Irradiation Tests at UC Davis on May 5, 2017 M. Matveev, W Irradiation Tests at UC Davis on May 5, 2017 M.Matveev, W.Shi Rice University

Hardware and Plan Devices under test: - Two Xilinx XCF32P mounted on the MPC mezzanine card - One Cypress S25FL128S SPI Flash attached to Nexys4 evaluation board - Plan only TID test on these devices up to 30kRad (or less, if failed), no SEU studies Boards and crate: - Both MPC mezzanine and Nexys4 are sitting on the MPC baseboard - Portable 9U custom crate Cabling: 20 m USB cable from the crate to a laptop in the control room. Plan: Read/Write/Verify all devices from Xilinx Impact software.

Custom 9U Crate

Test at UC Davis

Test Results and Verification at Rice Results at UCD, May 5th - 1st Xilinx XCF32P was OK after 20 kRad, but failed after 25 kRad (unable to reprogram and read back) - 2nd Xilinx XCF32P survived 30 kRad (the test stopped at this point) - Cypress S25FL128S SPI Flash failed after 5 kRad (unable to reprogram) Verification at Rice, May 12 - Upon power cycling both FPGA were loaded successfully (that means the 1st Xilinx XFC32P and the Cypress SPI had an intact configuration at the end of the irradiation test at UCD) - 1st Xilinx XCF32P is OK (can program/read/verify, tried 3 times) - 2nd Xilinx XCF32P is OK (can program/read/verify, tried 3 times) - Cypress S25FL128S can be erased, but can’t be programmed