IEEE SCC20 Standards Status Standards Coordinating Committee 20 SCC20 IEEE SCC20 Standards Status Prepared for Computer Society Standards Activities Board November 17, 2010 Dr. John W. Sheppard CS SAB Liaison to SCC20

Introduction IEEE Standards Coordinating Committee 20 (SCC20) - Test and Diagnosis for Electronic Systems The IEEE SCC20 Mission: “Provides for the management, development, and maintenance of language and interface standards supporting system-level (onboard and offboard) automatic test and diagnosis. These standards include (but are not limited to) test requirements, test programs, test procedures, diagnostic knowledge, maintenance information, and major hardware subsystem interfaces between and within Automatic Test Systems.”

10 are IEEE Full-Use Standards 8 are IEEE Trial-Use Standards Introduction (cont) SCC20 is a: Individual based IEEE Type 2 Standards Coordinating Committee (SCC) SCC20 is presently developing and/or maintaining a total of 22 IEEE Standards 10 are IEEE Full-Use Standards 8 are IEEE Trial-Use Standards 4 are IEEE Users Guides

Receiver Fixture Interface(RFI) Series of Standards: IEEE-1505 Std Number Status Receiver Fixture Interface (RFI) IEEE Std 1505-2010 * Full Use Standard Common Test Interface Pin Map IEEE Std 1505.1-2008 Trial Use Standard XML schema for IEEE-1505.1 IEEE P1505.1.1 In Development IEEE Std 1505-2010 The Revision to IEEE Std 1505-2006 was approved by the IEEE Standards Board September 30, 2010 Publication Date for IEEE Std 1505-2010 is scheduled for Mid-December 2010

Artificial Intelligence - Exchange Services Tie to All Test Environments (AI-ESTATE) Series of Standards: IEEE-1232 Standard Std Number Status AI-ESTATE * IEEE Std 1232-2002 & IEC-62243 Full Use Standard AI-ESTATE Users Guide IEEE P1232.3 In Development IEEE P1232 The Revision to IEEE Std 1232-2002 has just completed the IEEE Ballot Process. It has been submitted to the IEEE Standards Board for consideration during the December Standards Board Meeting Series Once Approved by the IEEE, the revised Standard will most likely be sent through IEC TC93 WG 7 for consideration/publication

Software Interface to Maintenance Information Collection and Analysis (SIMICA) Series of Standards: IEEE-1636 Standard Std Number Status SIMICA IEEE Std 1636-2008 Trial Use Standard SIMICA: Test Results and Session Information IEEE Std 1636.1-2007 SIMICA: Maintenance Action Information IEEE Std 1636.2-2010 SIMICA: Common IEEE P1636.99 In Development IEEE Std 1636.2-2010 was approved by the IEEE Standards Board September 30, 2010 Publication Date for IEEE Std 1636.2-2010 is scheduled for November 24, 2010

Digital Test Interchange Format (DTIF) IEEE-1445 & IEEE 1546 Standard Std Number Status DTIF IEEE Std 1445-1998 (R2009) Full Use Standard DTIF Users Guide IEEE Std 1546-2000 (R2006) Users Guide Note: (R2009) and (R2006) indicate the year of Re-affirmation ballot(s)

Standard Test Description (STD) Series of Standards: IEEE-1641 Std Number Status STD IEEE Std 1641-2010 * Full Use Standard STD Users Guide IEEE 1641.1-2006 Users Guide IEEE Std 1641-2010 Revision to IEEE Std 1641-2006 IEEE Std 1641-2006 was published as IEC 62529 IEEE Std 1641-2010 was published by the IEEE on September 17, 2010

Common/Abbreviated Test Language for All Systems (C/ATLAS) IEEE-716 & IEEE 771 Standard Std Number Status C/ATLAS IEEE Std 716-1995 (R2006) Full Use Standard ATLAS Users Guide IEEE Std 771-1998 (R2009) Users Guide Note: (R2009) and (R2006) indicate the year of Re-affirmation ballot(s) These will most likely become Stabilized Standards within the IEEE process

Automatic Test Equipment Markup Language (ATML) Series of Standards: IEEE-1671 Std Number Status ATML: Overview and Architecture IEEE Std 1671-2010 * Full Use Standard ATML: Test Description IEEE Std 1671.1-2009 Trial Use Standard ATML: Instrument Description IEEE Std 1671.2-2008 ATML: UUT Description IEEE Std 1671.3-2007 ATML: Test Configuration IEEE Std 1671.4-2007 ATML: Test Adapter IEEE Std 1671.5-2008 ATML: Test Station IEEE Std 1671.6-2008 See next slide

Automatic Test Equipment Markup Language (ATML) Series of Standards: IEEE-1671 (cont) IEEE Std 1671-2010 The Revision to IEEE Std 1671-2006 was approved by the IEEE Standards Board September 30, 2010 Publication Date for IEEE Std 1671-2010 is scheduled for December 14, 2010 IEEE Std’s 1671.1 through 1671.6 Each of the six standards have active IEEE PARs for the revision of each of the standards