Update on pixel module interfaces On behalf of INFN Milano

Slides:



Advertisements
Similar presentations
UNIVERSITI MALAYSIA PERLIS
Advertisements

Power Integrity Analysis and Optimization in the Substrate Design Harini M, Zakir H, Sukumar M.
Crosstalk Overview and Modes.
Mauro Raggi Status report on the new charged hodoscope for P326 Mauro Raggi for the HODO working group Perugia – Firenze 07/09/2005.
STATUS OF THE CRESCENT FLEX- TAPES FOR THE ATLAS PIXEL DISKS G. Sidiropoulos 1.
Panda PCB for prototype status report by D Malkevich on behalf of the ITEP group ITEP.
Link A/D converters and Microcontrollers using Long Transmission Lines John WU Precision Analog - Data Converter Applications Engineer
Performance of the DZero Layer 0 Detector Marvin Johnson For the DZero Silicon Group.
AZIZ112/MAPLD2004 Printed Circuit Board Simulation: A Look at Next Generation Simulation Tools and Their Correlation to Laboratory Measurements Shahana.
Differential Signals EECS 713 Project by Jay Fuller :) What are they? When to use them Traces, connectors, terminations, etc.
VELO upgrade electronics – HYBRIDS Tony Smith University of Liverpool.
Read-out boards Rui de Oliveira 16/02/2009 RD51 WG1 workshop Geneva.
FractalComs Exploring the limits of Fractal Electrodynamics for the future telecommunication technologies INFORMATION SOCIETY TECHNOLOGIES (IST) PROGRAMME.
CALICE meeting Prague 2007, Hervé MATHEZ 1 DHCAL PCB STUDY for RPC and MicroMegas (Electronics recent developments for the European DHCAL) William TROMEUR,
Impact of PCB routing techniques on EMC performance of High Speed Interfaces Presented on: March 13th, 2014.
Crosstalk Calculation and SLEM. 2 Crosstalk Calculation Topics  Crosstalk and Impedance  Superposition  Examples  SLEM.
Introduction to Controlling the Output Power of a Transistor Stage A load network will be designed to maximize the output power obtainable from the Mitsubishi.
Transmission Line “Definition” General transmission line: a closed system in which power is transmitted from a source to a destination Our class: only.
TDS8000 and TDR Considerations to Help Solve Signal Integrity Issues.
1 Module and stave interconnect Rev. sept. 29/08.
TELECOMMUNICATIONS Dr. Hugh Blanton ENTC 4307/ENTC 5307.
Pixel 2000 Workshop Christian Grah University of Wuppertal June 2000, Genova O. Bäsken K.H.Becks.
TECHNOLOGICAL EDUCATIONAL INSTITUTE OF CENTRAL MACEDONIA DEPARMENT OF INFORMATICS & COMMUNICATIONS Master of Science in Communication.
1 4 PCB: LEFT TOP 115 channels, LEFT BOTTOM (115), RIGHT TOP (106), RIGHT BOTTOM (106). For LEFT TOP board 115 channels we have: 115 smd connectors (AMP.
The Interconnect Modeling Company™ High-Speed Interconnect Measurements and Modeling Dima Smolyansky TDA Systems, Inc.
Example Snapshots From Some Of The Signal Integrity Interactive Software Modules The following slides highlight some of the output graphs/plots from the.
Global Circuit Page 1  Basic Design Rule for Advanced PCB (1) 1. High speed current path Load Driving gate Current trace At low frequency current, follows.
Impedance Measurements on a PCB
Single Balanced Mixer Design ECE 6361
FED 9U Analog Characterization Stefanos Dris CERN & Imperial College.
WP7&8 Progress Report ITS Plenary meeting, 10 June 2014 LG, PK, VM, JR.
1 1. Provide better power/ground distribution Increased static capacitance due to thinner core Lower power/ground plane transient impedance due to larger.
1 9 December 2002A.P.Kashchuk (LNF/INFN), Frascati) New approach to CPC design.
Mauro Citterio Milano, PP2/Services - an update - Mauro Citterio INFN Milano Type II cables  Layout in progress  Duplication of VVDC wires.
Update on the activities in Milano M. Citterio and N. Neri on behalf of INFN and University of Milan SuperB Meeting: SVT Parallel Session.
Update on the Bus, the HDI and peripheral electronics M. Citterio on behalf of INFN Milano and University of Milan SuperB Workshop: SVT Meeting.
2 March 2012Mauro Citterio - SVT Phone meeting1 Peripheral Electronics Some updates Mauro Citterio INFN Milano.
A. Stabile – INFN Milano31 May 2010 XIII SuperB General Meeting - Isola d'Elba Bus, HDI and transition card for SuperB layer0 Alberto Stabile On behalf.
전자파 연구실 1. Fundamentals. 전자파 연구실 1.1 Frequency and time Passive circuit elements is emphasized in high speed digital design : Wires, PCB, IC- package.
Marc Anduze first drawings of Ecal eudet module COPIED FROM : Marc Anduze PICTURES FROM : CALICE/EUDET electronic meeting – CERN – 12 July 07.
Enhancement Presentation Carlos Abellan Barcelona September, 9th 2009.
Marc Anduze – EUDET Meeting – PARIS 08/10/07 Mechanical R&D for EUDET module.
De Remigis The test has been accomplished with an SLVS signal, since that was chosen for the serial communication between the readout and the optical converter.
Piero Belforte, HDT 1999: Modeling for EMC and High Frequency Devices, DAC 1999,New Orleans USA.
Piero Belforte, HDT, July 2000: MERITA Methodology to Evaluate Radiation in Information Technology Application, methodologies and software solutions by Carla Giachino,
Update on the activities in Milano
ECE 598 JS Lecture - 05 Coupled Lines
Plans for pixel module integration electronics
Mauro Citterio, Fabrizio Sabatini
Day 38: December 4, 2013 Transmission Lines Implications
Status and plans for the pigtails
Update on SVT electronics
Calorimeter Mu2e Development electronics Front-end Review
Milano Activities: an update Mauro Citterio On behalf of INFN Milano
High-Speed Serial Link Layout Recommendations –
HCAL preliminary analysis and results
ob-fpc: Flexible printed circuits for the alice tracker
SVT front-end electronics
Pixel Module Interfaces Mauro Citterio On behalf of INFN Milano
& pixel module interfaces On behalf of INFN Milano
Crosstalk Overview and Modes.
HCAL Modules -First Ideas
High-Speed Serial Link Layout Recommendations –
CLIC DR EXTRACTION KICKER DESIGN, MANUFACTURE AND EXPERIMENTAL PROGRAM
Crosstalk Overview and Modes.
Microstrips as Transmission Lines
Documenting low layer count impedance controlled stacks with Speedstack VMM Professional documentation of low layer count stacks using Speedstack’s Virtual.
2. AN INTRODUCTION TO THE RSO TEST
SAS-3 12G Connector Drive Power Pin Configuration
Crosstalk Overview and Modes.
Presentation transcript:

Update on pixel module interfaces On behalf of INFN Milano Mauro Citterio On behalf of INFN Milano

A “simplified bus” as a test reference The prototype (1.8 x 11.2 cm) after several delays were delivered last Friday  Visual inspection: quality and uniformity is high  Received 20 pieces CERN Technology Stackup made of: Aluminum, polimide and glue Various traces on the same structure to compare simulation and actual BUS To test the technological limits in term of frequency (signal up to 160 MHz, 32bit BUS) Four layers bus 2 planes (each 25 mm thick)  power and ground 2 signal layers Signal lines with and without corners on the same layer Signal lines on the two layers connected by means of minimum size vias Lines with different overall lenghts, with and without bends Striplines and microstrips, differential lines Min Pads/Vias 150/50 mm, Line widht: Min. ~ 75 mm, Max. 200 mm

Trace Impedance simulated to 50 W Data generated with CERN input The dielectric thickness adjusted to increase Z (~ 40 mm) Line widht at the “nominal” minimum (~75 mm) Simulation did not take into account “Modal Impedance” Actual ine space is not more then 75 mm  if less it will not affect Z  but it will increases NEXT (to be measured) Not minimum thickness “Plane layers” thickness is 25 mm, Aluminum signal lines are 10 mm Total thickness of prototypes is approximately: ~ 160 mm More accurate measurements in progress Layup will also be measured

The “updated” prototype bus stack-up Not an “enclosed stackup”  power/ground layers are on the bottom as in the final bus stackup Signal lines are “embedded” microstrips due to the “cover layer”  cover layer assumed to be electrically equivalent to Polymide (!!)  trace impedance reduces with increasing height of cover layer  the cover layer increases the trace capacitance while leaving its inductance unchanged  propagation delay goes also up Core Polymide (40 m) could be thicker than previously simulated 1st layer signal traces “cover layer” ground plane 2nd layer signal traces 155 µ Glue 5µ - er = 4.5 Polyimide 40µ - er = 3.5 Aluminium 25µ Aluminium 10µ Polyimide 20µ - er = 3.5

Bus Modal Impedance simulation Impedance of coupled traces split up to as many modal impedances as many lines are coupled for two lines the modes are called even and odd if stand alone single trace Z02 = L/C then for two traces Z0e2 = (L + LM) /(C-CM) > Z02 Z0o2 = (L-LM)/(C+CM) < Z02  for multi-lines structure the modes are numbered A better simulation of a trace impedance in the bus is obtained by adding traces to a single 50 ohm trace.  only the Z0e mode is considered  the increase in impedance is larger for s/h decreasing  the simulation is “not simmetrical” and “ideal”  our case  6-7 coupled traces  Z ~ 61-63 Ohm reasonable approximation

Bus Impedance Measurements Impedance is measured by Time Domain Reflectometry (TDR) by probing the lines (contact not optimized yet) to explore the trace along its lenght ~ 2 mm resolution via, bend, split etc. effects visible if any Z precision is ~ 1- 2 % propagation time measurable only after trace structure “modeling”, i.e. reflections must be taken into account it could be used for differential lines one port measurement The results are still “preliminary” DUT Sampling Osciloscope with a TDR Module Vinc Z1 Z2 Vrefl

Impedance of traces of various lenght Data generated with CERN input The dielectric thickness adjusted to increase Z (~ 40 mm) Line widht at the “nominal” minimum (~75 mm) Simulation did not take into account “Modal Impedance” Actual ine space is not more then 75 mm  if less it will not affect Z  but it will increases NEXT (to be measured) “Plane layers” thickness is 25 mm, Aluminum signal lines are 10 mm Total thickness of prototypes is approximately: ~ 160 mm More accurate measurements in progress Layup will also be measured Not minimum thickness

Impedance Measurements End of a trace (un-terminated) Probe contact (large parasitic inductance) 59 ohm injection line Trace impedance Impedance for traces of different lenght Trace lenght is estimated from the layout due to “large contact reflection” Trace impedance is > 60 Ohm  Modal impedance has to be considered Impedance is lenght dependent Traces are not homegenuos?

Impedance Measurements 75 micron traces (designed as single 50 ohm traces Impedance is not homegenous between nominal identical traces Trace numbering goes from top – down (trace 1 is the one at the top Is glue (i.e. Prepreg not homegenuos? Is polymide core thicker then expected? Is a modal impedence effect? If so why are differnt mode excited with the same measurement

Impedance Measurements traces with increasing with (75, 150, 225 micron) 75 micron trace, by design 50 Ohm Impedance scales nicely with trace widht The blue line are CAD designed value based on single 50 Ohm trace The larger measured Z is consistent with the multiple coupled trace hypotesis

Signal Integrity Simulations To study the performance of the Bus, we have simulated the signal propagation using XILINX VIRTEX-5 driver and receiver: for which IBIS models are available a driver/receiver similar to the one expected in the front-end electronics is used (LVCMOS12_S_8) these block will be used in our test setup. In the figure an “ideal” scenario is shown: - Termination at the receiving end, based on the bus impedance The signal has160 MHz frequency and 49 % duty cycle The shape is “extracted” by means of the IBIS models The driver sends out a 1.2 Volt signal at 8 mA

Signal Integrity Measurement The two figures are: Top picture: short trace ~ 24 mm Bottom picture: long trace ~ 85 mm Yellow: injected signal Green: signal at the receiving end Delay between signals is set-up dependent Termination at the receiving end based on the “nominal 50 ohm” bus impedance  otherwise excessive distortion The signal has 200 MHz frequency and 50 % duty cycle Note: Amplitude are not equalized (!!!) SORRY !!! Comparison with simulation is the next step

Ongoing Activity Layout of a BUS for up to 3 front-end IC “FE 32x128” While improving our understandng of the bus property a “semi real” bus design is in progress Detailed design will need input from measurement - In this bus design, the IC pad structure are taken into account Decoupling capacitor need to be mounted directly on the power plane  no via available to the bus-top 3D feasibility study almost completed D 1 V BUS width: 8.7 mm 300 mm Space for signal layer: 7.5 mm D G N Caps 0102 size 400 mm D 1 G N

3D Models of a three IC assembly Critical issue: the “area opening on the power planes to allow decoupling cap mounting  It is a new task for CERN  The size of the openings is only the “best guess”

3D Models of a three IC assembly

Conclusions Prototype bus workmanship: Impedance measurements: Not enough time for a complete evaluation First impression: the quality is high The construction took a very long time  The “prototype” has three electrical layers  The final bus will have at least nine electrical layers  Second source manufacturer should be identified Impedance measurements: Measurements are encouraging Not all measurements are understood theoretically Some ideas to be investigated more Signal integrity: Attenuation on long traces needs a better model More measurements needed Essentail is the measurement of the crosstalk between lines when “all traces” on the bus are active