Calibration of Charge Diagnostics using Electrons from a Laser Plasma Accelerator EAAC 2017, WG5 - High-gradient plasma structures/Advanced beam diagnostics.

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Calibration of Charge Diagnostics using Electrons from a Laser Plasma Accelerator EAAC 2017, WG5 - High-gradient plasma structures/Advanced beam diagnostics Simon Bohlen1,2, Dirk Lipka1, Olena Kononenko1,2, Jan-Patrick Schwinkendorf1,2, John Dale1, Richard D’Arcy1, Lars Goldberg1,2, Jorgen Lund-Nielsen1, Jörg Neugebauer1, Charlotte Palmer1, K. Poder1, Martin Quast2, Lucas Schaper1,  Matthew Streeter1, Gabriele Tauscher1,2, Silke Vilcins1 and Jens Osterhoff1 1 Deutsches Elektronen-Synchrotron (DESY) 2 University of Hamburg Elba, Italy, 26.09.2017

Charge Measurement in PWA Plasma wakefield acceleration can accelerate electron bunches with charges from several fC[1] up to nC range[2] Charge important parameter to understand and control plasma acceleration Difficult to find devices with dynamic range of six orders of magnitude Background sources such as EMP or x-rays from betatron radiation and bremsstrahlung always present At FLASHForward different diagnostics installed to cross- calibrate and test for use in plasma wakefield experiments Example of electron profile measurement y [mm] Intensity [arb.u.] x [mm] [1] e.g. C. Thaury et al., Scientific Reports 5:16310 (2015) [2] e.g. X. Wang, et al., nature comm. 4:1988, DOI: 10.1038/ncomms2988 (2013) | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

LWFA at FLASHForward for Diagnostic Calibration Overview of the Experimental Labs See Talk by Jens Osterhoff: Wed. 18:45, Joint Session | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

LWFA at FLASHForward for Diagnostic Calibration Overview of the Experimental Labs Experimental lab: LWFA setup to test diagnostics Ionisation test setup to study ionisation properties Laser lab: Amplitude laser system 25 TW Ti:Sa Laser 25 fs, 10 Hz Talk by G. Tauscher: WG1, Mo., 17:00 | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

LWFA at FLASHForward for Diagnostic Calibration Experimental Setup Pre-interaction laser diagnostic F/16 X-ray diagnostic Beam dump Electron spectrometer DRZ/Mirror ICT DaMon Post-interaction laser diagnostic | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Charge Diagnostics DRZ Screens DaMon ICT DRZ Screen DRZ Screens Phosphor screens which emit stored energy in form of photons Screens can be stimulated by electrons or x-rays Light Emission peaked at 545 nm Installed for measurement of electron profile and spectrum Clear aperture: 70 mrad (profile screen) | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Charge Diagnostics DRZ Screens DaMon ICT DRZ Screen Integrating Current Transformer[3] (ICT, Toroid) Electron pulse induces current in toroid By integrating the induced voltage it is possible to measure the bunch charge. Clear aperture: 100 mrad U [4] [3] bergoz ICT: ICT-082-10.0-VAC image from bergoz.com [4] Courtesy of Gorgia State University: http://hyperphysics.phy-astr.gsu.edu/hbase/magnetic/toroid.html | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Charge Diagnostics DRZ Screens DaMon ICT DRZ Screen Dark Current Monitor[5,6] (DaMon) Stainless Steel cavity used as passive resonator Frequency of first monopole mode (TM01) at 1.3 GHz Induced TM01 mode used for charge measurement Amplitude of induced mode proportional to charge Two readout channels for high dynamic range Clear aperture: 35 mrad Courtesy of D. Lipka [5]D. Lipka et al., Proc. of DIPAC 2011, Hamburg, WEOC03 [6]D. Lipka et al., Proc. of IBIC 2013, Oxford, WEPF25 | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Absolute calibration of DRZ screens Collaboration of DESY1, HZDR2, LMU München3, MPQ Garching4, University of Jena5 Absolute calibration of DRZ screens at ELBE in Dresden Calibration of light output against ICT data for charge region of about 10 pC to 100 nC. High light output of 1.05x1010 photons/(sr * pC) for DRZ High Light yield of DRZ High by a factor of 13 higher compared to LANEX Fine Light Yield Screen Type Light yield at 50 pC [arb. u.] DRZ High 13.1 Kodak Biomax 9.5 DRZ Plus 8.8 DRZ Standard 6.4 LANEX Fine 1.0 S. Bohlen1, J. Couperus2, R. D`Arcy1, H. Ding3, A. Irman2, S. Karsch3,4, J.M. Krämer2, T. Kurz2, S. Kuschel5, J. Osterhoff1, D. Schinkel5, U. Schramm2, J.-P. Schwinkendorf1 | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Comparison of DRZ and DaMon High dynamic range of DaMon and sensitivity on fC level | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Comparison of DRZ, DaMon and ICT ICT sensitive to noise from EMP [7,8] [7]similar as in e.g.: B. Hidding et al., Rev. Sci. Instrum. 78, 083301 (2007) [8]example for no factor: K. Nakamura et al., PRSTAB 14, 062801 (2011) | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

High Dynamic Range of DaMon Up to seven orders of magnitude from two channels | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Future Plans DaMon ICT DRZ Screen Rotate setup to have non-destructive measurement devices in front Cross-calibration of our imaging of DRZ screens to be able to use absolute calibration of screens Investigate noise and scaling factor of ICT in more detail Install diagnostics at PWFA experiments at FLASHForward | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

DRZ Screens DaMon ICT DRZ Summary Three different types of charge diagnostics installed for LWFA experiments at FLASHForward: DRZ screens, DaMon, ICT Absolute calibration of DRZ screens was performed at ELBE: DRZ High was measured to have a very high light output ICT was tested in noisy environment: Charge scaling required at our setup Noise restricting measurement to charges above a few pC Non-destructive measurement DaMon was first tested in LWFA setup: High dynamic range from ~ 10 fC up to 100 nC Insensitive to electromagnetic noise from plasma | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

Backup Slides | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

DaMon Charge Measurement 𝑍 = line Impedance 𝑄 𝑒𝑥𝑡 = resonator external quality factor 𝑅/𝑄 = normalized shunt impedance (simulated) 𝑈= 𝑈 0 sin 𝜔𝑡 exp − 𝑡 𝜏 𝜔=2𝜋𝑓 𝜏= 𝑄 𝐿 𝜋𝑓 𝑈 0 𝑞 =𝜋𝑓 𝑍 𝑄 𝑒𝑥𝑡 𝑅 𝑄 =𝑆=𝑐𝑜𝑛𝑠𝑡 → 𝑈 0 ~ 𝑞 Field distribution of 1. monopole mode Simulation view Courtesy of D. Lipka | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

DaMon Charge Measurement Signal without electronics Complete measured spectrum up to 6 GHz TM01 TM11 TM21 TM02 TM12 TM22 TM03 q ≈ 0.34 nC First three monopole modes frequencies: 1.299; 3.236; 5.074 GHz Signal with electronics Courtesy of D. Lipka | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017

High Dynamic Range of DaMon Background shots included | Calibration of Charge Diagnostics | Simon Bohlen, 26.09.2017