Atomic Resolution Imaging

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Presentation transcript:

Scanning Tunneling Microscopy of Complex Oxides Vidya Madhavan Department of Physics Boston College Atomic Resolution Imaging An STM is the ideal tool to probe the electronic properties of materials at nanometer length scales. We have used a low temperature UHV-STM to study the complex oxide Pr0.88 LaCe0.12 CuO4-δ as shown below. We have found a low energy bosonic excitation in this material that has the same energy as spin-excitations measured by neutron scattering. Spectroscopy on PLCCO (256Å X 256 Å) Bi2Sr2CaCu2O8+δ Tunnel Current (I) Imaging Atomic Manipulation Spectroscopy STM Tip Sample Surface Bias Voltage (mV)