CERN/SSC Technology Transfer Day

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Presentation transcript:

CERN/SSC Technology Transfer Day Facilities for radiation testing and technologies for radiation monitoring Rubén García Alía On behalf of the R2E project 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day Outline Radiation to Electronics (R2E) project overview The RadMON system CERN Radiation test facilities Space application: CELESTA 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day Outline Radiation to Electronics (R2E) project overview The RadMON system CERN Radiation test facilities Space application: CELESTA 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day The R2E challenge 3rd June 2016 CERN/SSC Technology Transfer Day

An R2E mitigation example CERN Neutrinos to Grand Sasso (CNGS) experiment Muon-neutrinos generated through interaction of 400 GeV protons with target Shutdown at an early stage due to successive failures in the ventilation system SEEs in microcontrollers, mitigated by reinforced shielding 3rd June 2016 CERN/SSC Technology Transfer Day

R2E: from mitigation to prevention In order to push radiation tolerance to levels compliant with HL-LHC requirements (~0.1 dumps/fb-1) mitigation is not enough A pre-emptive approach needs to be implemented taking into account the response to radiation from a very early stage of the project 3rd June 2016 CERN/SSC Technology Transfer Day

Hadronic environment at CERN SEEs are induced by indirect energy deposition (nuclear reactions) from hadrons Two main intervals can be distinguished: thermal neutrons (causing SEEs through 10B capture) and high-energy hadrons (HEH) Therefore, the associated fluences need to be calculated and monitored 3rd June 2016 CERN/SSC Technology Transfer Day

Radiation levels at CERN For electronics in the LHC, areas with annual HEH fluxes above 107 cm-2 are considered as SEE non-safe areas owing to the very large amount of equipment installed TID is typically only a concern above annual levels of ~10 Gy, which corresponds to roughly 5·109 HEH 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day Outline Radiation to Electronics (R2E) project overview The RadMON system CERN Radiation test facilities Space application: CELESTA 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day RadMON system Use of commercial electronics to monitor the radiation environment HEH and thermal neutron fluence with SRAM memories, TID with RadFET, DD with PIN diode Need to calibrate in relevant radiation fields 3rd June 2016 CERN/SSC Technology Transfer Day

RadMON general architecture and RHA Power board: AC transformers and linear regulators Main board: ProAsic3 FPGA with TMR both in registers and internal RAM, ADCs for dosimetry sensors Sensor board: TID, DD and SEU detectors. Can be connected to Deported Module for TID and DD sensors FPGA works correctly up to 35-40 krad. Limiting component is ADC, which fails after 25 krad G. Spiezia et al, IEEE TNS (2014) 3rd June 2016 CERN/SSC Technology Transfer Day

RadMON calibration: SRAM SEU cross section Monoenergetic cross sections for high energy protons (30-200 MeV, PSI), intermediate energy neutrons (5-15 MeV, PTB) and thermal neutrons (nuclear reactor) Need to carefully evaluate the sensitivity spread K. Roed et al, IEEE TNS (2012) S. Danzeca et al, IEEE TNS (2014) 3rd June 2016 CERN/SSC Technology Transfer Day

RadMON calibration: RadFET Performed mainly using 60Co but also other particles such as protons Different oxide thicknesses available, but 100 nm typically used (larger measurement range, better response in mixed field) Sensitivity can be increased significantly by applying 5V bias G. Spiezia et al, IEEE TNS (2014) 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day RadMON benchmarking RadMON is regularly benchmarked against FLUKA Monte Carlo simulations both in radiation test facilities (e.g. CHARM) or in actual operation Example: RadMONs installed in LHC IR7 for 2010 run K. Roed et al, IEEE TNS (2012) 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day Outline Radiation to Electronics (R2E) project overview The RadMON system CERN Radiation test facilities Space application: CELESTA 3rd June 2016 CERN/SSC Technology Transfer Day

CHARM in the CERN accelerator complex CERN injector chain to LHC (7 GeV), from SPS (450 GeV) and PS (24 GeV) PS first accelerated protons in 1959, being CERN’s first synchrotron It has a circumference of 628 meters 3rd June 2016 CERN/SSC Technology Transfer Day

CHARM in the PS East Area Located in the PS East Area T8 beamline Typically extracts 24 GeV protons, however heavy ion extraction (Pb, Xe) is foreseen in the near future Proton arrive in spills of ~350 ms every 10 seconds 3rd June 2016 CERN/SSC Technology Transfer Day

The CHARM irradiation facility A broad range of test configurations are available in the CHARM irradiation area Different particle energy spectra and intensities can be obtained by varying the target material, movable shielding and test location Full internal area is subject to large radiation levels (local shielding is not possible) and cable length to control room is ~40m Provided the large volume in the irradiation area, full system tests are possible 3rd June 2016 CERN/SSC Technology Transfer Day

Radiation levels at CHARM The CHARM radiation levels are simulated using FLUKA and benchmarked against measurements (e.g. RadMON) HEH fluence levels of 1010 cm-2 (e.g. worst-case annual LHC tunnel conditions) can be reached in one hour 3rd June 2016 CERN/SSC Technology Transfer Day

Particle energy spectra Mixed-field in which the contribution to TID is roughly equally divided between charged hadrons, photons and electrons/positrons The HEH contribution varies from ~40% pions, ~35% neutrons and ~25% protons for near in-beam positions, to >95% neutrons for shielded lateral locations 3rd June 2016 CERN/SSC Technology Transfer Day

Importance of HEH spectrum hardness Components with high LET-thresholds and high-Z materials (e.g. tungsten) near their SVs are known to have a strong hadron cross section energy dependence with energy up to the GeV range Therefore, testing in an environment which is softer than the operational one can lead to a significant underestimation of the associated SEE rate R. G. Alia et al, IEEE TNS (2015) 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day CHARM tests in 2015 Cryogenic crate: Temperature Pressure Liquid He level gauges Cold Mass Heaters Beam Screen Heaters Mechanical Switches Red and Green LED array: Current consumption LED luminosity CELESTA 1U CubeSat testBoard: SEL detection Current Consumption Accumulated dose HEH monitoring FPGA functionality RadMON upgrades: Test new sensors. Monitor functionality Validate new firmware 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day Heavy ions at CHARM GCR heavy ion spectra typically peak at several hundred MeV/n, whereas ground tests at standard facilities are carried out at ~10 MeV/n (e.g. ranges limited to ~100 um in Si) At CHARM, heavy ion tests at GeV/n energies are possible, providing mid-LET ion with very large penetration (in the mm range) and therefore enabling access to sensitive region of complex components (e.g. flip chips) Currently collecting declarations of interest from space community (ESA, CNES…) and a first run might be possible in 2017 3rd June 2016 CERN/SSC Technology Transfer Day

VESPER: 200 MeV electrons for radiation testing High intensity 200 MeV electron linac, mainly motivated for Jovian environment application (e.g. JUICE) Facility currently under calibration for radiation effects test purposes Preliminary results: SEUs observed in 0.25 um SRAM technology (~3 MeVcm2/mg LET threshold) and are attributed to electro-nuclear events Open to external users! (contact: ruben.garcia.alia@cern.ch) J. M. Trippe et al, IEEE TNS (2016) M. Tali et al, submitted to RADECS 2016 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day Outline Radiation to Electronics (R2E) project overview The RadMON system CERN Radiation test facilities Space application: CELESTA 3rd June 2016 CERN/SSC Technology Transfer Day

CHARM space applications: CELESTA CELESTA (CErn Latch-up Experiment STudent sAtellite) is a fully approved 1U CubeSat project Issued by a collaboration between CERN (providing the payload) and the Montpellier University space Center (CSU) providing the platform based on the ROBUSTA heritage Main objectives: Technical: develop and validate a cubesat radiation monitor based on CERN’s RadMON Scientific: determine proton and HI induced SELs through geographical correlation and compare with predictions from CHARM tests 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day CELESTA orbit Two baseline orbit scenarios: circular (600 km, 98o) and highly elliptical (300 x 1400 km, 99o) In both cases, the expected number of SELs for the candidate SRAM memories are statistically meaningful A. Merlenghi et al, 4S conference (2016) 3rd June 2016 CERN/SSC Technology Transfer Day

SEL detection and protection system for CubeSats COTS based, low-cost, low-power and radiation tolerant Use of an ADC for continuous power consumption monitoring results in a power consumption for affordable for cubesat power budget Analog circuit (difference amplifier + voltage reference) + counter on FPGA can be used instead Tested at CHARM, yielding SEL cross section measurements compatible with previous results using “standard” SEL detection approach TID tolerant for CELESTA mission R. Secondo et al, submitted to RADECS 2016 3rd June 2016 CERN/SSC Technology Transfer Day

Correlating CHARM with space The HEH spectrum at CHARM (protons, neutrons, pions) closely resembles that of the trapped proton belt Under the assumption of SEEs induced by indirect energy deposition, hadrons can (in first approximation) be considered as identical particles, therefore CHARM HEH cross sections can be used to obtain in-flight trapped proton SEE rates Acceleration factor at CHARM: 2·104 3rd June 2016 CERN/SSC Technology Transfer Day

Correlating CHARM with space (II) Possible applications for direct ionization form singly charged particles (left) or heavy ion effects pre-screening (right) but different metrics (as opposed to HEH approach) are required! 3rd June 2016 CERN/SSC Technology Transfer Day

CERN/SSC Technology Transfer Day RADECS 2017 at CERN Looking forward to seeing you there! 3rd June 2016 CERN/SSC Technology Transfer Day

Many thanks for your attention, and questions are welcomed! ruben.garcia.alia@cern.ch