6th WorldFIP Insourcing Meeting Progress Report Eva. Gousiou BE/CO-HT & the nanoFIP team nan FIP

Outline Main Design updates Results of the Preliminary Radiation Tests Example application: nanoFIPDIAG Next Steps

Outline Main Design updates Results of the Preliminary Radiation Tests Example application: nanoFIPDIAG Next Steps

Main Design Updates Added Power On Reset input pin Updated turnaround times based on measurements on microFIP chips configured with the fastest settings Removed “Read” access rights from the Produced memory Synthesis with Precision Rad-Tol : Localized TMR and Fail-safe state machines

Main Design Updates nan FIP Completed validation with independent Simulation Test Bench by G.Penacoba (TE/CRG) nan FIP Millions of cycles exhaustive testing with J. Palluel’s (BE/ CO) software V2 testing board including the project’s extension with JTAG Currently 19 V2 agents running continuously in our lab Extensive 5-days code review in Jan 2011 by 5 designer experts from 2 different groups (http://www.ohwr.org/projects/cern-fip/repository/show/trunk/hdl/design/CodeReview_24Jan11)

Outline Main Design updates Results of the Preliminary Radiation Tests Example application: nanoFIPDIAG Next Steps

Radiation Testing Campaigns Preliminary test : 2 prototype boards after 2 weeks of dry run tests on April 15th 1 Mbps: 2 boards 5ms & 500ms macrocycle Massive tests: 10 boards after 1 month of dry run tests May-June 31.5 Kbps : 2 boards 5ms & 500ms macrocycle 1 Mbps : 3 boards 2.5 Mbps : 5 boards Extra tests: Irradiation of the nanoFIP, FIELDRIVE & the FIELDTR; Study of the effects of high temperature while irradiating

nanoFIP Preliminary Radiation Tests at PSI Test Setup user nanoFIP WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

nanoFIP Preliminary Radiation Tests at PSI Test Setup Control Room user nanoFIP WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

nanoFIP Preliminary Radiation Tests at PSI Test Setup Control Room 9V 50m nanoFIP user WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

nanoFIP Preliminary Radiation Tests at PSI Test Setup Control Room RS 232 50m 9V 50m nanoFIP user WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

nanoFIP Preliminary Radiation Tests at PSI Test Setup 2 nanoFIP chips at 1 Mbps bit rate irradiated Use of the entire Produced and Consumed memory of nanoFIP 5ms and 500ms macrocycles PSI facility 230 MeV p+ beam nanoFIP p+ beam p+ beam

nanoFIP Preliminary Radiation Tests at PSI Test Results Correct frames exchange until ~400 Gy; no SEE At ~400 Gy no frame was being received by the Master; chips not responding Soft reset / power cycle not able to recover the functionality JTAG scan chain giving errors Several hours later the chips were fully functional “The instabilities were always accompanied by an increase of the current in the FPGA core from 1 to 33 mA.” Radiation-Tolerant ProASIC3 FPGAs Radiation Effects ACTEL report

FIELDRIVE Preliminary Radiation Tests at PSI Test Setup Control Room RS 232 <50m 9V <50m nanoFIP user WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

FIELDRIVE Preliminary Radiation Tests at PSI Test Results 1 set of FIELDRIVE/ FIELDTR at 1 Mbps bit rate 5 ms macrocycle Testing stopped at 400 Gy due to beam time expiration No error appeared throughout the testing 10 % current consumption increase

Outline Design updates Results of the Preliminary Radiation Tests Example application: nanoFIPDIAG Next Steps

Example application: nanoFIPDIAG FIPDIAG: electronics module used for fieldbus diagnostic purposes Test version: Use of the nanoFIP testing board with some extra cabling Configuration: stand-alone mode, 1 Mbps bit rate No software changes needed Tests running successfully in the same segment with cryo agents Official version: assigned to HLP; First modules expected Q3 2011

Outline Design updates Results of the Preliminary Radiation Tests Example application: nanoFIPDIAG Next Steps

Next Steps Support to your designs! Final firmware code review next week; Code “freezing” “Massive” and “Extra” radiation tests Support to your designs!

6th WorldFIP Insourcing Meeting Extras

nanoFIP Radiation Tests at PSI user nanoFIP WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

nanoFIP Radiation Tests at PSI user nanoFIP Cons WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

nanoFIP Radiation Tests at PSI user nanoFIP Prod Cons WorldFIP Master Field TR Fiel drive WorldFIP FIELDBUS

Irradiation of 10 devices Target Cross Section LHC 5000 nanoFIPs in the LHC < 10 SEE / year σ nanoFIP < 1e-13 cm2 PSI facility, p+ 250MeV 2e9 p+/cm2/ Gy Irradiation of 10 devices 300 Gy lifetime of an Actel ProASIC3 device