Design and Manufacture of a Large Aperture Wavefront Sensor (LAWS)

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Presentation transcript:

Design and Manufacture of a Large Aperture Wavefront Sensor (LAWS) Rich Hutchina, Oberdan Ottoa, Alan Wertheimerb aOptical Physics Company, 26610 Agoura Road, Calabasas, CA USA 91302 bEastman Kodak Company, 1447 St. Paul Street, Rochester, NY USA 14653-9521 Optical Physics Company Calabasas, CA 818-880-2907 rahutchin@opci.com

Large Aperture Testing There is an evolving requirement for ground testing large aperture optical systems James Webb Space Telescope – 6.5 meters Space-Based Lasers – 5-10 meters Phased ground telescopes – 8-30 meters Should measure wavefront tilts and phasing errors Such large aperture test equipment can be extremely expensive and large to build OPC has developed a compact, cost-saving alternative Modular design for 2-10 meter systems

HyperSpectral Sensors and Large Wavefront Sensors

Hartmann Sensor with 5 millirad FOV The tilt of each subaperture is measured with a shearing interferometer (also measures phasing error) Just add a fiber source near the system FPA and the sensor can measure end-to-end wavefront

LAWS Specifications – First Module 2.4 meter diameter aperture 448 subapertures (every 10 cm) 3.5 nanoradians rms subaperture noise at 4 kHz frame rate Median noise 1.7 nanoradians rms Phasing noise 0.12 nanometers rms Measure wavefront disturbances up to 2 kHz at a level of 1/1800 waves rms at 0.65 µm Achieved 1/3800 waves rms at 0.65 microns Linear dynamic range of 5 milliradians for ease of alignment Second Generation Enhancement: Absolute wavefront to lambda/300 rms

LAWS System LAWS system includes the WFS, cabling, GUI control system, high speed data storage, processing software and external synchronization System is space clean and vacuum compatible

NanoTracker Sensor Design Subaperture tracker is a shearing interferometer for linearity and huge field of view (patent pending) Grating is on a plano-convex lens which re-images the fore lens onto the detector plane

Shearing Interferometer Signals Amp(j,k) = 0.75 if j = k = 0 Amp(j,k) = 1/(p2jk) if both j and k are odd Amp(j,k) = 1/(2pj) if j is odd and k = 0 Amp(j,k) = 1/(2pk) if k is odd and j = 0 Amp(j,k) = 0 for all other values of j and k Subaperture beam passes through 2D grating about one wave out of focus Detector array is at image of fore lens 0 order interferes with +/- first orders for sinusoidal fringes

NanoTracker Phase Processing Each axis has four photodiodes The phase of the sine wave is found using sum of the four intensities with complex weights Exact values of the weights are determined by a simple calibration operation where beam is scanned 25-100 mrads

LAWS Calibration Pixel dark calibration Pixel phase calibration Turn off source and average 100 frames Pixel phase calibration Scan beam 25-200 mrads in each axis and solve for weights as shown above Gain calibration of the NanoTracker Tell the processor how many microradians were scanned No gain calibration is necessary for the phasing measurements Rotation calibration of the NanoTracker Scan in the X and Y axes of the Unit Under Test All data will then be presented in those axes

LAWS Test Results Median subaperture noise was 1.7 nanoradians rms nm Median subaperture noise was 1.7 nanoradians rms The sensor comes with a “flying carpet” display to show the dynamic wavefront

Sample Subaperture Tilt PSD’s Rush Hour in Calabasas with High Light Level Night time in Calabasas with Low Light Level Sample PSD’s are shown here taken under different seismic conditions LAWS resonances around 125 and 200 Hz are visible Noise floors are clear

LAWS Summary Modular WFS has been designed for 2-10 meter apertures First module has been built and tested for Kodak 2.4 meter diameter, 448 subaperture 1.7 nanoradians rms mean noise at 4 KHz 0.1 nanometers rms phasing at 4 KHz 1/3800 waves rms wavefront accuracy at 4 KHz Second generation will have absolute wavefront accuracy of 1/300 wave rms Goal: Low cost, compact option for testing large optical systems