Setup for automated measurements (parametrization) of ASD2 chip

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Presentation transcript:

Setup for automated measurements (parametrization) of ASD2 chip Hardware environment ASD test board Programmer board Measurement instruments Control software for PC Post-processing of measurement data Future improvements of test setup Chip tester prototype Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Hardware environment Programmable power supply Timer / counter Programmable signal generator ASD2 test-board USB -> ASD serial interface board PC Timer / counter Oscilloscope Multimeter * PC connection options: USB, GPIB, Ethernet Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

PC USB to ASD serial interface adapter board 3.3V voltage regulator FTDI FT2232H module with Miro-USB connector to PC host ASD test board connector Optocoupled interface Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Test board with ASD2v5 mounted and wire bonded directly to PCB 3.3V voltage regulator Connector for ASD serial interface Standard MDT 16-pin input connector (bottom side) Standard MDT mezzanine input protection network SMA connectors for CH7`s input and analog output Connector for digital outputs (LVDS) Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Control software Written in C# for Windows platform. Can also run on Linux via Wine emulator Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Basic measurement types Threshold scan With ASD input floating (noise scan) – channel threshold offset, noise With input signal applied – gain, gain uniformity among channels, linearity, signal path total noise Measurement of channel digital output pulse width (ADC mode) vs: Input charge ASD programmable parameters: rundown current, integration gate etc.. Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Threshold scan with floating input Gaussian fit gives: Channel internal offset Channel noise RMS Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Threshold scan with floating input Channel offset on-chip spread – “quality grade” of the chip Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Threshold scan with input signal applied Input signal - 1kHz square wave applied to a capacitor. Q = ∆V*C Threshold crossing point - gain S-curve`s slope – proportional to noise RMS Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Threshold scan with input signal applied Ch-to-ch gain uniformity Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Threshold scan for different input charges Linearity Maximum charge, which can be suppressed by threshold Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Composite measurement results 2 chips (16 channels) threshold scans combined Ch-to-ch variation of gain is very low. At 10fC input charge signal amplitude variation is 9mV maximum (<4%) Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Measurement with oscilloscope Oscilloscope provides wide range of “mathematics” which simplify measurements, i.e. statistics (average, mean, sigma, etc.) Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17

Future improvements Input and output multiplexing Prototype of final mass production chip tester Setup for automated testing/measurement of ASD2 performance. S. Abovyan. 29.05.17