GTK_EOC_V1 A. Kluge

Activities Summary Stand-alone test/DAQ system built up independent & FPGA based very efficient & professional (Matt) A. Kluge

Activities Summary Analog front-end tests performed preamplifier discriminator very good results -> Analysis - Massimiliano A. Kluge

GTK_EOC_V1 Power consumption Simulations confirm present situation Consumption of 100 mA comes from DLL and TDC hit registers compared to other stand-alone DLL comparable room for improvement A. Kluge

Layout E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

AllPower 1.4VEnd ClockInGaasx0.8 E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

AllPower1.4VEnd ClockInGaasx0.8 E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

All power clock CCD b x5 E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

Allpowerclock CCDbx5+allpower1.4EndClockInGaasx0.8 E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

Hardware test & simulations Design optimisation will be guided by hardware test and simulations A. Kluge March 17, 2009

TDC results comparable with stand-alone DLLs in the past TDC qualification 125 ps bin size < 0.2 LSB differential and integral non- linearity comparable with stand-alone DLLs in the past Simulation -> Elena Measurements -> Matt A. Kluge

Result summary Analog front-end noise 56 e- jitter 70 ps time walk compensated compensated jitter 70 ps TDC time bin 125 ps integral and differential non linearity: < 0.2 LSB jitter A. Kluge

Plans main tests still to be done full chain tests concerning jitter and resolution Simulation & Lab tests: improvement analysis long list of qualification tests Schematic & Layout improvements Re-submission dates May 10, Aug 9 2010 Lab based laser tests with bonded assembly A. Kluge

Summary Full list of qualification test still to be done GTK_EOC_V1 demonstrator results are encouraging analog noise & jitter, TDC linearity even more considering the given man power situation the rather short development time Full list of qualification test still to be done GTK_EOC_V2 submission increases quality and understanding A. Kluge

A. Kluge March 17, 2009

A. Kluge March 17, 2009

amplifier (MF) block box with cooling (Francois) FPGA RO card (MN) Laser (MF) Splitter Attenuator (GA) µ-scope access alignment light source µ-manipulator (PR) mounting mechanics (MM, GN) assembly sensor card (MN) heat exchanger (GN) chiller (GN,MM,JK) xy table (MF) LV computer (MN, MF) optical table (MM) HV notes: our 1060 nm laser is uncooled (frequ shift) -> controlled climate Cooling test -> controlled temp + humidity

What do we want to test and how -> work out test protocol. the prototype sensor assembly at a later stage the GTK assembly in terms of time resolution time walk compensation noise immunity pixel by pixel uniformity (front-end and bump bonding quality) temperature qualification What do we need for these tests work out test system, laser, mechanics, electronics, software Where do we get the material from, cost and delay -> purchase if required How can we build the test system -> hardware and software Where will we do the test? -> organize a long term test lab 14-4, Morel lab First bonded assemblies planned for end of Feb -> time line for laser setup A. Kluge

Material Splitter (AK) amplifier (MF) Laser (MF) exist already Spec: amplitude programmable Type: waiting for offer Price Laser (MF) exist already Spec Splitter (AK) Spec: more spec need to be discussed Type: Price: ~ 200 sfr block box with cooling (MM, GN) Spec: MM, GN will work out needs and propose a solution A. Kluge

Material Spec: MM, GN will work out needs and propose a solution Attenuator (GA, AK) Spec: need to wait whether amplifier is programmable Type: Price alignment light source(MM AK) Spec: research needs to be done mounting mechanics (MM, GN) Spec: MM, GN will work out needs and propose a solution heat exchanger (GN) Spec:GN will work out needs and propose a solution A. Kluge

Material optical table (MM) chiller (GN,MM,JK) Spec: Spec:GN, MM, JK will work out needs and propose a solution Type: Price optical table (MM) Spec: MM collets offers HV Spec: LV A. Kluge

Material Spec: MF asks for offers Spec: PR proposes device computer (MN, MF) Spec: needs to be bought Type: Price xy table (MF) Spec: MF asks for offers µ-manipulator (PR) Spec: PR proposes device assembly Spec: A. Kluge

Material µ-scope mounting Spec: not yet discussed Type: Price sensor card (MN) Spec: FPGA RO card (MN) Spec: MN needs to evaluate wether we need a 2nd A. Kluge

A. Kluge March 17, 2009