From: Optimal Test Selection for Prediction Uncertainty Reduction Date of download: 10/31/2017 Copyright © ASME. All rights reserved. From: Optimal Test Selection for Prediction Uncertainty Reduction J. Verif. Valid. Uncert. 2016;1(4):041002-041002-10. doi:10.1115/1.4035204 Figure Legend: Student's t-distribution of the mean observation for sparse observation sets
From: Optimal Test Selection for Prediction Uncertainty Reduction Date of download: 10/31/2017 Copyright © ASME. All rights reserved. From: Optimal Test Selection for Prediction Uncertainty Reduction J. Verif. Valid. Uncert. 2016;1(4):041002-041002-10. doi:10.1115/1.4035204 Figure Legend: Variance in model reliability for replicate validation data sets at the same input: (a) one observation, (b) 10 observations, (c) 100 observations, (d) 1000 observations, (e) 10,000 observations, and (f) 100,000 observations
From: Optimal Test Selection for Prediction Uncertainty Reduction Date of download: 10/31/2017 Copyright © ASME. All rights reserved. From: Optimal Test Selection for Prediction Uncertainty Reduction J. Verif. Valid. Uncert. 2016;1(4):041002-041002-10. doi:10.1115/1.4035204 Figure Legend: RF MEMS switch
From: Optimal Test Selection for Prediction Uncertainty Reduction Date of download: 10/31/2017 Copyright © ASME. All rights reserved. From: Optimal Test Selection for Prediction Uncertainty Reduction J. Verif. Valid. Uncert. 2016;1(4):041002-041002-10. doi:10.1115/1.4035204 Figure Legend: Known aleatory distributions of h for the six devices
From: Optimal Test Selection for Prediction Uncertainty Reduction Date of download: 10/31/2017 Copyright © ASME. All rights reserved. From: Optimal Test Selection for Prediction Uncertainty Reduction J. Verif. Valid. Uncert. 2016;1(4):041002-041002-10. doi:10.1115/1.4035204 Figure Legend: Parameter uncertainty for a particular data realization: (a) sample calibration of E and (b) distribution of the overall model reliability
From: Optimal Test Selection for Prediction Uncertainty Reduction Date of download: 10/31/2017 Copyright © ASME. All rights reserved. From: Optimal Test Selection for Prediction Uncertainty Reduction J. Verif. Valid. Uncert. 2016;1(4):041002-041002-10. doi:10.1115/1.4035204 Figure Legend: Family of predictions for a particular data realization d: (a) sample PDF family and (b) sample CDF family