Kα X-ray yields produced from thick Titanium target under impact of 10-25 keV electrons Sunil Kumar, Namita yadav, Pragya Bhatt, Raj Singh, B.K.Singh, R.Shanker * *Atomic Physics Laboratory, Department of Physics, Banaras Hindu University, Varanasi-221005 INTRODUCTION In 1895 a German physicist W. C. ROENTGEN (1845-1923) found that a highly penetrating radiation of unknown nature (X-rays) is produced when fast electrons impinge on matter. For this discovery, he was awarded the first noble prize of Physics in 1901. X-Ray Spectrum: A typical X-ray spectrum consist of Characteristic X-rays and Continuous X-rays. Characteristic X-rays are produced by inner-shell ionization of atoms or molecules by impinging charge particles whereas the Continuous X-rays are produced due to Coulomb-interaction between impinging charge particle and the constituents of atoms or molecules. EXPERIMENTAL SET-UP X-ray spectrum Experimental Parameters Beam Energy=10-25 keV Beam Spot Size= ~3mm Electron Beam Current= 50nA Base Pressure < 1.6E-6 Torr Photon Detection Angle=135 Acquisition Time= 1-3 hrs Thick Ti Target (0.13mm) 99.9 % pure CONCLUSIONS Selection rules: Δℓ=±1 Δ j =0,±1 X-ray spectrum is produced from 10-25 keV electrons colliding with thick Ti (Z=22) target. Characteristic Ti Kα yields are obtained for the considered impact energy range. Obtained results are compared with existing theoretical results . A good agreement is found between the present measurement and theoretical calculation. We have also studied the impact energy dependence of the intensity ratio Kα/(Kα+ Kβ) of chosen target under considered impact energy range. The ratio shows a very weak dependence on impact energy in the studied range. The average value of the ration is found to be about 0.881. OBJECTIVES In the present work we have studied: Kα X-ray yields produced from thick Titanium target under impact of 10-25 keV electrons. Impact energy dependence of the intensity ratio Kα/(Kα+ Kβ) of Ti under impact of 10–25 keV electrons. FORMULA USED Uncertainties involved in the measurement : Beam Current ~ 1% Secondary electron correction ~ 3% Solid angle determination ~ 9% Detector’s efficiency determination ~ 4% Background subtraction ~ 5% Overall uncertainty ~ 12% Where, Y(E0) is the Kα yields, Nx(E0) is the integrated net counts of the Kα peak, Ne is the total number of electrons incident on the target and ε(k) and ΔΩ are respectively the efficiency of the detector and the solid angle subtended by the detector on the target. REFERENCES: [1]. Namita Yadav, Sunil Kumar, Pragya Bhatt, Raj Singh, B.K. Singh, R. Shanker, J. Electc. Rel. Phen. 185, 448 (2012). [2]. Z. An, Y. Wu, M. T. Liu, Y. M. Duan, C. H. Tang, Nucl. Instrum. Meth. B 246, 281 (2006). [3]. D. Bote, X. Llovet, F. Salvat, J. Phys. D: Appl. Phys. 41, 105304 (2008). ACKNOWLEDGEMENT: We would like to acknowledge Department of Science and Technology(DST), GOVT. OF INDIA, for financial support. *Corresponding email address: shankerorama@gmail.com