30-Nov-2006 Jean-Marc Defise - CSL jmdefise@ulg.ac.be SWAP Calibration 30-Nov-2006 Jean-Marc Defise - CSL jmdefise@ulg.ac.be SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 Calibration Image quality Overall throughput Pixel-to-pixel non-uniformities (flatfield, vignetting) Noise (electronic & straylight) Instrument design Component procurement Mirrors integration Flight unit Theoretical response Update instr. baseline Compon. Characteriz° Mirror WFE Sensor throughput+FF Filters EUV l Telescope quality Real WFE Vignetting (baffles) VIS l End-to-end tests Throughput Flatfield Vignetting Straylight Noise VIS l EUV l SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP OPTICAL ELEMENTS Mirrors + EUV coatings figuring reflectivity EUV filters throughput light leaks optical impact (grid) Sensor + scintillator coating flatfield noise “NON” OPTICAL ELEMENTS Baffles vignetting Electronics digitization noise compression Thermal status Image quality SCSL Meeting – ISSI, 29-30 Nov 2006

Component calibration See previous SCSL meeting SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Filters 2 possibilities (Luxel): Al filters (150 nm) + grid mesh (80 to 83 %) optical impact, but high throughput better mechanical resistance Al filters (150 nm) + polyimid (70 nm) lower EUV transmission FOCAL FILTER ENTRANCE FILTER SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Filters Grid filters SEM picture SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Filters Grid filters – diffraction (entrance filter) SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Filters Grid filters – shadowing (focal plane filter) SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Filters Polyimid filters (entrance filter) SEM pictures SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP: System Response updated with filter selection CMOS HAS + Scintillator Prox Eln QS: 182 ph/s/px Update: QS: 335 ph/s/px AR: 2686 ph/s/px Update: AR: 4842 ph/s/px QS: 6 DN/s/px Update: QS: 11 DN/s/px AR: 89 DN/s/px AR: 159 DN/s/px - worst case assumption, EOL with HAS @ 0°C - new noise figures to be measured with real FM electronics SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 Image Quality Confirmed only by interferometric measurement at 633nm No possibility for direct measurement in EUV (need EUV collimator, diffraction is dominating in VIS) WFE maps at 633 nm can provide estimate for PSF at 17.4 nm – BUT without scattering Scattering could be evaluated with PTB nearly-collimated beam (?) SCSL Meeting – ISSI, 29-30 Nov 2006

Calibration during TV @ CSL Real thermal environment with all flight electronics (IIU, PE) but MCPM Noise evaluation (dark images) at OP temperature Cal. diodes reference images at OP temperature 2 diodes can illuminate directly the CMOS l = 570 nm Will fly in SWAP FM unit SCSL Meeting – ISSI, 29-30 Nov 2006

End-to-end calibration Planned at PTB in Jan’07 (week #3) Spectral scan FoV scan (throughput + possibly EUV flat field) Out-of-FoV scan (offpointings) SCSL Meeting – ISSI, 29-30 Nov 2006

PTB Beam Characteristics 1010photons/sec at 17 nm. Can easily be adjusted for smaller intensities. Shape of the beam: 1 x 1 mm² can be decreased to 0.5 x 0.5 mm² larger beam can be available, but homogeneity decreases divergence ~6.8 arcmin (130 pixels spot diam in SWAP focal plane) Spectral purity depends on the flux intensity, hence on the limiting slot, which will be adjusted before the instrument calibration, and before off-axis measurements SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Chamber @ PTB SWAP FM unit on a goniometer mount + translation stage beam position will be adjusted FoV scan out-of-FoV scan EUV Beam SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Calibration @ PTB SWAP FM will be in the chamber with the IIU FM A cooling system will be connected to the radiator mount, nominal -20°C but will be -40°C for out of FoV scans FoV Scan => mosaic 3 x 3 or more if achievable. This should provide some data for flat field. Out of FoV scan => straylight check for offpointings (need high detectivity, -40°C) SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Calibration @ PTB Pupil FoV scan with the 1 mm² beam (vignetting verification) Spectral scan from 16.5 to 20.0 nm SCSL Meeting – ISSI, 29-30 Nov 2006

SCSL Meeting – ISSI, 29-30 Nov 2006 SWAP Calibration @ PTB Open point: FM front filter during PTB calibration ? risky (pressure sensitive, contamination sensitive) in any case, focal filter will be present any possibility to calibrate it separately ? use a spare filter @ PTB ? SCSL Meeting – ISSI, 29-30 Nov 2006

SWAP in-orbit calibration SWAP diodes (VIS only) LYRA Flatfield with offpointing manoeuvers ? Intercalibration with other instruments ? EIT, SDO, STEREO ? SCSL Meeting – ISSI, 29-30 Nov 2006