy V in < -V REF /8  b 1 =0 b 0 =0 -V REF /8 < V in < +V REF /8  b 1 =0 b 0 =1 V in > +V REF /8  b 1 =1 b 0 =1  The residue is now: V RES = V in -(b 0 +b 1 -1)V REF /4  V OUT = 2V RES is the output of the 1.5-bit stage  Three possible cases:  In other words we have a three-level quantization, so this stage gives more information than a 1-bit ADC, but less than a 2-bit ADC  Two stages in front of our 8-bit ADC provide 4 bits, which are reduced to 2 bits by a very simple digital decoding circuit

Circuit implementation of the 1.5-bit ADC 5 Meeting INSIDE, December 18, 2014, Roma  Very simple: two comparators, a three input MUX, some switches and the multiplying stage  Accurate value of the gain is mandatory: to obtain exactly a gain of 2, switched capacitor structures are used  The redundancy introduced is able to compensate the comparator offsets  0 and  1 as long as their absolute values are less than V REF /4, making easier the design of the comparators.

Structure of the 10-bit ADC 6 Meeting INSIDE, December 18, 2014, Roma  Two 1.5-bit ADC stages, followed by a S&H circuit (needed for decoupling purposes) and the 8-bit ADC  Timing and phase management

Rate of conversion 7 Meeting INSIDE, December 18, 2014, Roma  The first conversion takes: T conv = T CK (1 st 1.5-bit ADC) + T CK /2 (2 nd 1.5-bit ADC) + T CK /2 (S&H phase) + 2T CK (AutoZero, Coarse Conversion, Fine Conversion, Correction phases of the 8-bit ADC) = 4T CK  If the max clock frequency is 5MHz (rather conservative), T CK =200ns, thus the first conversion takes 800ns  Thanks to the pipelined structure, the conversion of the other channels take only 1 clock cycle per channel  In case we must read-out and convert all the 64 channels, this would take 800ns+63*200ns=13.4  s, which corresponds roughly to 75kHz/ASIC, reasonably more than required.

 ADC design finished at layout level: post-layout final verifications to be completed Status of the design 8 BlockCircuit level Layout level Analog channelxx ‘Fast’ and ‘slow’ comparatorsxx Peak detectorxx DACs and bias circuitsxx ADC interface amplifierxx LVDS buffers and receiversxx Digital part*xx  All the analog blocks have been defined at layout level (ADC interface amplifier included)  The final layout of the digital part has not been generated yet Meeting INSIDE, December 18, 2014, Roma

Planning and schedule 9  To be done: - Flooplan, placement and routing of the blocks - According to the floorplan, generation of the final layout of the digital part - Assembly of the ASIC - Realistic estimation: at least 2 months of work needed  Manpower problems  Next available MPW run deadline: February 2nd, unlikely to be met  Submission expected for the next MPW deadline (April 7th) Meeting INSIDE, December 18, 2014, Roma