Luminescent Periodic Microstructures for Medical Applications

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Presentation transcript:

Luminescent Periodic Microstructures for Medical Applications Materials Science 2016 September 13, 2016 Atlanta, USA Luminescent Periodic Microstructures for Medical Applications Kenta Miura Division of Electronics and Informatics, Graduate School of Science and Technology, Gunma University, JAPAN

Background Diffraction 1 Integration of periodic structures and light-emitting diodes (LEDs) was reported as one solution for achieving high light-extraction efficiencies of LEDs. It was reported that two-dimensional (2-D) periodic structures can effectively extract light emitted from active layers of LEDs according to diffraction laws. K. Orita, et al., Jpn. J. Appl. Phys. 43 (2004) 5809. Transmission (Refraction) Emission GaN etc. Total Reflection Periodic Structure Interface Diffraction

Improvement of light-extraction efficiency by periodic structure 2 H. Kitagawa et al., APEX. 1 (2008) 032004. SEM image of a 2-D periodic structure with air holes (bird’s-eye view) PL spectra of samples - A green-emitting GaInN 2-D periodic structure with air holes has been investigated. - The photoluminescence (PL) intensity from the sample with the air holes was approximately three-times stronger than that of a sample without air holes. - These air holes have been processed using electron-beam (EB) lithography and plasma etching. Emission patterns of the samples

Si nanocrystals (Si-ncs) produced by using sputtering 3 H. Seifarth et al., Thin Solid Films 330 (1998) 202. R.K. Soni et al., J. Lum. 83-84 (1999) 187. Average size of Si-nc (calculated from T) HRTEM image of Si-ncs embedded in SiO2 Size dependent PL spectra from Si-ncs embedded in SiO2 Si-ncs exhibit a quasi-direct band gap as a result of the quantum-size effect.  They can show visible photoluminescence (PL) depending on their size.

Preparation of a Si:SiO2 co-sputtered thin film 4 An Si:SiO2 co-sputtered film was deposited on a fused SiO2 substrate by using radio-frequency (RF) magnetron sputtering method. We used an SiO2 plate (65 mmf) on which four Si pellets (20 mmf) were placed as a co-sputtering target. Sputtering conditions: - Base pressure: 2.7 ×10-4 Pa - Ar pressure: 1.3 Pa - RF power: 200 W - Unheated substrate The film was annealed in ambient air for 20 min at 1000oC using an electric furnace. SiO2 plate (65 mmf) Si tablet (20 mmf) Schematic of the co-sputtering target (top view) O. Hanaizumi et al., Appl. Phys. Lett. 82 (2003) 538. O. Hanaizumi et al., Jpn. J. Appl. Phys. 41 (2002) L1084.

Measurement of photoluminescence (PL) spectra 5 Experimental set-up He-Cd laser (l=325 nm) Chopper Mirror Filter Lens Sample Monochro- mator Photomultiplier Amplifier Lock-in amplifier Recorder Oscilloscope Photoluminescence (PL) spectra were measured at room temperature. A monochromator, a photomultiplier, and a lock-in amplifier were used. The intensities of PL spectra were calibrated by using a white-light spectrum measured with an optical spectrum analyzer.

Measured PL spectrum of the Si:SiO2 co-sputtered film 6 ◆ Red-light emission was observed from the Si:SiO2 co-sputtered film. ◆ The PL peak is located around a wavelength of 800 nm. Red-light emission

Design using wave vector and grating vector 7 Transmission (Refraction)  Snell’s Law Transmission (Diffraction)  Diffraction Laws Total Reflection k0=2p/l k0=2p/l k0=2p/l Air (n=1) k1// k0 k0 k2// (=k1//=k0//) k1// k2// (=k1//) k1// G q1 q2 q1 q2 q1 q2 k1 k2 k2 Si:SiO2 (n=n1) k1 k1 k2 k1=2pn1/l k1=2pn1/l k1=2pn1/l G : Grating Vector L : Period of Grating k2// ≧ |G| = 2p / L ) Lmin = 2p / k2// = 2p / k1// = l / (n1 sinq1) ~ 800 nm  @ l=800 nm, n1=1.75, q1 = 35o (total reflection angle)

Fabrication Process of Periodic Structures 8 1. Spin coating of photoresist on the Si:SiO2 co-sputtered film. 2. Double photolithography using two-beam interference method. 3. After development, reactive ion etching of the surface of the film using the patterned resist as a mask. He-Cd laser (l=325 nm) Mirror Half mirror Beam expander (X 40) Shutter Sample 2q Experimental setup of two-beam interference lithography

Double-interference exposure 9 (1) A 1-D periodic pattern was formed by the first exposure.  The periodicity of the 1-D pattern D is expressed as D = l/(2sinq ) (l=325 nm, 2q is the angle between the two beams) (2) A 2-D periodic pattern was formed by the second exposure after rotating the sample.  Rotation of the sample by 60o produces a hexagonal lattice.  The lattice constant of the hexagonal lattice L is expressed as L = 2D/31/2 D (1) 1-D periodic pattern (2) 2-D periodic pattern L

AFM images of the 2-D periodic structure 10 ◆ A 2-D periodic structure with a hexagonal lattice was obtained. ◆ Lattice constant L (measured) : ~810 nm (average) ◆ Depth of processed patterns: ~50 nm (average) 150 nm Top view Bird’s-eye view

With Periodic Structure Measured PL spectra 11 With Periodic Structure Without Periodic Structure ◆ Si-based materials have biocompatibility. ◆ The emission wavelength of 800 nm penetrate a human body.  Light-emitting devices for medical applications will be realized.