Detectors sub-system for QUBIC

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Presentation transcript:

Detectors sub-system for QUBIC For Technological Demonstrator (T.D.) And For Final Instrument (F.I.) QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

QUBIC detector sub-system : Technological Demonstrator : 1 x TES array (248 + 8 TES pixels @ 150 GHz) Final Instrument : 8 x TES arrays (150 & 220 GHz) QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

Status of the sub-system : blocking points and schedule What is the status of the sub-system ? D.T. phase : Home made manufacturing of TES arrays (CSNSM & CTU IEF-C2N). Room temperature tests (signal rooting) and 300mK electrical calibration tests When is this phase supposed to be finished ? D.T. 6 arrays end 2016 F.I. 6 arrays march 2107, 10 arrays end 2017. The best of them will be selected for the F.I. If you are still designing the sub-system: Which inputs / specifications / requirements, needed to finish the detailed design of your sub-systems, are not yet delivered ? For D.T. Fine tuning of the membrane fabrication process is foreseen. Input from 300mK TES tests For F.I. Feedback from optical calibration of the D.T. to check absorption efficiency of the grid is recommended. Which other working group should deliver these inputs (see annex 1 for list of main WP) ? For D.T. Assembly Integration Tests group For F.I. Calibration and tests of integrated instrument group Do you think you can comply to the target schedule (see annex 2) ? D.T. O.K F.I. Shifted to 12-2017 QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

Interfaces with other sub-systems List and describe needed interfaces with other systems. Mechanical Electrical / Signal : TES multiplexing read-out Vacuum Thermal Etc… Are these interfaces currently frozen ? No QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

Test, Delivery, Assembly, Calibration Operations Tests of the sub-system in your premises before delivery at APC or ROMA: Which specifications will be tested ? Signal routing, TES quality, overall array structure What are the criterion for fail / pass ? <15% lost pixels, <30 mK Tc spread between pixels, no major visual defaults of the membranes Delivery to APC or ROMA: Special care needed for the transportation and handling of the goods ? Very fragile before integration. Assembly Operations in APC or/and ROMA: Same questions as first point above. + which other sub-systems should be integrated before yours? After yours ? + Is there any specific material needed for assembly ? (see annex 3 for help) What are the test sequences needed to be performed during/after integration + How many FTE will you send people at APC / ROMA for help during assembly ? Calibration Operations at APC: Same questions as for Assembly operations. Optical calibration, optical and electrical NEP, thermal coupling of membranes and homogeneity QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

ATRIUM and Documentation List (with reference ATRIUM-xxxxx) the technical documents related to your sub- system already in the ATRIUM repository. Are these documents definitive ? Should we update the status of the document from “in project” to “validated” ? Missing documents from other sub-systems ? Future documents to be downloaded by you ? - Fabrication process mask file (GDS file) - Fabrication process remarks - Test data (TES R-T curves…) QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

Last news, program for late 2016 and 2017 and other useful information 6 wafers at stand-by for Deep-RIE (4x 150 GHz, 2x 220 GHz) 6 additional SOI wafers will be processed by march 2017 10 new SOI wafers by end 2017 (optimized membranes for 220 GHz?) He-free cryostat under construction, will allow quick testing of the TES before Deep-RIE (R-T curves) Deep-RIE + XeF2 : fine-tuning and reliability of the process Optical calibration feed-back from D.T. : photon absorption grid OK? QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

Fabrication process schedule P_62 to P_67 P_68 to P_78 Wafer Delivery SOI + SiN 6 SOI wafers 10 SOI wafers NbSi + Al deposition (e-beam) 150 GHz 220 GHz Al etching - signal routing (wet) NbSi etching - TES (XeF2) Pd grid deposition & lift-off Intermediate tests TES + signal routing SiN membrane etching (RIE) Deep-RIE (Si + SiO2 backside) Si etching – suspended membrane (XeF2 + resist removal) end 2016 march 2017 end 2017 QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

Budget (excluding salaries)for T.D. + F.I. Spendings (type and amount) Funding (source and amount) Status of funding (granted / under examination) 2016 2017 30 k€ (mainly clean-room) IN2P3 under examination 2018 QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay Manpower Name and responsibility % FTE 2016 % FTE 2017 % FTE 2018 Stefanos MARNIEROS 30 Laurent BERGE 20 Louis DUMOULIN 15 Benoit Belier (IEF) TOTAL FTE 85 QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay Risks analysis List up to three major risks that can impact performances, schedule, costs for the delivery of your sub-systems. Failure – repair delays of clean room machines used for the fabrication process 2017 IN2P3 funding Describe strategies dedicated to mitigate the probability of occurrence or the consequence of the risks alternative fabrication process not using the specific machine alternative micro-fabrication manufacturing sites alternative funding?? QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay

Annex 1: list of main-sub-system and WP leaders

Annex 2 : Target schedule

Annex 3: examples of possibly needed major tools or utilities High voltage (380 V) power Cold water Liquid or gaseous N2 / He Compressed air Clean air laminar flow / clean room / conditioned air Assembly Hall Mechanical workshop IT network or Wifi Chemicals ESD equipments Crane or heavy handling systems Metrology systems (Faro, MMT, Laser…) VNA Calibration source Mount (or fake) Vacuum systems (including degassing) Acquisition systems Computers / data acq. systems Electrical test with probe station QUBIC Collaboration Meeting, September 26 / 27, LAL - Orsay