Ivan Perić University of Heidelberg Germany

Slides:



Advertisements
Similar presentations
Reunion de groupe 29 oct. 2002G. Bernardi, LPNHE- Paris Reunion D0 Paris Programme de travail pour Calib On-line Prochaines etapes des etudes sur le bruit.
Advertisements

MB Page1Mihai Banu, July 2002 WCR #7 Nyquist rate ADC Main design motivation: Low Power Features: Pipeline arquitecture. Two interleaved ADCs with shared.
18/05/2015 Calice meeting Prague Status Report on ADC LPC ILC Group.
Current-Mode Multi-Channel Integrating ADC Electrical Engineering and Computer Science Advisor: Dr. Benjamin J. Blalock Neena Nambiar 16 st April 2009.
CHL -2 Level 1 Trigger System Fully Pipelined Custom ElectronicsDigitization Drift Chamber Pre-amp The GlueX experiment will utilize fully pipelined front.
ACES Workshop 3-4 March, 2009 W. Dabrowski Serial power circuitry in the ABC-Next and FE-I4 chips W. Dabrowski Faculty of Physics and Applied Computer.
L.Royer– Calice DESY – July 2010 Laurent ROYER, Samuel MANEN, Pascal GAY LPC Clermont-Ferrand R&D LPC Clermont-Fd dedicated to the.
DEPFET Electronics Ivan Peric, Mannheim University.
2. Super KEKB Meeting, DEPFET Electronics DEPFET Readout and Control Electronics Ivan Peric, Peter Fischer, Christian Kreidl Heidelberg University.
Phase-1 Design. i PHC Phase /04/2008 System Overview Clock, JTAG, sync marker and power supply connections Digital output.
1 CPC2-CPR2 Assemblies Testing Status Tim Woolliscroft.
P. Baron CEA IRFU/SEDI/LDEFACTAR Meeting Santiago de Compostela March 11, A review of AFTER+ chip Its expected requirements At this time, AFTER+
Alexei SemenovGeneric Digitizer Generic Digitizer 10MHZ 16 bit 6U VME Board.
1 Status Report on ADC LPC Clermont-Ferrand Laurent ROYER, Samuel MANEN.
L.Royer – Calice Manchester – Sept A 12-bit cyclic ADC dedicated to the VFE electronics of Si-W Ecal Laurent ROYER, Samuel MANEN LPC Clermont-Ferrand.
Analog to Digital Converters
RD53 Analog IP blocks WG : developments and plans at CPPM M. Barbero, L. Gallin Martel (LPSC), Dzahini (LPSC), D. Fougeron, R. Gaglione (LAPP), F. Gensolen,
BeamCal Electronics Status FCAL Collaboration Meeting LAL-Orsay, October 5 th, 2007 Gunther Haller, Dietrich Freytag, Martin Breidenbach and Angel Abusleme.
LC Power Distribution & Pulsing Workshop, May 2011 Super-ALTRO Demonstrator Test Results LC Power Distribution & Pulsing Workshop, May nd November.
Low Power, High-Throughput AD Converters
SKIROC ADC measurements and cyclic ADC LPC Clermont-Ferrand Laurent ROYER, Samuel MANEN Calice/Eudet electronic meeting Orsay June.
S. Bota – Calorimeter Electronics overview - July 2002 Status of SPD electronics Very Front End Review of ASIC runs What’s new: RUN 4 and 5 Next Actions.
M. TWEPP071 MAPS read-out electronics for Vertex Detectors (ILC) A low power and low signal 4 bit 50 MS/s double sampling pipelined ADC M.
1 DEPFET Readout Electronics Ivan Peric, Jochen Kinzel, Christian Kreidl, Peter Fischer University of Heidelberg.
KIT – Universität des Landes Baden-Württemberg und nationales Forschungszentrum in der Helmholtz-Gemeinschaft Status of ASICs.
19th Intl. Workshop on DEPFET Detectors and Applications, Seeon, May, 2015 DCD submission plan Changes in design (present status): Change sampling of TDI.
H. Krüger, , DEPFET Workshop, Heidelberg1 System and DHP Development Module overview Data rates DHP function blocks Module layout Ideas & open questions.
Low Power, High-Throughput AD Converters
Data Handling Processor v0.1 Preliminary Test Results - August 2010 Tomasz Hemperek.
EE140 Final Project Members: Jason Su Roberto Bandeira Wenpeng Wang.
ASIC Review DCD. ASIC Review DCD is implemented in UMC 0.18 um CMOS technology 3.2mm x 5mm DCD-B uses bump bonding on the UMC technology.
13 th International Workshop on DEPFET Detectors and Applications, Ringberg, June 2013, Ivan Peric 1 New DCD Chips Ivan Perić.
1 Status Report on ADC LPC Clermont-Ferrand Laurent ROYER, Samuel MANEN Calice/Eudet electronic meeting London 2008.
SKIROC status Calice meeting – Kobe – 10/05/2007.
1 Run on 25. October. 2 Full-size DCD Price: at least 32 k€ Return: April 201  Less test possibilities Full-size chip Wire-bondable DCD Price: 6.75 k€
ASICs1 Drain Current Digitizer Chip (DCD) Status and Future Plans.
1 DCD Gain and Pedestal Spread
Status of DHP prototypes
Ivan Perić University of Heidelberg Germany
DCD submission plan Changes in design (present status):
Latest results of EMCM tests / measurements
A 12-bit low-power ADC for SKIROC
VMM3 Early Testing George Iakovidis, V. Polychronakos
B.Sc. Thesis by Çağrı Gürleyük
Data Handling Processor v0.1 First Test Results
DCD – Measurements and Plans
Jan Soldat, Heidelberg University for the DSSC ASIC design groups
High speed pipelined ADC + Multiplexer for CALICE
Functional diagram of the ASD
Analog Readout Chips – the Status
High speed 12 bits Pipelined ADC proposal for the Ecal
96-channel, 10-bit, 20 MSPS ADC board with Gb Ethernet optical output
New low-power DCD chip - DCDC
R&D activity dedicated to the VFE of the Si-W Ecal
Hugo França-Santos - CERN
Ongoing R&D in Orsay/Saclay on ps time measurement: a USB-powered 2-channel 3.2GS/s 12-bit digitizer D.Breton (LAL Orsay), E.Delagnes (CEA/IRFU) Séminaire.
DCD waveform measurements DHE DAC & DCD ADC gain
CALICE COLLABORATION LPC Clermont LAL Orsay Samuel MANEN Julien FLEURY
A First Look J. Pilcher 12-Mar-2004
EUDET – LPC- Clermont VFE Electronics
Created by Luis Chioye Presented by Cynthia Sosa
1 Gbit/s Serial Link 1 Gbit/s Data Link Using Multi Level Signalling
Choix d’une architecture de CAN adaptée au MAPS
BESIII EMC electronics
SKIROC status Calice meeting – Kobe – 10/05/2007.
Functional diagram of the ASD
Presented by T. Suomijärvi
Verify chip performance
Front-end Digitization for fast Imagers.
Phase Frequency Detector &
Presentation transcript:

Ivan Perić University of Heidelberg Germany DCD4_Pipeline Ivan Perić University of Heidelberg Germany

DCDB4_Pipeline Features: Pipeline ADC (designed sampling rate ~ 50ns) New digital block (designed for up to 640MHz, low power serializers) Analog common mode correction (can be switched) Temperature stabile reference High precision calibration DAC The measurement results on single chips are good

DCDBPip TIA ADC 200 µm 5 mm

Pipelined vs. Cyclic ADC Algorithm: Copy here copy there Compare with threshold add reference Subtract two outputs (duplicate) Pipeline ADC Memory cell ADC1 ADC2 MSB cell LSB cells 1 1 1 2 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 Hi Lo Cyclic ADC approach - Algorithm performed cyclically (ping pong wise) by two memory cell pairs - Two ADCs per channel - 200ns sampling rate/ADC - ADC clocked with 100MHz - Pipeline ADC approach - Algorithm performed as in production line by 8 memory cell pairs - One ADC per channel - 100ns sampling rate when clocked with 50MHz - Designed for 50 ns sampling rate

DCDB4_Pipeline Measurement results on 4.1. module 3 Columns are measured 6 and 7 are ok 1 – LSB does not work (wire bond problem) Column 2 – one of the significant bits does not work (wire bond problem)

DCDB4_Pipeline at 320MHz – new settings Measurements done at 320MHz Settings: On the generators: VDDA: 2.15V (364mA) GNDA: 0V VDDD: 2.0V (176mA) GNDD: 0V AMPLOW: 1.7V (247mA) REFIN: 1.05V (50mA) Measured on sense lines: VDDA: 1.86V GNDA: 0.14V VDDD: 1.864V GNDD: 0.077V AMPLOW: 0.485V REFIN: 1.0 Power consumption ~ 1.33mW Bias currents for DCDRO: 0.28mA (LVDSin) and 5.45mA (LVDSout)

Test all ADCs – fit (-100 to 125) …

Test all ADCs – fit (-100 to 125) … ADC gain 72nA/LSB (~110e @ gq 650pA/e) Noise: ~0.55LSB (60e @ gq 650pA/e) 220e 275e

Test one ADC – fit (-100 to 125) …

DCDB4_Pipeline at 320MHz VDDA varied +/- 50mV and AMPLOW +/- 50mA No influence on the chip

DCDB4_Pipeline 3 out of four columns tested Noise ~40nA@320MHz A few channels sensitive – they show missing codes around values -64 or 64 The problem is old, it exists since DCD1, now it has been understood – poor matching of transistors, the fix is to increase the setting VPSuorce with respect to VPFB and VPSource2 (good values for Sc., FB, Sc2.: 80, 70, 70) VDDA, AMPLOW do not influence the behavior significantly REFIN should be correct within +/- 50mV Analog CMC tested and works Band-Gap reference works Current consumption at 320MHz: VDDA: 364mA+AMPLOW (DCDB3 286mA+AMPLOW) (change +78mA) AMPLOW: 247mA (DCDB3 182 mA) (change +65mA) VDDD: 176mA (DCDB3 268mA) (change -92mA) Total change: +51mA DCDB4 tested even at 500MHz clock rate (64ns sampling time) and works