O. Siegmund, UCB, SSL 1 Incom substrates, 33mm diameter, no notches 20µm pores, 8 deg bias, 60:1 L/D, 65% OAR ANL processed for resistive and emissive layer application + electrode MCP #112—Resistive coating Chemistry 1— SEE Al 2 O 3 —Needs electrode coating MCP #114—NiCr electrode from Photonis-- 100MΩ in air, 112 MΩ vacuum, Resistive coating1 Chemistry 2—SEE Al 2 O 3 MCP #116—NiCr electrode from Photonis-- Resistive coating2 Chemistry 2—SEE Al 2 O 3 Single 20µm MCPs from ANL

O. Siegmund, UCB, SSL 2 MCPs packed in fluoroware type containers with single Big chip in MCP 112, no electrode. Don’t Spider, rattle around inside, pickup dust and abrasion. propose to electrode due to chip HV breakdown Need to use better containers and handling procedures. probability. ANL processed MCPs, INCOM 20µm From ANL in August 2010

O. Siegmund, UCB, SSL 3 Images of dust specs on ANL MCPs. Most likely due to handling issues and packaging. Obtained with tangential illumination. Even under magnification, more particulates can bee seen. We used a wet cleaning, and removed most of the debris. ANL processed MCPs, INCOM 20µm From ANL in August 2010

O. Siegmund, UCB, SSL 4 ANL processed MCPs, INCOM 20µm All MCPs have straight line delineations across the Multifibers due to pore stacking issues. There are quite a few random blocked pores. Also fusion squashing close to the multifiber boundaries and triple points.

O. Siegmund, UCB, SSL 5 ANL processed MCPs, INCOM 20µm There are quite a few random blocked pores. Also fusion squashing close to the multifiber boundaries and triple points. However there are not the large number of blocked pores near the multifiber boundary that were seen with the notched substrates on MCPs 91, 92, 93, 94.

O. Siegmund, UCB, SSL 6 ANL / Incom MCP 20µm Substrates Phosphor Tests on MCP #114 Pore crushing near the multifiber boundaries causes a lowering of the gain. The gain depression is less severe when increasing the applied voltage, which then improves the image uniformity. Lots of “BRIGHT SPOTS” visible, these have enhanced response and are probably dust particles on the MCP. 1000v MCP1200v MCP

O. Siegmund, UCB, SSL 7 There are straight line image features within multifibers, stacking of different fibers?? The triple point voids, and distorted channels at the multifiber boundaries, cause gain reductions. Some blocked pores Lots of particulates, need to improve handling and packaging (steel containers). Particulates in/on the ALD coating cause image “bright spots”, we need to examine event counting in MCP pairs to see if these are hotspots too. One image dark spot. ANL Processed Incom 20µm Substrates Observations

O. Siegmund, UCB, SSL 8 AAO Synkera Substrates ANL Processed Unfortunately shipping Problems damaged the MCPs. There are also stain marks and scuffs on

O. Siegmund, UCB, SSL 9 AAO Synkera Substrates ANL Processed Tested the MCPs with very bright halogen fiber lamp, no transmission on either, probably all holes blocked. Given situation tests likely to be negative.

O. Siegmund, UCB, SSL cm INCOM Substrates Have received two from Argonne 1 broken in half, 1 complete, as shipped have not done detailed inspections - BUT 1” crack at middle of one side