Library Characterization

Slides:



Advertisements
Similar presentations
Practical Aspects of Reliability Analysis for IC Designs T. Pompl, C. Schl ü nder, M. Hommel, H. Nielen, J. Schneider.
Advertisements

Copyright 2001, Agrawal & BushnellLecture 12: DFT and Scan1 VLSI Testing Lecture 10: DFT and Scan n Definitions n Ad-hoc methods n Scan design  Design.
4/16/2015Fractal Technologies Confidential Fractal Technologies Validation checks for: -Standard cell Libraries -IO lib and IP (Design Formats)
Logic Synthesis – 3 Optimization Ahmed Hemani Sources: Synopsys Documentation.
Chapter 2Test Specification Process. n Device Specification Sheet – Purpose n Design Specification – Determine functionality of design n Test List Generation.
XPower for CoolRunner™-II CPLDs
© 2015 Synopsys, Inc. All rights reserved.1 Timing Analysis in a Mixed Signal World TAU Workshop Panel Session Jim Sproch March 12, 2015.
Ch.3 Overview of Standard Cell Design
Micron Technology Clinic Evaluation of Integrated Circuit Power Supply Noise with Two-Phase Analysis Sze-Hsiang Harper, Michael Tomer, Kristian Blomquist,
Copyright 2001, Agrawal & BushnellDay-1 PM Lecture 4a1 Design for Testability Theory and Practice Lecture 4a: Simulation n What is simulation? n Design.
1 Simple FPGA David, Ronald and Sudha Advisor: Dave Parent 12/05/2005.
ECE Synthesis & Verification1 ECE 667 Spring 2011 Synthesis and Verification of Digital Systems Verification Introduction.
The Spartan 3e FPGA. CS/EE 3710 The Spartan 3e FPGA  What’s inside the chip? How does it implement random logic? What other features can you use?  What.
Constructing Current-Based Gate Models Based on Existing Timing Library Andrew Kahng, Bao Liu, Xu Xu UC San Diego
Chung-Kuan Cheng†, Andrew B. Kahng†‡,
King Fahd University of Petroleum and Minerals Computer Engineering Department COE 561 Digital Systems Design and Synthesis (Course Activity) Synthesis.
Supply Voltage Biasing in Synopsys Andy Whetzel University of Virginia 1.
03/30/031 ECE 551: Digital System Design & Synthesis Lecture Set 9 9.1: Constraints and Timing 9.2: Optimization (In separate file)
ESD for the Fabless Semiconductor Company Golden Rules of ESD Due Diligence for Third Party Intellectual Property Golden Rules of ESD Due Diligence for.
Kazi ECE 6811 ECE 681 VLSI Design Automation Khurram Kazi* Lecture 10 Thanks to Automation press THE button outcomes the Chip !!! Reality or Myth (*Mostly.
ASIC Design Flow – An Overview Ing. Pullini Antonio
XPower for CoolRunner™ XPLA3 CPLDs. Quick Start Training Overview Design power considerations Power consumption basics of CMOS devices Calculating power.
Chonnam national university VLSI Lab 8.4 Block Integration for Hard Macros The process of integrating the subblocks into the macro.
The George Washington University School of Engineering and Applied Science Department of Electrical and Computer Engineering ECE122 – 30 Lab 3: Layout.
By Praveen Venkataramani
Distributed Computation: Circuit Simulation CK Cheng UC San Diego
Static Timing Analysis
Written by Whitney J. Wadlow
Simulation [Model]s in IBIS Bob Ross, Teraspeed Labs Future Editorial Meeting April 22, 2016 Copyright 2016 Teraspeed Labs 1.
1 EE 382M VLSI 1 EE 360R Computer-Aided Integrated Circuit Design Lab 1 Demo Fall 2011 Whitney J. Wadlow.
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 61 Lecture 6 Logic Simulation n What is simulation? n Design verification n Circuit modeling n True-value.
Piero Belforte, HDT 1999: PRESTO POWER by Alessandro Arnulfo.
Piero Belforte, HDT, July 2000: MERITA Methodology to Evaluate Radiation in Information Technology Application, methodologies and software solutions by Carla Giachino,
Introduction to ASICs ASIC - Application Specific Integrated Circuit
Overview Modern chip designs have multiple IP components with different process, voltage, temperature sensitivities Optimizing mix to different customer.
ASIC Design Methodology
THE CMOS INVERTER.
TUTORIAL: Digital-on-Top
An Unobtrusive Debugging Methodology for Actel AX and RTAX-S FPGAs
Mixed-Digital/Analog Simulation and Modeling Research
A High-Speed and High-Capacity Single-Chip Copper Crossbar
VLSI Testing Lecture 5: Logic Simulation
Problems with “Inferred Latches” in Verilog
VLSI Testing Lecture 5: Logic Simulation
Written by Whitney J. Wadlow
Vishwani D. Agrawal Department of ECE, Auburn University
VLSI Testing Lecture 6: Fault Simulation
COUPING WITH THE INTERCONNECT
Lecture 23 Design for Testability (DFT): Full-Scan (chapter14)
Introduction to Sequential Logic Design
SIDDAGANGA INSTITUTE OF TECHNOLOGY
ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS
Timing Analysis 11/21/2018.
STATIC TIMING ANALYSIS, CROSS TALK AND NOISE
IAY 0800 Digitaalsüsteemide disain
ECE 551: Digital System Design & Synthesis
Circuit Design Techniques for Low Power DSPs
Typical STD Cell Library Errors
HIGH LEVEL SYNTHESIS.
Testing in the Fourth Dimension
Vishwani D. Agrawal James J. Danaher Professor
COPING WITH INTERCONNECT
Combinational Circuits
ECE 352 Digital System Fundamentals
Submitted by HARSHITHA G H
EE382M VLSI 1 LAB 1 DEMO FALL 2018.
Combinational Circuits
VLSI Testing Lecture 13: DFT and Scan
Chapter 10 Introduction to VHDL
HotAging — Impact of Power Dissipation on Hardware Degradation
Presentation transcript:

Library Characterization Divya Akella, Abhishek Roy University of Virginia

Motivation for std. cell characterization Create high quality models of a std. cell library which can accurately emulate circuit behavior These models can be used for several digital design/synthesis tools for different purposes

What is a library characterizer Creates electrical views (timing, power and signal integrity/noise) in industry standard formats such as Synopsys liberty (.lib) format, .cdb format for Noise models etc. Conventionally, it only requires foundry device models and extracted cell netlists ( for better accuracy, noise models) to create all the required electrical views By automating the process for generating views, it ensures that the library’s functional, timing, power and signal integrity values are accurate and complete to avoid potential chip failures

Library characterization packages The tools/information required are Analog simulator (Hspice, Spectre etc.) Netlist of the cells (extracted esp. if creating noise models or using advanced/newer processes. For timing only, pre-layout is OK if using 130nm) Device models from the foundry An idea of the timing arcs if using custom cells (I/Os, level shifters, new flip-flop architecture etc.) Vendors Synopsys SiliconSmart ELC Liberate (Cadence)

Timing model formats NLDM : Non-linear delay model Input transition vs. capacitive load Look-up Table (LUT) for picking delays. Similar LUTs for setup/hold etc. Constant voltage based. No effect of IR-drop or Ldi/dt effects on cell delay modeled. Reasonably accurate for 90nm and older. Not accurate for newer technologies (65nm and below) Current source modeling CCS (Composite current source) and ECSM (Effective current source model) Current-based measurements to determine metrics such as input-capacitance of std-cells etc. More accurate estimates of interconnect impedance and its impact on the overall delay. Models effects of IR-drop and LdI/dt effects on cell delay Recommended for use in 65nm and below but more complex and time consuming to generate

Timing Arcs Can be delay arcs (most common. Present in both combinational and sequential cells) or constrained arcs (flip-flops, latches etc.) Timing arcs have a start-point (input,output,inout pin) and an end-point (output,inout pin) Not valid for constrained timing arc such as setup,hold,recovery, removal which can be between two inputs ( e.g; clock and data) If cell characterization tool is unable to identify the cell, timing arc generation and creation should be understood in detail

Tool Details Tutorial How to run? Cadence Liberate /app3/cadence/LIBERATE161/bin/liberate Pre-requisites /var/home/ece/bin/cadence2011 /var/home/ece/bin/synopsys-setup Tutorial Tutorial /var/home/bengroup/libs/characterization_tutorial Sample cell /var/home/bengroup/libs/characterization_tutorial/sample How to run? Command /app3/cadence/LIBERATE161/bin/liberate char.tcl > char.log Or just: tcsh runfile

Load netlists and models Characterization flow Set parameters Load templates Load netlists and models Characterize library Write libary

Set different variables Load template for each cell Setup Tcl Script: char.tcl Set different variables set lib_name BUFX2TS_STARVE Specifies the name of the resultant library set_operating_condition -voltage 0.5 -temp 27 Defines default process, temperature and voltage to be used for library creation. Automatically identifies VDD as power and 0, GND, and VSS as ground set_vdd -type primary VDD 0.500 set_vdd –type primary VSS 0 Identify name(s) of ground and power nets. Can be used to override defaults set by above. set_pin_vdd -supply_name VDD3 BUFX2TS_STARVE VREF 0.200 set_pin_gnd -supply_name VSS BUFX2TS_STARVE VREF 0 Associate a pin of a cell with a particular supply domain. Particularly useful on cells that have multiple power and ground. Load template for each cell source template_ibm130.tcl Load template define_template -type power \ -index_1 {0.129 0.250 0.499 0.992 } \ -index_2 {0.004 0.016 0.08} \ power_template_4x3 Defines a template to be used for characterization for delay, power etc.

-input {A VREF} -output {Y} -pinlist {A VREF Y} define_cell \ -input {A VREF} -output {Y} -pinlist {A VREF Y} -delay delay_template_4x3 –power power_template_4x3 BUFX2TS_STARVE Defines how a cell is to be characterized. define_arc \ -vector "F0F" -when "!VREF" -related_pin {A} \ -pin Y BUFX2TS_STARVE Specifies a user-defined arc to override automatic arc determination by Liberate. Load models and netlists set spicefiles include.scs lappend spicefiles BUFX2TS_STARVE.scs Set the path to models and netlists read_spice -format spectre $spicefiles Read the netlists Characterize the library char_library -cells ${cells} -extsim hspice Command to characterize Characterize the library write_library -user_data user_data.lib -overwrite {lib_name}.lib Write into the library User_data.lib : you can make the .lib look like this

Recommendations Read the manual: /app3/cadence/LIBERATE161/doc/liberate/* Get started on characterization to learn: /var/home/bengroup/libs/characterization_tutorial/sample Other useful documentation Synopsys Liberty (.lib) format : https://people.eecs.berkeley.edu/~alanmi/publications/other/liberty07_03.pdf Eric Brunvand, “Digital VLSI chip design with cadence and synopsys CAD tools”