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Presentation transcript:

CERN/EN/MME-MM/EDMS XXXXXXX EN Division-Metallurgy and Metrology Domaine / Field: CLIC Date: XX/XX/2017 N° EDMS / EDMS Nr.: XXXXXXX Requérant / Customer: XXXXXXXXXXXX Liste de distribution / Distribution list: XXXXXXXXXXXXXXX FIB-STEM Observation Report of LES Cathode camera 2 Données expérimentales / Experimental data: Sample: Description of the sample. Equipment : Optical Microscope Zeiss Axio-Imager, with ZenCore2 and Axio-Visio software. Scanning Electron Microscope (SEM), field emission gun FEG Sigma (ZEISS) with InLens (Secondary Electron), Evan-Thornley Secondary Electron (SE2), and back-scattered electron (AsB) detectors for imaging. Focus Ion Beam (FIB) XB540, Scanning Transmission Electron Microscopy. Redaction / Written by: E. RODRIGUEZ CASTRO – EN/MME-MM Approuvé par / Accepted by: F. LEAUX - EN/MME-MM Expériences / Testing by: Superviseur / Supervisor: EN Division-Materials and Metrology CERN/EN/MME-MM/EDMS XXXXXXX

Introduction: The set of LES “camera 2” was analysis on EDMS n. 1752821 Pulse length 5 us 5 us Delay for pulse 600 ns 600 ns Min voltage 1000 V Max voltage 8500 V Total number of pulses 5.5e7 Total number of breakdowns 4533 Automatic counting = 489 Manual counting = 504

Observation: N. Pienimaki develop a Matlab script to divide surface in elements and 3 subsets: Subset 1 0<1<2 Subset 2 1<2<3 Subset 3 And the rest

Observation: Subset 1 0<1<2 Subset 2 1<2<3 Subset 3 And the rest

Reference

Reference Reference

1 BD observation 1 BD observation

1 BD observation 1 BD observation

2 BD observation

2 BD observation

Summary of observations No dislocation structure visible. Superficial layer affected on reference region (plastic deformation during machining?). Disordered on 1 BD and 2 BD