DerivFIP – Radiation test

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Presentation transcript:

DerivFIP – Radiation test G. Spiezia, J. Palluel, C. Pignard

DerivFIP – Outline Use and main components Radiation test 2009- brief recall Radiation test 2010- setup and results Conclusions

Use and main components Permit an easy extend of the WORLDFIP bus FPGA ProASIC3 Field Drive and Field Tr Oscillator, 5V regulator, 2.5 V regulator Anti latch-up circuit

Test 2009 – derivFIP 2.0 PIF facility at PSI Acquisition system 250 MeV proton beam Flux:9x107 p/cm2/s Acquisition system 5V power supply DerivFIP current consumption 1 agent (Radmon) as a client of the DerivFIP

Test 2009 Current [A] 5 V power supply [V] Power reset on the 220V line Current [A] 77 Gy; 1.5E11 p/cm2 Lost of communication and block 5 V power supply [V] 107 Gy; 2E11 p/cm2 Lost of communication and permanent block 7 Gy; 1.5E10 p/cm2 Lost of communication 8 mA

Test 2009 - Conclusions Lost of communication at 1.5x1010p/cm2 DerivFIP blocked at 1.5x1011p/cm2 2x1011p/cm2 DerivFIP definitely blocked During the block, current is 8 mA  one could conclude the anti latch-up generates a false trigger since the current did not show any major increase Actions: Redesign of the anti latch-up circuit New data acquisition system to monitor the current at higher sampling rate

Test 2010 – DerivFIP 2.02 Setup PIF facility at PSI Setup 250 MeV proton beam Flux:4.5x107 p/cm2/s Setup Data acquisition at 75 kS/s of 5V power supply, 2.5 V regulator, current consumption Continuous saving of the data at 10 S/s (average of the data reading at 75 kS/s) Saving of the data at 75 kS/s in case of trigger on the anti latch-up circuit. Data transfer correctness monitored on a FIPDiag used as an agent of the DerivFIP

Test 2010 - Setup

Test 2010 – DerivFIP 2.02 I_5V: current on the 5 V 5 Volt power Trigger for the anti latch-up 2.5 Volt

Results -1 DerivFIP (1st unit) 40 errors (data and com lost) at 7.5x1010 p/cm2 Permanent Com lost at about1011 p/cm2, TID 43 Gy

Results -1 Com lost

Results -1 No effect on the 5V power supply

Results -1 No effect on the 2.5V power supply

Results -1I DerivFIP (2nd unit) Use of a collimator Field Drive1: no errors up to 2x1010 p/cm2 Field Drive2: no errors up to 2x1010 p/cm2 FPGA: no errors up to 3x1010 p/cm2 2.5 V Voltage regulator and U7 (Power On Reset circuit LP3470): 10 errors up to1x1010 p/cm2

Results -III DerivFIP (2nd unit) Use of a collimator and measurement of the U7 output (pulse on the FPGA to reset the Field Drive) Output of U7 blocked at about 2 x1010p/cm2, TID 7 Gy. To the FPGA and then to the Field Drive

Results -IV The transient causes the decrease of the current and the data errors or com lost. A fast scope is needed to fully appreciate the transient pulse and its duration

Results -IV U7 is blocked at low level and keep the FieldDrive in reset  Lost of communication

Results -IV

Results - V DerivFIP (3rd unit) Use of a collimator on the anti latch-up circuit: no errors up to 1x1011 p/cm2 ,TID 50 Gy Use of a collimator on the Field Drive and the FPGA: no errors up to 1x1011 p/cm2, TID 50 Gy

Test 2010 -Conclusions The circuit LP3470 for the Power On Reset shows SET. Same results in literature “Heavy ion Single Event Effects test of Power On Reset LP3470 from National Semiconductors”

Test 2010 -Conclusions Field DRIVE and FPGA PROASIC3 worked without errors up a fluence 250 MeV p+ of 1011p/cm2, (TID 50 Gy). Other components should be replaced according to the CNRAD test on the repeater: The 2.5V regulator L4931CD25 should be replaced with the circuit LM137 The monostable 74HC4538 of the anti latch- up circuit should be replaced by the 74HC123 (see CNRAD test on the repeater)