Extra Solar Planet Science With a Non Redundant mask Stefenie N. Minto (UMES, STScI) Alexandra Greenbaum (JHU, STScI) Anand Sivaramakrishnan(STScI) Deepashri Thatte(STScI) Kathryn St. Laurent (STScI
Non Redundant Mask Aperture Masked Interferometry (AMI) mode For high angular resolution imaging We use a 7 hole nrm .The NRM is used for high angular resolution imaging for the AMI mode in NIRISS
Fringe Phase & Visibility Wide Diffraction Pattern Single slit Narrow Diffraction Pattern Double slit Where the sharp fringes are within the broad pattern Is the fringe phase Clarity of the fringe is the fringe visibility As the image becomes more resolved the fringes becomes less noticeable this shows how sensitive the interferometry is to change in fringe phase and visibility which is what we want to measure V ~ 0.5 V = 0 V ~ 1
Object seen through telescope in sky Object seen through telescope Star seen through telescope Single Star Image (PSF) Same Star with Planet
Contrast with and without planet light
Find Companions in three steps Measure Fringe Phases & Fringe Amplitudes in the image Calibrate the Data Look at Single Stars to Remove Instrument Effects Fit Model to Star + Planet Data Fitting fringe Phases to the Model
How will Pixel Scale affect the results? Experimental Set up How will Pixel Scale affect the results? - Simulate NIRISS data at one pixel scale Fit data with different pixel scales Measure parameters at different pixel scales To know how reliable our data reduction method will be for NIRISS images
Results Very small change to position angle and contrast ratio Whatever our uncertainty is in the pixel scale error tell us the uncertainty in out measurement .
Higher contrast binary Next Steps Apply my code to explore new problems like Higher contrast binary Smaller separation Under sampled data This program explores different effects on our simulated measurements so we have a good idea of how well we can rely on our measurements which gives us a structure to explore other uncertainties in the data
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