Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. Molecular semi-crystalline PEEK film model. The parameter δ describes the alternating.

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Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. Molecular semi-crystalline PEEK film model. The parameter δ describes the alternating crystalline/amorphous long-range order stacks with a periodicity of nm. One crystalline subunit consists of a unit cell with the axes a, b, and c. The semi- crystalline/amorphous repeats are oriented along the machine direction. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP

Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. Azimuthal intensity plot (from 2-D SAXS data integrated over the q-range related to real space periodicities between 5.2 and 22.5 nm) for PEEK films of different film thickness (after annealing to 160°C). A 50 μm-thin amorphous PEEK film is also included as reference, revealing the distinct anisotropy of the scattered intensity in the annealed films. Maxima were found in the machine direction. Their intensity was almost directly proportional to the material thickness while no modulation was found in the amorphous PEEK. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP

Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. The Arrhenius-plot of the optical transmission of 50 μm APTIV™ 2000 PEEK films at 540 nm shows the growth of crystallites with a long-range order and a related activation barrier of (0.12±0.03) eV associated with intermolecular interactions. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP

Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. SAXS pattern of a 50 μm-thin APTIV™ 2000 PEEK film annealed at 160°C for 10 min. The anisotropic scattered intensity distribution with a maximum q-value of 0.43 nm−1 indicates preferential long-range order in the machine direction, see white arrow. Data were recorded in a q-range between 0.09 to 3.4 nm−1. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP

Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. Radially integrated WAXS intensities (q-plot) of a 25 μm-thin APTIV™ 1000 PEEK film (dashed line) and a 50 μm-thin APTIV™ 2000 PEEK film (solid line) after annealing at 160°C for 10 min. Miller indices are given for peaks of the PEEK unit cell. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP

Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. WAXS pattern of a 50 μm-thin 2000 APTIV™ PEEK film annealed at 160°C for 10 min, featuring the characteristic peaks of PEEK. The most prominent anisotropic ring relates to the (110) plane. The white-colored arrow indicates the machine direction. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP

Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. Transmission at 540 nm of 50 μm APTIV™ 2000 PEEK films subjected to annealing at the temperatures indicated. Reference is a 50 μm-thin APTIV™ 1000 PEEK film. Sinusoidal behavior of the transmission with a maximum in machine direction is observed for all samples including the reference. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP

Date of download: 9/18/2016 Copyright © 2016 SPIE. All rights reserved. Anisotropic characteristics of a 50-μm APTIV™ 2000 PEEK film, annealed at 160°C, in a polarizer setup. (b) The middle graph shows the absorbance with the polarizer position parallel and perpendicular to machine direction. Maximum anisotropy is reached at approximately 540 nm and a phase shift occurs around 1100 nm (see inset). The inset shows in addition to the absorbance the values averaged along ±100 nm. (a) At 540 nm, below the phase shift around the maximum of the anisotropy, a 360 deg transmission measurement followed a sinusoidal curve with the transmission maximum in machine direction. (c) At 1700 nm, above the phase shift, the 360 deg rotation resulted in a sinusoidal curve with the transmission maximum in transverse direction. Figure Legend: From: Anisotropy in polyetheretherketone films J. Nanophoton. 2012;6(1): doi: /1.JNP