Shear test with irradiated samples

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Presentation transcript:

Shear test with irradiated samples NA62 - DIPTEM Genova – UCL 5-09-2012

Silicon samples Silicon glue Silicon samples 10 x 10 mm with wafers 525 µm thick Shear tests with four different adhesive types: Adhesive tape NITTO DENKO 30 µm thick Adhesive tape 3M 9461P – 30 µm thick Adhesive film FastelFilm 30 µm thick Liquid glue Araldite 2020 Polyester film double coated by acrylic adhesive Polyester = 0.13-0.15 W/m K Acrilyc = 0.2 W/m K 3M Adhesive 100 (Acrylic adhesive) 3M Adhesive 100 = 0.178 W/m K EVA (Ethylene - vinyl Acetate) adhesive film EVA = 0.34 W/m K Two components epoxy liquid glue Epoxy = 0.188 W/m K Surface cleaning with acetone 1 Kg for 3 minutes 80 °C in the oven (weight and plate already hot) Surface cleaning with acetone Vacuum outgassing after mixing the component Dispensing with a slice Surface cleaning with acetone 1 Kg for 65 hours Surface cleaning with acetone 1 Kg for 65 hours

Irradiation Irradiation levels: No irradiation 3 x 10 13 1 x 10 14 NITTO 3M FASTEL FILM ARALDITE No irradiation N001 N002 N003 N004 N005 M001 M002 M003 M004 M005 F001 F002 F003 F004 F005 A001 A002 A003 A004 A005 3 x 1013 N131 N132 N133 N134 N135 M131 M132 M133 M134 M135 F131 F132 F133 F134 F135 A131 A132 A133 A134 A135 1 x 1014 nominal N141 N142 N143 N144 N145 M141 M142 M143 M144 M145 F141 F142 F143 F144 F145 A141 A142 A143 A144 A145 1 x 1015 N151 N152 N153 N154 N155 M151 M152 M153 M154 M155 F151 F152 F153 F154 F155 A151 A152 A153 A154 A155 Spare NS6 NS7 NS8 NS9 NS0 MS6 MS7 MS8 MS9 MS0 FS6 FS7 FS8 FS9 FS0 AS6 AS7 AS8 AS9 AS0 Irradiation levels: No irradiation 3 x 10 13 1 x 10 14 1 x 10 15 Araldite: 25 samples FastelFilm: 25 samples NittoDenko: 25 samples 3M: 25 samples Green = glued in Genova the 05-04-12 Red = glued at CERN the 22-05-12

Machine INSTRON 8802 – Floor Model Fatigue Testing Systems up to 500 kN Top clamp Bottom clamp

Results NITTO 3M FASTEL FILM ARALDITE No irradiation N001 N002 N003 M005 (Si broken) F001 F002 (open) F003 F004 F005 A001 (Si broken) A002 (Si broken) A003 (Si broken) A004 (Si broken) A005 (Si broken) 3 x 1013 N131 N132 N133 N134 N135 M131 M132 M133 M134 (Si broken) M135 F131 F132 (open) F133 F134 F135 A131 (Si broken) A132 (Si broken) A133 (Si broken) A134 (Si broken) A135 (Si broken) 1 x 1014 nominal N141 N142 N143 N144 (Si broken) N145 M141 M142 M143 M144 M145 F141 F142 (open) F143 (Si broken) F144 (open) F145 A141 (Si broken) A142 (Si broken) A143 (Si broken) A144 (Si broken) A145 (Si broken) 1 x 1015 N151 N152 N153 N154 N155 (open) M151 M152 M153 M154 M155 F151 (displaced) F152 (displaced) F153 (displaced) F154 (displaced) F155 (displaced) A151 (Si broken) A152 (Si broken) A153 (Si broken) A154 (Si broken) A155 (Si broken) Spare NS6 NS7 NS8 NS9 NS0 MS6 MS7 MS8 MS9 MS0 FS6 FS7 FS8 (open) FS9 FS0 (open) AS6 (Si broken) AS7 (Si broken) AS8 (Si broken) AS9 (Si broken) AS0 (Si broken)

NittoDenko – No irradiation F force (N)= σ * 100 D displacement (mm)= ε * 10

NittoDenko - 3 10 13 - 1 10 14 - 1 10 15 F force (N)= σ * 100 D displacement (mm)= ε * 10

NittoDenko – Comparison

3M – No irradiation F force (N)= σ * 100 D displacement (mm)= ε * 10

3M - 3 10 13 - 1 10 14 - 1 10 15 F force (N)= σ * 100 D displacement (mm)= ε * 10

3M – Comparison

Fastelfilm – No irradiation F force (N)= σ * 100 D displacement (mm)= ε * 10

FastelFilm - 3 10 13 - 1 10 14 F force (N)= σ * 100 D displacement (mm)= ε * 10

FastelFilm – 1 10 15 F force (N)= σ * 100 D displacement (mm)= ε * 10

FastelFilm – Comparison

Araldite – No irradiation F force (N)= σ * 100 D displacement (mm)= ε * 10

Araldite - 3 10 13 - 1 10 14 - 1 10 15 F force (N)= σ * 100 D displacement (mm)= ε * 10

Araldite – Comparison

Single Anodic bonding – Shear Test – Wafer CMI TEST 20483 Temperature: 350 °C Silicon Pyrex Na2O Si Voltage: 1000 V Cleaning only with Plasma O2 X

Single Anodic bonding – Shear Test – Wafer CMI TEST 20483