Geometric Design Rules

Slides:



Advertisements
Similar presentations
Cambridge University Engineering Department VLSI Design Third Year Standard Project - SB1 Second Mini Lecture Web page: 12th.
Advertisements

Simplified Example of a LOCOS Fabrication Process
EE141 © Digital Integrated Circuits 2nd Manufacturing 1 Digital Integrated Circuits A Design Perspective Manufacturing Process July 30, 2002.
CMOS Process at a Glance
EE143 –Ali JaveySlide 10-1 Section 10: Layout. EE143 –Ali Javey Layout Design Rules (1) Absolute-Value Design Rules * Use absolute distances (2) -based.
EE141 © Digital Integrated Circuits 2nd Manufacturing 1 CMOS Process Manufacturing Process.
Design and Implementation of VLSI Systems (EN0160) Sherief Reda Division of Engineering, Brown University Spring 2007 [sources: Weste/Addison Wesley]
Cambridge University Engineering Department VLSI Design Third Year Standard Project - SB1 Second Mini Lecture Web page: 12th.
Cmpe222_04des_rules_ppt.ppt1 VLSI Digital Systems Design Process Enhancements and Design Rules.
For the exclusive use of adopters of the book Introduction to Microelectronic Fabrication, Second Edition by Richard C. Jaeger. ISBN © 2002.
Elettronica D. AA Digital Integrated Circuits© Prentice Hall 1995 Manufacturing Process CMOS Manufacturing Process.
Design and Implementation of VLSI Systems (EN1600) lecture05 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Weste/Addison.
EE141 © Digital Integrated Circuits 2nd Manufacturing 1 Manufacturing Process I Dr. Shiyan Hu Office: EERC 518 Adapted and modified from Digital Integrated.
CMOS Process Integration ECE/ChE 4752: Microelectronics Processing Laboratory Gary S. May March 25, 2004.
Module-3 (MOS designs,Stick Diagrams,Designrules)
EE141 © Digital Integrated Circuits 2nd Manufacturing 1 Chapter 2 Manufacturing Process March 7, 2003.
Modern VLSI Design 3e: Chapter 2 Copyright  1998, 2002 Prentice Hall PTR Topics n Design rules and fabrication. n SCMOS scalable design rules. n Stick.
ECE484: Digital VLSI Design Fall 2010 Lecture: IC Manufacturing
Semiconductor Manufacturing Technology Michael Quirk & Julian Serda © October 2001 by Prentice Hall Chapter 9 IC Fabrication Process Overview.
EE141 © Digital Integrated Circuits 2nd Manufacturing 1 Manufacturing Process Dr. Shiyan Hu Office: EERC 731 Adapted and modified from Digital Integrated.
Introduction to CMOS VLSI Design CMOS Fabrication and Layout Harris, 2004 Updated by Li Chen, 2010.
Digital Integrated Circuit Design
Trace connecting two pads! More than 45 degree bends Traces too close together Rule of thumb: traces at least 40 mil apart.
EE141 © Digital Integrated Circuits 2nd Manufacturing 1 Digital Integrated Circuits A Design Perspective Manufacturing Process Jan M. Rabaey Anantha Chandrakasan.
CMOS Fabrication nMOS pMOS.
IC Fabrication/Process
Digital Integrated Circuits A Design Perspective
Purpose of design rules:
1 Overview of Fabrication Processes of MOSFETs and Layout Design Rules.
Dynamic Behavior of MOS Transistor. The Gate Capacitance t ox n + n + Cross section L Gate oxide x d x d L d Polysilicon gate Top view Gate-bulk overlap.
Norhayati Soin 05 KEEE 4425 WEEK 7/1 23/8/2005 LECTURE 9: KEEE 4425 WEEK 7 CMOS LAYOUT AND STICK DIAGRAM (Cont’d)
CMOS VLSI Fabrication.
Layout design rules. 2 Introduction  Layout rules is also referred as design rules.  It is considered as a prescription for preparing photomasks. 
Trieste, 8-10 November 1999 CMOS technology1 Design rules The limitations of the patterning process give rise to a set of mask design guidelines called.
EE141 Manufacturing 1 Chapter 2 Manufacturing Process and CMOS Circuit Layout 1 st rev. : March 7, nd rev. : April 10, 2003.
EE141 © Digital Integrated Circuits 2nd Manufacturing 1 Manufacturing Process Dr. Shiyan Hu Office: EERC 731 Adapted and modified from Digital Integrated.
Full-Custom Design ….TYWu
S.N.Bhat, Faculty, Dept. of E&C Engineering, M.I.T Manipal
IC Manufactured Done by: Engineer Ahmad Haitham.
Topics Design rules and fabrication SCMOS scalable design rules
Layout of CMOS Circuits
Subject Name: Fundamentals Of CMOS VLSI Subject Code: 10EC56
Manufacturing Process I
STICK Diagrams UNIT III : VLSI CIRCUIT DESIGN PROCESSES VLSI DESIGN
Layout and fabrication of CMOS circuits
Chapter 1 & Chapter 3.
Chapter 4 Interconnect.
Design Rule EMT 251.
VLSI Design MOSFET Scaling and CMOS Latch Up
Design Rules.
Digital Integrated Circuits A Design Perspective
CMOS Devices PN junctions and diodes NMOS and PMOS transistors
Electrical Rules Check
Chapter 10: IC Technology
Optional Reading: Pierret 4; Hu 3
Lecture #25 OUTLINE Device isolation methods Electrical contacts to Si
Introduction to Layout Inverter Layout Example Layout Design Rules
LAYOUT DESIGN RULES Bellary Engg College,Bellary, karnataka
Manufacturing Process I
VLSI Lay-out Design.
VLSI Design CMOS Layout
Click the LH mouse button to begin the animation
V.Navaneethakrishnan Dept. of ECE, CCET
Chapter 10: IC Technology
ECE 424 – Introduction to VLSI Design
Manufacturing Process I
CMOS Layers n-well process p-well process Twin-tub process.
Chapter 10: IC Technology
Presentation transcript:

Geometric Design Rules September 21 2017 Kjell Jeppson & Lena Peterson

Integrated Circuit Design Aim of the lecture To give some basic understanding of intralayer and interlayer geometric design rules Intralayer rules concerns minimum dimensions and spacing between objects in the same layer Interlayer rules concerns minimum spacing and overlap rules between objects in two different layers: MOSFET rules between poly and active Contact and via rules between contacts or vias to their bottom and top contacting layers Discuss the prelab assignment for the layout lab session 2017 Integrated Circuit Design

Integrated Circuit Design Why rules? To minimize the risk of faulty circuits after fabrication. Malfunction due to shorts Improper forming of components or contacts Electrical charging during fabrication. More complex nowadays due to: Smaller feature sizes More complex fabrication processes For example polishing for each metal layer 2017 Integrated Circuit Design

Geometric design rules Intralayer rules S extension Interlayer rules Active to poly Bottom layer extension Interlayer rules Contacts and vias Top layer extension Pitch=W+S W S pitch = width + separation 2017 Integrated Circuit Design

Geometric design rules Intralayer rules wide Metal 1 Metal 6-7 Metal 2-5 Metal 1 poly diff and parallell length >0.42 0.16 0.40 0.10 0.09 0.12 0.11 0.11 If W>0.42   0.40 0.10 0.09 0.06 0.08 2017 Integrated Circuit Design

Geometric design rules Details of active/poly rules 0.14 0.10 0.115 0.34 0.03 0.12 Min width 0.40, min space 0.41 0.13 0.15 if L>=0.09 P+ select 2017 Integrated Circuit Design

Geometric design rules Contact and via rules   0.11 0.055 0.07 0.10 No Poly_con or poly bends on active *Min metal end 0.05 2017 Integrated Circuit Design

Geometric design rules Diff_con 0.03 Poly_con 0.03 Contact and via rules For minimum width metal lines at least 0.04 enclosure is required on two opposite sides (bottom measures). 0.04 0.09 0.04 0.09 At least two 0.08 metal ends on metal pad 0.005** **Met1 0.01   Via 1-4: 0.10x0.10 Via 5-6: 0.36x0.36 0.02 0.08 At least two 0.05 metal ends on metal pad 0.005 0.05 0.005* (min 0.54 in array) 0.34 2017 Integrated Circuit Design

Geometric design rules Standard cell template with rails, n-well, pplus and nplus design rules VDD 0.36 0.16 0.11 1.10 0.16 2.6 0.16 0.78 0.36 VSS 2017 Integrated Circuit Design

Integrated Circuit Design Prelab 3 assignment Minimum metal extension beyond contact when minimum wire width is used Poly Pitch 1 p-type MOSFET n-type Poly pitch 3 Poly Pitch 2 Poly pitch 4 Min drain extension   2017 Integrated Circuit Design

Prelab 3 layout templates 2016 Integrated Circuit Design

Prelab 3 layout templates 2017 Integrated Circuit Design

Integrated Circuit Design The layers Physical layers in your layout: N-well (NW) Diffusion/Active (OD) Poly (PO) Metal-1 (M1) Contact hole (CO) Non-physical layers required in your layout: P-select (PPLUS) (pink dots) N-select (NPLUS) (yellow dots) 2017 Integrated Circuit Design

CMOS Layout Well-mask Active-mask Shallow trench Isolation (STI) in Well-mask Active-mask Shallow trench Isolation (STI) out out in VSS VDD poly-mask N+-select-mask N+-diffusion P+-select-mask P+-diffusion Body-ties Field oxide Contact-mask p-type silicon substrate p+ n+ n-well VDD-contact Contact-etch VSS-contact Metal-mask 2017 Integrated Circuit Design

Integrated Circuit Design Summary In this lecture, we have introduced intralayer and interlayer geometric design rules defined the minimum pitch: the sum of the minimum width and the minimum separation between two objects in the same layer studied interlayer rules between objects in two different layers, like MOSFET rules between poly and active contact and via rules between contacts or vias to their bottom and top contacting layers discussed the prelab assignment to the layout lab session 2017 Integrated Circuit Design