Status Update of IEEE CS Test Technology Technical Council Yervant Zorian TTTC Senior Leadership Board

Objectives Source of state of the art test technology Emerging test standards Novel information sharing forums Network of design & test professionals Address next test technology challenges All activities concentrate in a single community and a single organization

TTTC Chair 1st Vice-Chair Technical Meetings Group Technical Activities Group Asia & Pacific Group Tutorials & Education Group Standards Group Communi-cation Group Standing Committee Group 2nd Vice-Chair Europe Group Past Chair Technical Meeting Review Committee TAC # 1 Programs IEEE 1149.1 Booth Awards TAC # 2 New initiatives IEEE P1149.4 Database & Member. Bylaws Senior Leadership TM # 1 Latin America Group ITC Gen Chair Organiza-tion IEEE P1149.5 Electronic Broadcast History TM # 2 IEEE 1450 Marketing Nomina-tion D&T EIC North America Group IEEE 1500 Planner Students Secretary TAC # 13 News-letters Finance TAC # 14 TM # n Social Media

Technical Meeting Group Portfolio of different Technical Meetings developed over many years by dedicated volunteers worldwide Addresses range of industrial challenges Generally – successful and viable Technically, Financially , Culturally and geographically Different types of technical meetings Regional/Geographical (wide topics) – ATS, ETS, LATW Topical (focused technical topic or small group of topics) - Board Test Workshop Wide-scoped (technical and geographical) --- ITC, VTS Maturity Range of maturities Range from several decades to born this year!

TTTC Technical Meetings EWDTS DDECS ETS IDT DELTA ATS LATW

Topical Proliferation Product Life Cycle Field IOLT Factory DfM&Y Design HLDVT Core SoC SiP System STD 1149 Die Board 1149.1 btw Levels of Integration Analog Memory MTDT 3DIC Processor MTV Technology

Two Achievement Awards TTTC Most Successful Technical Meeting Award TTTC Most Populous Technical Meeting Award Seventh time to be presented at VTS 2012

TTTC Sponsored Most Successful Technical Meeting 3D-Test (Anaheim, Nov. 2011) 2nd IEEE Int’l Workshop on Testing Three-Dimensional Stacked Integrated Circuits) Chairs: Yervant Zorian, Synopsys; Erik Jan Marinissen, IMEC; Said Hamdioui, Delft University

TTTC Sponsored Most Populous Technical Meeting 20th ATS (Asian Test Symposium 2011, New Delhi, India) Chairs: A. Chatterjee, Georgia Tech A. Patra, IIT Kharagpur S. Kundu, U Mass S. Ravi, Texas Instruments

TTTC Best Doctoral Dissertation Most impactful PhD thesis Selected by panel of industrial judges Award held at VTS for 5 years Expand international participation Two step selection process Multi-site selection for semi-finalists Single-site selection for finalist

TTTC Best Doctoral Dissertation Award in honor of: Prof. Edward J. McCluskey Long time test educator Director CRC Stanford Univ. 1st President of IEEE CS 2002 Recipient of TTTC Lifetime Contribution Award

Gerald W. Gordon Award Award in honor of longtime ITC volunteer, Gerald Gordon Award presented to student with interest in test who has done volunteer work for the test community Sponsored by ITC, TTTC, IEEE Philadelphia Section

TTTC Lifetime Contribution Medal Outstanding Technical Contribution Fundamental Impact on Test Technology Granted Annually Presented at a Major TTTC Event Featured in IEEE Design & Test Call for Nominations (June 30, 2012)

Past Recipients E. Eichelberger A. d’Arbeloff E.J. McCluskey J. Mucha R. Tulloss P. H. Bardell T.W. Williams J. H. Arabian M. Mahoney

Looking Forward Source of state of the art test technology 3D designs, nanoscale technology, …. Emerging test standards Modern network of test professionals Novel information sharing forums Contribute to its multitude of forums