Open Book, Open Note, Bring a Calculator Exam 2 Topics Open Book, Open Note, Bring a Calculator 3-4 Multipart Questions Device Packaging, Mfg Production Design Substrates: PCB’s, Flex Circuits, Materials, Basic Mfg Process Thru Hole Packages: Discretes, ICs SMT Packages: Discrete, Small Outline, Flatpack, Chipcarrier, Array Sockets, Interconnection Systems TH Mfg Processes: Prep, Insert, Wave Solder, Trim, Test SMT Mfg Processes: Prep, Screen Solder Paste, Place, Reflow, Test Microelectronic Assembly: Chipscale, MCM, COB, Wirebond Testing & Inspections: ICT, FCT, JTAG, Visual, AOI, XAOI, Stresses Manual vs Automatic Assembly Operations Levels of Assembly/Test IPC Assembly Class 1, 2 and 3 Workmanship Levels

Analog Design For Mass Production Op Amp Basic Inverting, Non-inverting configurations, Nom Gains Op Amp Vio, Iio, Ib, Ad, Ac, CMRR, Slew Rate DC Errors caused by Vio, Iio, Ib Gain Errors caused by Ad Total Error Voltage and Effects of Resistor Tolerance Slew Rate Distortion Op Amp max Vout, Iout Basic frequency response circuit analysis Finding Av(s) from circuit analysis Steady State Response Av(jw) Finding Mag |Av(jw)|, Phase |Av(jw)|, from Av(s) Discrete Component Specification Noise Sources What types of Analysis are Required or Suggested for Subcircuits

Digital Design for Mass Production Basic Technology Families for IC’s (TTL, CMOS, etc) Basic DC drive data sheet parameters (Vih, Iol, etc) DC drive design compatibility analysis 6 Life Cycle Phases and Statistical Relationship Std and Schmitt Trigger Inputs Totem pole, Open Collector (Drain) and Tristate Outputs Edge Rates, Noise Margins, Comparators, Schmitt Triggers Logic Level Voltage Translations Basic Combinatorial Design, DeMorgan Gates Truth Tables, Karnaugh Maps, Min Terms Flipflop types, timing specifications (Tsu, Th, etc) Metastability MTBF Timing diagrams & Timing Analysis Using Target Device State Diagrams, State Variables, Transitions, Inputs/Outputs Simple State Machine Design, Moore and Meally Types Programmable Devices, PLDs, ROMs Equation Based State Machine Design

Mixed Signal Design For Mass Production Basic Analog Digital Numeric Conversions A/DD/A Maximum SNR SAR, Integrating, Flash and Sigma-Delta Converter Architectures Converter Errors Quantization Error Gain Error Offset Error INL DNL

Statistics & Reliability Basic Stats: Mean, Std Deviation, Median, Mode Specification Limits, Z values Samples vs Full Populations, Normal and Weibull Distributions 6 Sigma Quality, 1.5 sigma Shifts, Z values Bathtub Curve, Failure Rate vs Time, Infantile vs End of Life Failures 6 Life Cycle Phases and Statistical Relationship Physics of Failure, CTE mismatch, fatigue Series Reliability vs Parallel/Redundant MTBF, Reli(%) and FITs Allocation & Reliability Summation, l, R(t), Warranty, , h Stresses and Stress Factor Multipliers, P Prediction Standards and Databases Parts Count Prediction Method Flaws Component Derating Guidelines, Capacitor Applications HALT, HASS, HAST, ESS Processes and Stress Accelerations Life Stress Modeling

Intellectual Property 4 Types of IP Definition & Purpose of a US Patent Patent Limitations and Coverages Types of Patents Criteria for Patentability Prior Art Format of Patent, Sections Sustainability & Verification Life Cycle Phases and Obsolescence User Manual Basics Forms of Objective Evidence 3 methods of verification