1 Luca Gavioli Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) & Dipartimento di Matematica e Fisica, Università Cattolica del Sacro.

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1 Luca Gavioli Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) & Dipartimento di Matematica e Fisica, Università Cattolica del Sacro.

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1 Luca Gavioli Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) & Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore Via dei Musei 41, I Brescia, Italy Metodi sperimentali della fisica moderna Class organization (official) Lectures (48 hours) lab work (48 hours) lab work: groups of 2-3 people working on a specific research subject proposed by lab leaders. Final report on the experimental work that will be discussed individually at the oral exam Exam: Individual discussion of the report 2 questions on the course program Tel:

2 Pumps, gauges Gas kinetics, electron/gas interaction Mass Spectrometry OUTLINE VACUUM ELECTRON ANALIZERS RFA CMA CHA Intro Fermi level p-n Junctions Diode equation P-N JUNCTIONS ATOMIC FORCE MICROSCOPY Operating principle Force-distance curves Operating modes SCANNING ELECTRON MICROSCOPY Description beam-sample interaction Image formation

3 Knowledge and understanding of how to make vacuum Ability to distinguish molecules AIM VACUUM ELECTRON ANALYZERS Knowledge and understanding of how to distinguish electrons Knowledge and understanding of how to measure surface topography Knowledge and understanding of the physics at the base of a junction P-N JUNCTIONS ATOMIC FORCE MICROSCOPY SCANNING ELECTRON MICROSCOPY Knowledge and understanding of what information is coming from an «image»

4 Modern Vacuum Physics, David S. Betts (Ed), CHAPMAN & HALL/CRC (pdf) Introduzione alla tecnologia del vuoto, B. Ferrario, Patron Ed. (pdf) Foundations of Vacuum Science and Technology, Lafferty, J. M.; Wiley & Sons (pdf) Handbook of Vacuum Science and Technology, D. Hoffman, B. Singh, J.H. Thomas, Academic Press References VACUUMELECTRON ANALIZERS AFM-SEMP-N JUNCTIONS Physics of Semiconductor Devices, S.M. Sze, Wiley (pdf) Solid State Physics, Pastori Parravicini, Chap (pdf) Atomic, Molecular and Optical Physics : Charged Particles, F.B. Dunning, R.G. Hulet, Academic Press (Ch. 6) Electron Energy Analysers, J.L. Erskine (pdf) Modern techniques of surface science, D.P. Woodruff, T.A. Delchar, Cambridge. (Ch. 1,2) Methods of surface analysis (Ch. 3), M.P. Shea, Cambridge (pdf) Rev. Sci. Instrum. 39, 33 (1968); Rev. Sci. Instrum. 38, 1210 (1967); Phys. Rev (1938) PLEASE NOTE: the slides provided are NOT sufficient to pass the exam Scanning Probe Microscopies: Atomic Scale Engineering by Forces and Currents NT-MDT slides B. Cappella, G. Dietler, Surface Science Reports 34 (1999) Goldstein, Scanning Electron Microscopy and X-ray Microanalysis (Ch. 1-8)