V80 Camera Test & Troubleshooting Training Budi Juswardy Singapore Design Centre - MIC Level 3 Personal Communication Sector, Motorola DID:        (65) 6486-2761 Fax:         (65) 6482-3841 E-mail:     budijus@motorola.com Budi Juswardy April 2004

V80 Camera Test Budi Juswardy April 2004

V80 Camera Test for High Volume Mass Production DLI TEST Data Line Integrity Test (DLI) To verify none of the parallel camera data bus lines are stuck high or low To verify none of the parallel camera data bus lines are shorted together Blemish, Noise Line Test Blemish Test: Used to detect foreign material or defective pixels Noise Line Test: Used to detect whether there is noise/ lines in the image produced by the camera sensor Budi Juswardy April 2004

Implemented by combinational logic circuitry in some imager modules V80 Camera Test DLI Test This built-in test pattern is generated by a “sum of coordinates” algorithm Implemented by combinational logic circuitry in some imager modules DLI Test Algorithm: Monitor parallel camera data bus values from test image Verify each data bit is low at some point Verify each data bit is high at some point Verify every possible data bit pair (D0:D1, D0:D2, etc.) is different (one high & one low) at some point Verify every possible data bit pair (D0:D1, D0:D2, etc.) is not the same during the data analysis for not longer than 90% of the analyzed data. (% can be set) Budi Juswardy April 2004

Test will generate a file with the test result/ information V80 Camera Test DLI Test Test will generate a file with the test result/ information The format: Pass: 00; Fail: 01 Matrix: will compare one line to another line High Line: will pull the line all to high, if pass will show FF, otherwise it will indicate where the line shorted to ground Low Line: will pull the line all to low, if pass, will show FF, otherwise it will indicated where the line is shorted to Vcc xx/xx/xx/xx Low Line High Line Matrix PASS/ FAIL Budi Juswardy April 2004

V80 Camera Test DLI Test Test Algorithm Detail for 8-bit Bus Verify each of the following conditions pass for an overall pass (success) test result D0 = low D1 = low D2 = low D3 = low D4 = low D5 = low D6 = low D7 = low xx/xx/xx/xx D0 = high D1 = high D2 = high D3 = high D4 = high D5 = high D6 = high D7 = high Low Line High Line Matrix (00)PASS (01)FAIL D2 <> D3 D2 <> D4 D2 <> D5 D2 <> D6 D2 <> D7 D3 <> D4 D3 <> D5 D3 <> D6 D3 <> D7 D4 <> D5 D4 <> D6 D4 <> D7 D5 <> D6 D5 <> D7 D6 <> D7 D0 <> D1 D0 <> D2 D0 <> D3 D0 <> D4 D0 <> D5 D0 <> D6 D0 <> D7 D1 <> D2 D1 <> D3 D1 <> D4 D1 <> D5 D1 <> D6 D1 <> D7 Budi Juswardy April 2004

E.g.: 00/FF/FF/FF: all pass 01/CF/FF/FF: matrix failed V80 Camera Test DLI Test E.g.: 00/FF/FF/FF: all pass 01/CF/FF/FF: matrix failed CF = 1D71D60D50D4 1D31D21D11D0  D4=D5 (shorted) 01/FF/F8/FF: high line failed F8 = 1D71D61D51D4 1D30D20D10D0  D2=D1=D0 (shorted to gnd) 01/FF/FF/3D: low line failed 3D = 0D70D61D51D4 1D31D20D11D0  D7=D6=D1 (shorted to Vcc) Budi Juswardy April 2004

V80 Camera Test Blemish & Noise Test Blemish Test Used to detect foreign material or defective pixels Due to lens defect/ deformation, dust particle on lens or the sensor pixel damaged (or could be due to the lens cover not removed). Noise Line Test Used to detect Horizontal Lines in the image Horizontal Lines are caused by noisy analog supply line; OR Camera sensor lens defect. Budi Juswardy April 2004

V80 Camera Test Blemish & Noise Test Requirements for Blemish test: NO blemishes of any size (0x0) is allowed in Region 1 (R1) Not more than 1 of small blemish (1x2) or large blemish (2x3) is allowed in Region 2 (R2) Fail if the blemish size is larger than (1x2) size Requirement for Noise Line test: No horizontal line noticeable or detectable in the camera viewfinder Budi Juswardy April 2004

V80 Camera Test Blemish & Noise Test Budi Juswardy April 2004

V80 Camera Test Blemish & Noise Test Only one 1x1 in region 2: PASS Lots of blemishes in region 1: FAILED One large 5x3 in region 2: FAILED Only one 3x1 in region 2: PASS Budi Juswardy April 2004

V80 Camera Test Blemish & Noise Test Only one 1x1 in region 2: PASS One large 3x3 in region 2: FAILED Horizontal Lines Budi Juswardy April 2004

V80 Camera Test Blemish & Noise Test Test Setup Ambient fluorescent lighting sources Test Chart at 18 to 25 cm distance Fixture with open nest to locate and align the UUT UUT (V80 Phone with camera facing test chart) CE-Bus to PC 1 2 3 4 5 Side View Of the Test Fixture Test Station PC Test Flow UUT powers up, enumerates, and is suspended. Camera viewfinder opened (TST_CAMERA). Test chart image captured (TST_CAMERA). Test command (TST_CAMERA, parameter 0x06) initiates the Data Line Integrity test. UUT returns Success or Failure response to Test Station PC. Budi Juswardy April 2004

Camera Test Chart Data Line Integrity Area (+10%) Blemish & Noise Test Budi Juswardy April 2004

V80 Camera Troubleshooting Budi Juswardy April 2004

V80 Camera Block Diagram Cover Lens Image Sensor VGA Radio board Flash ATI 2250 Graphics Accelerator Baseband Processor Serial VGA LCD Display Control Lines Data Lines Image Sensor Lens Cover Flash USB Test Station PC via CE Bus JPEG Encode Only C-Flex Front Housing Blade Radio board PCB Budi Juswardy April 2004

What to check when camera test fail at this point. Camera Test Sequence What to check when camera test fail at this point. ENTRY HD2 entry_handler_atlas_CIT_camera GCI1STAT get_command_interface Check the CE Bus connector SUS1STAT suspend_1 Reconnect the CE Bus connector * backlight_light CAM_EDLI DLI Make sure DLI pattern is only 10% on the viewfinder Check and make sure camera alignment ok DELAY104 Delay1_3_secs CAM_SDLI DLI Check the generated error file (slide 5) * camera_capture_VGA_DLI ECMSTAT External_camera_image_transfer_status CAM_BLS1 small_blemish_region_1 Check the Blemish image at region 1 (slide 9) CAM_BLL1 large_blemish_region_1 Check the Blemish image at region 1 (slide 9) CAM_BLS2 small_blemish_region_2 Check the Blemish image at region 2 (slide 9) CAM_BLL2 large_blemish_region_2 Check the Blemish image at region 2 (slide 9) CAMBLSTAT Blemish Test Status FAIL this section if any of CAM_BL* test fail Remove the lens cover No dust/ foreign particle or scratch at the lens CAMNUMNL Camera_no_of_noise_lines Check the Noise Line image (NL) (slide 12) CAMNLSTA NL_test_status FAIL this section if there is Noise Line detected Not available Not available because log result was not called display in PC. TOF_CMDI Turn_off Do not disconnect the USB cable from CE Bus until the test is completed Budi Juswardy April 2004

Fail DLI Test? 1. Open the backhousing, and check/ make sure the pin-to-pin connector of camera to the PCB Board is attached properly. RETEST. 2. Replace the camera sensor. RETEST. Suspect it is either: a. The B2B pin camera connector problems (see under microscope), b. The camera flex problem or c. The image sensor problem. 3. Replace the PCB Board. RETEST. Suspect it is: a. B2B of the PCB board to camera is shorted or open circuited b. B2B of the PCB board to C-flex is shorted/ open. If problem still exist after 3. : 4. Replace the blade. RETEST. a. C-flex (B2B connector o/c)/ flex open/ shorted or b. LCD issue (ATI) BGA crack, LCD B2B connector o/c/ LCD flex open/ shorted Budi Juswardy April 2004

Fail Blemish Test? 1. Check whether protective plastic for the cover lens has been removed. 2. Visually check whether the cover lens has foreign material on it. 3. Check whether the camera/ image sensor lens is clean/ clear from dust. 4. Open the backhousing, and check/ make sure the pin-to-pin connector of camera to the PCB Board is attached properly 5. Visually check the automated test result/ image generated by the camera Any blemish on region 1? Any blemish more than one (1) of the size 2x3 pixel or bigger on region 2? Camera sensor/ image sensor lens defect Save the image file with a unique file name for engineering analysis. Budi Juswardy April 2004