Asynchronous SRAM in 45nM CMOS NCSU Free PDK Paper ID: CSMEPUN-1011-033 International Conference on Computer Science and Mechanical Engineering 10 th November.

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Asynchronous SRAM in 45nM CMOS NCSU Free PDK Paper ID: CSMEPUN International Conference on Computer Science and Mechanical Engineering 10 th November 2013, Pune Paper presented by: Nirav Desai, Assistant Professor, Dept. of ECE, ITM Universe Work done as a student at the University of Minnesota, Twin Cities Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie

Introduction 6 Transistor SRAM design presented here. Mainly used in Level 1 cache memories of microprocessors. Low power and fast speed of memory access are design parameters. Self timed design to provide immunity to process variations and adaptability to different clock speeds. Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie

SRAM Cell Design Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie Figure 1: M1, M3 are inverter pull down transistors. M2 and M4 are inverter pull up transistors. M5 and M6 are NMOS access transistors. BL is bit line and WL is word line. Source: Wikipedia 1. Read Operation Stability 2. Write Operation Stability 3. Minimum Cell Area Design equations for 6T SRAM: 4. Reverse Short Channel Effect

SRAM CELL READ AND WRITE MARGIN FROM BUTTERFLY CURVE NMOS inverter = 110nM PMOS inverter = 220nM NMOS Access = 90nM NMOSinv/NMOSaccess = 1.2 PMOSinv/NMOSaccess=2.4 Cbitline = 0.747fF for 512 cell array ( Interconnect Parasitics from ASU PTM Website ) Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie

SRAM CELL READ AND WRITE MARGIN FROM BUTTERFLY CURVE NMOS inverter = 150nM PMOS inverter = 555nM NMOS Access = 180nM NMOSinv/NMOSaccess = 1.2 PMOSinv/NMOSaccess = 3 Cbitline = 0.747fF Curve shows SRAM cell is close to write failure. Bitline Precharge to less than 1.1V could be explored to increase SNM. Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie

Simulation Setup M0,M1,M3,M4 form the cross coupled inverter pair M5,M6 are access transistors C1, C2 is the bitline capacitance M7 is the precharge switch for bitline ( bit ) - V3 precharges the bitline to 0.8V V6 precharges bitbar and writes a 0 to the cell V(write) V(ic) V(word) V(qbar) V(q) V(bitbar) V(bit) Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie

Timing Waveforms for Characterization V(write) – Applied to source of M7 (precharge switch) V(word) – Wordline Voltage V(qbar) V(q) V(ic) – Enables the precharge switch M7 V(bitbar) V(bit) V(write) precharges Cbit to 0.8V via M7 V(word) disables access transistors M5 and M6 during precharge. V(qbar) and V(q) are used to generate the butterfly curves. V(ic) enables M7 during precharge It could be implemented as NOT(V(word)). V(bitbar) precharges to 0.8V, shows charge pumping when M7 turns off and follows V(qbar) when wordline is enabled. V(bit) follows V(q) after word line is enabled. V(bit) precharged to Vdd by V6 Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

PASS TRANSISTOR BASED TREE DESIGN a0 a1 a2 1:8 Row Decoder Tree 8 MSB BUFFERS in Similar Tree Decoder for 16 LSB Bits Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

TREE DECODER DESIGN From row buffer From column buffer To Word Line Buffer 2 4 = 16 LSB Bits for Word Line Address from Column Buffers 2 3 = 8 MSB Bits for Word Line Address from Row Buffers Directions of Increasing bit number Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

PASS TRANSISTOR BASED TREE DESIGN IN OUT CK Identical Sizing for NMOS and PMOS to minimize charge injection effects Delay drops by ~40ps/2 for every Doubling of transistor widths Delay drop saturates around 1000nM to 89ps Used W/L of 880/50 for final tree Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

TREE DECODER TIMING DIAGRAMS The following waveforms were applied to the row and column selection inputs of the tree decoder Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

TREE DECODER TIMING DIAGRAMS It takes one cycle for initializing the tree decoder after which we get clean pulses for each row output LSB pulse is wider than MSB pulse in bottom figure to allow the tree to clear present state before next Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

TREE DECODER TIMING DIAGRAMS The top waveforms shows the matrix point output where the row and column select inputs are high The output node discharges when the input goes low Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

SRAM TIMING CIRCUIT in SAE/Write Enable Wordline Enable Precharge Read/Write Input Pulse Precharge Disable Pulse Word Line Enable Pulse Read/Write Output Pulse Timing Sequence: 1.Disconnect Precharge 2.Enable Word Line 3.SAE / Write Enable 4.Wait for read/write 5.Disble SAE/Write Enable 6.Disable Wordline 7.Reconnect Precharge and discharge all word lines Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

READ WRITE CIRCUIT ( Design by Bong Jin ) Sense Amplifier Write Driver Precharge Circuit Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

READ WRITE CIRCUIT TEST SETUP Bitline Capacitance estimate from ASU PTM Website Cbit estimate for 512 rows NMOS Switches to allow read without disabling write circuit Single SRAM Cell for simulations Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

READ / WRITE TIMING WAVEFORMS Precharge Pulse ( Active Low ) Data Meant to be written to cell Write Enable Pulse Read Enable Pulse Output of Write Buffer Disable output buffer ( tristate logic ) Bitline Bitline Bar Data Output Data Out Bar Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

SRAM Cell Layout Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

2X2 SRAM Array Layout VDD GND WORD 1 WORD 0 B0 B0BARB1 B1BAR This unit can be replicated in all directions without any changes. LVS check remaining Array Size = umX2.4725um Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

Left: Top waveform: Bitline and Bitline Bar waveforms for reading a 1 and Right: Layout of pass Transistor based tree decoder Final Waveforms and Decoder Layout

References Digital Integrated Circuits Jan Rabaey, Anantha Chandrakasan, Borivoje Nikolic ( SRAM Cell Design, Decoders, Read Write Circuits ) CMOS VLSI Design by Weste and Harris ( Butterfly Curves ) CMOS Circuit Design, Layout and Simulation Baker, Li, Boyce (Decoder Design) Course slides of Prof. Kia Bazargan ( Precharge Techniques, Decoders, SRAM Cell Design ) Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities

References (Contd.) Design of High Performance Microprocessor Circuits by Anantha Chandrakasan, William Bowhill, Frank Fox A High-Density Subthreshold SRAM with Data-Independent Bitline Leakage and Virtual-Ground Replica Scheme Tae-Hyoung Kim, Jason Liu, John Keane, Chris H. Kim, University of Minnesota ISSCC 2007 Digital Integrated Circuits by Jan Rabaey Large-Scale SRAM Variability Characterization in 45 nm CMOS Zheng Guo, Student Member, IEEE, Andrew Carlson, Member, IEEE, Liang-Teck Pang, Member, IEEE, Kenneth T. Duong, Tsu-Jae King Liu, Fellow, IEEE, Borivoje Nikolic´, Senior Member, IEEE IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 44, NO. 11, NOVEMBER 2009 Dama, J.; Lines, A., "GHz Asynchronous SRAM in 65nm," Asynchronous Circuits and Systems, ASYNC '09. 15th IEEE Symposium on, vol., no., pp.85,94, May 2009 doi: /ASYNC Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie