IEEE 1450 Working Group - A Status Report - Name: Tony Taylor Title: Co-Chairman

STIL: Conception Dec 1994: first ad-hoc meeting called to create the Tools<>Testers Interface consortium, with the identified goals: to address the “megabyte problem” of transporting test vectors from CAD to ATE intended to be a Test format to provide a solution quickly EDA vendors customers ATE vendors

STIL: Delivery June 1996 October 1997 March 1999 Aug 1999: IEEE accepted the Project Authorization Request (PAR) P1450 October 1997 First IEEE ballot returns March 1999 P1450 Approved as IEEE Std 1450-1999 Aug 1999: IEEE Std 1450 in print

STIL Resources – available on web Clarifications document to 1450-1999 Recommended usage document to 1450-1999 Basic lex/yacc parsing rules for STIL Source code for STIL examples in 1450-1999 Web http://grouper.ieee.org/groups/1450/index.html Mail reflector stds-1450@majordomo.ieee.org

STIL working group - how to participate Bi-weekly conference calls Informal draft review Formal IEEE ballot IEEE is an open process All information about our work is available on the IEEE web site

STIL Overview Definition of terms: STIL = Standard Test Interface Language CTL = Core Test Language TRC = Test Resource Constraints Set of standards IEEE Std. 1450-1999 = Basic STIL p1450.1 = Design extension to STIL (90% complete) p1450.2 = DC Level extension to STIL (Ballot complete) p1450.3 = Tester Targeting (75% complete) p1450.4 = Flow extension to STIL (re-activated) p1450.5 = Test Method extension to STIL (not started) p1450.6 = Core Test Language extension to STIL (90% complete) p1500 = Core Test Hardware Definition (75% complete)

STIL Standards 1450-1999 P1450.2 Published P1450.1 P1450.6 In Ballot In Definition P1450.5 …Pending

STIL Partitioning - Test Reqs UserKeywords & Functions Unused Possibly used Need to support Pragma Signals SignalGroups Spec Selector ScanStructures BistStructures CoreType CoreInstance CellGroups Environment Timing DCLevels DCSets DCSequence PatternBurst PatternExec Procedures MacroDefs Pattern test 1 2 3 6

STIL Partitioning – ATPG Tool UserKeywords & Functions Unused Possibly used Need to support Pragma Signals Single global SignalGroups Spec Selector Single global ScanStructures BistStructures CoreType CoreInstance CellGroups Environment Single global, constant times Timing DCLevels DCSets DCSequence Single named, single pattern ref PatternBurst Single global, single Timing and PatternBurst ref PatternExec Single global, possibly multiple Shifts Procedures Single global MacroDefs Single named, C{},V{}, W{}, Macro&Proc calls Pattern test atpg 1 2 3 6

STIL Partitioning - Core Test UserKeywords & Functions Unused Possibly used Need to support Pragma Signals Multiple named SignalGroups Spec Selector Multiple named ScanStructures BistStructures CoreType CoreInstance CellGroups Environment Multiple named, constant times Timing DCLevels DCSets DCSequence Multiple named, multiple & parallel pat ref PatternBurst Possibly Multiple PatternExec Multiple named Procedures MacroDefs Multiple named Pattern Multiple named, Macro&Proc calls test atpg ctl 1 2 3 6