A G R E A T E R M E A S U R E O F C O N F I D E N C E 1 A G R E A T E R M E A S U R E O F C O N F I D E N C E 1 Advances In Testing: New Techniques for Reducing the Cost of Test Presented by Jason Chonko, Sr. Applications Engineer

A G R E A T E R M E A S U R E O F C O N F I D E N C E 2 A G R E A T E R M E A S U R E O F C O N F I D E N C E 2 Agenda Introduction Quick optimization steps Measurement tuning Test sequencing New technologies for drastic reduction in test time Component test example Summary

A G R E A T E R M E A S U R E O F C O N F I D E N C E 3 A G R E A T E R M E A S U R E O F C O N F I D E N C E 3 New technology brings new challenges for test CCD image sensor LED flash External OLED Varistors, capacitors, inductors GMR heads in HDD for MP3 player Internal OLED Display driver ICs RFICs, PAs Keypad backlight Longer battery life New communication standards

A G R E A T E R M E A S U R E O F C O N F I D E N C E 4 A G R E A T E R M E A S U R E O F C O N F I D E N C E 4 Introduction

A G R E A T E R M E A S U R E O F C O N F I D E N C E 5 A G R E A T E R M E A S U R E O F C O N F I D E N C E 5 Quick Optimization Disable unused instrument functions –Displays –Beepers

A G R E A T E R M E A S U R E O F C O N F I D E N C E 6 A G R E A T E R M E A S U R E O F C O N F I D E N C E 6 Quick Optimization Avoid autoranging –Use fixed source and measurement ranges

A G R E A T E R M E A S U R E O F C O N F I D E N C E 7 A G R E A T E R M E A S U R E O F C O N F I D E N C E 7 Measurement Optimization

A G R E A T E R M E A S U R E O F C O N F I D E N C E 8 A G R E A T E R M E A S U R E O F C O N F I D E N C E 8 Measurement Optimization (Contd) Optimize integration setting (NPLC)

A G R E A T E R M E A S U R E O F C O N F I D E N C E 9 A G R E A T E R M E A S U R E O F C O N F I D E N C E 9 Measurement Optimization (Contd) Disable filtering, if not needed

A G R E A T E R M E A S U R E O F C O N F I D E N C E 10 A G R E A T E R M E A S U R E O F C O N F I D E N C E 10 Measurement Optimization (Contd) Disable autozero (zero reference measurement)

A G R E A T E R M E A S U R E O F C O N F I D E N C E 11 A G R E A T E R M E A S U R E O F C O N F I D E N C E 11 New Techniques

A G R E A T E R M E A S U R E O F C O N F I D E N C E 12 A G R E A T E R M E A S U R E O F C O N F I D E N C E 12 Typical Test Controlling PC Rack and Stack instruments connected to PC via communications bus (GPIB)

A G R E A T E R M E A S U R E O F C O N F I D E N C E 13 A G R E A T E R M E A S U R E O F C O N F I D E N C E 13 The Communications Bottleneck PC then must control many aspects of test Back-and-forth communication can be slow! PC triggering and decision making is slow! Tests are chatty: High frequency, small packet size USB and Ethernet are equivalent to GPIB speeds

A G R E A T E R M E A S U R E O F C O N F I D E N C E 14 A G R E A T E R M E A S U R E O F C O N F I D E N C E 14 New Alternatives New classes of instruments have distributed processors. Powerful features: –Lessen communications time by holding more of the test sequence in the instrument. –Powerful instrument level calculations and math capabilities enable extended control of digital I/O, and other resources can enhance total system throughput. SLOWFAST

A G R E A T E R M E A S U R E O F C O N F I D E N C E 15 A G R E A T E R M E A S U R E O F C O N F I D E N C E 15 Traditional LED Testing Forward voltage (Vf) Reverse leakage (Ir) Light intensity (L)

A G R E A T E R M E A S U R E O F C O N F I D E N C E 16 A G R E A T E R M E A S U R E O F C O N F I D E N C E 16 Alternative LED Tests Test sequence stored and controlled by processor in instruments. –Lessens communication frequency –Eases multi-instrument integration

A G R E A T E R M E A S U R E O F C O N F I D E N C E 17 A G R E A T E R M E A S U R E O F C O N F I D E N C E 17 The Keithley 2600 Series System SourceMeter®

A G R E A T E R M E A S U R E O F C O N F I D E N C E 18 A G R E A T E R M E A S U R E O F C O N F I D E N C E 18 Keithley Test Script Processor (TSP): High-speed automation Processor in instrument runs embedded test scripts –Create custom source-measure functions that are called from a single GPIB command –Create fully automated test scripts that run independent of a control PC Increases throughput –Eliminates GPIB traffic between instrument and PC –Automated tests are typically 10 times faster than PC controlled tests Easier to use than other instrument test sequencers –Intuitive language vs. cryptic commands –Test Script Builder development software creates, modifies, and debugs test scripts quickly startscript -- Declare variables OutputOn = 1 OutputOff = 0 Current = 0 Voltage = 0 -- Send SMU control commands smua.reset( ) smua.measure.nplc = 1.0 smua.source.rangev = 1.0 smua.measure.rangei = Run simple sweep smua.source.output = OutputOn for Voltage = 1,10 do smua.source.levelv = Voltage Current = smua.measure.i( ) Resistance = Voltage / Current print ("Resistance=..Resistance) end smua.source.output = OutputOff endscript

A G R E A T E R M E A S U R E O F C O N F I D E N C E 19 A G R E A T E R M E A S U R E O F C O N F I D E N C E 19 Increased Scalability: TSPLink Expandable backplane: Keithley TSPLink TM Features: –Enables parallel or complicated test sequencing –Eases multiple instrument synchronization –Improves scalability over mainframe based test systems - No slot limits or backplane support issues

A G R E A T E R M E A S U R E O F C O N F I D E N C E 20 A G R E A T E R M E A S U R E O F C O N F I D E N C E 20 Summary Many settings and adjustments can be made to existing setups to increase throughput: –Disable displays and beepers –Disable autoranging: Use appropriate fixed ranges –Use filtering only if needed –Select correct measurement aperture (NPLC) for your measurement –Autozero may be disabled for short time periods with little effect on accuracy

A G R E A T E R M E A S U R E O F C O N F I D E N C E 21 A G R E A T E R M E A S U R E O F C O N F I D E N C E 21 Summary More powerful processors at the instrument are enabling high throughput and easing complicated testing procedures. Expandable backplanes, such as TSPlink TM, allow flexible and scalable test systems without the mainframe. Throughput can be further optimized by: –Keeping test sequence code simple. –Understanding your instruments capabilities.

A G R E A T E R M E A S U R E O F C O N F I D E N C E 22 A G R E A T E R M E A S U R E O F C O N F I D E N C E 22 Related Information from Keithley Application Notes: Increasing Production Throughput of Multi-pin Devices using a Keithley 2600 Series System SourceMeter Instruments Converting a Series Model 2400 SourceMeter SCPI Application to a Series Model 2600 System SourceMeter Script Application On-line seminars with additional testing techniques and solutions: Understanding Measurement Uncertainty Tips, Tricks, and Traps for Advanced SMU DC Measurements How to Make Sensitive DC Measurements How to Get the Most from Your Low Current Measurement Instruments Visit for a collection of more than two dozen application noteshttp:// and tech briefs for making SMU measurements.

A G R E A T E R M E A S U R E O F C O N F I D E N C E 23 A G R E A T E R M E A S U R E O F C O N F I D E N C E 23 Contact Keithley with Your Questions: KEITHLEY, ext. 3960, within the USA Outside the USA in China 089/ in Germany/Europe in Great Britain in Japan in Korea in Taiwan See for additional worldwide officeswww.keithley.com Via to

A G R E A T E R M E A S U R E O F C O N F I D E N C E 24 A G R E A T E R M E A S U R E O F C O N F I D E N C E 24 A Greater Measure of Confidence