Accredited Standards Committee C63® - EMC

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Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
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Accredited Standards Committee C63® - EMC
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Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
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Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Accredited Standards Committee C63® - EMC
Presentation transcript:

Accredited Standards Committee C63® - EMC Subcommittee 5 – Immunity Report to Main C63® Committee Stephen R Whitesell Chair, SC5 November 12, 2016

Accredited Standards Committee C63® - EMC Proposed SC5 Membership Steve Whitesell – Chair Ed Hare – Vice Chair Jerry Ramie – Secretary Poul Andersen Dan Hoolihan Masud Attayi Rick Lombardi Stephen Berger Randy Long Craig Fanning David Schaefer Andy Griffin Jeff Silberberg Don Heirman Dave Zimmerman

Accredited Standards Committee C63® - EMC SC5 Scope Subcommittee 5 is responsible for developing and maintaining new and existing standards for immunity testing techniques and associated instrumentation as requested by the Main Committee ANSI ASC C63® (no change)

Accredited Standards Committee C63® - EMC SC5 Duties Subcommittee 5 is responsible for the development, maintenance, and revision, as appropriate, of the following documents: C63.9 Immunity of Audio Office Equipment C63.15 Immunity Measurement of Electrical and Electronic Equipment C63.16 ESD Test Methodologies C63.24 Generic In-Situ Immunity Testing

Accredited Standards Committee C63® - EMC Motions On behalf of SC5, I move that the Main Committee approve the membership, scope, and list of duties for the subcommittee as shown on the three previous slides.

Accredited Standards Committee C63® - EMC SC5 Project Status C63.9: Immunity of Audio Office Equipment Chair: Andy Griffin A PINS-C was approved in May 2015 and a small Working Group has been formed. Additional participants are encouraged. A proposed PINS was reviewed by SC5 on Tuesday and is being recommended for approval by the Main Committee. Motion: On behalf of SC5, I move that the main committee approve the PINS for revising C63.9 as presented.

Accredited Standards Committee C63® - EMC SC5 Project Status C63.15: Immunity Measurement of Electrical and Electronic Equipment Chair: Don Heirman The Working Group has been very active in revising the document based on information in the PINS-C. Additions include automotive, quasi-static, proximity, and overhead power line testing. A proposed PINS was reviewed by SC5 on Tuesday and is being recommended for approval by the Main Committee. Motion: On behalf of SC5, I move that the main committee approve the PINS for revising C63.15 as presented.

Accredited Standards Committee C63® - EMC SC5 Project Status C63.16: ESD Test Methodologies Chair: Steve Whitesell We received news near the end of the SC5 meeting on Tuesday that C63.16 has been published. My thanks to the WG members as listed below for their help in making this document a reality: Tom Braxton Jerry Ramie Al Crum Jeff Silberberg Don Heirman Richard Worley Rick Lombardi

Accredited Standards Committee C63® - EMC SC5 Project Status C63.24: Generic In-Situ Immunity Testing Chair: Don Heirman Don has been in contact with Chad Kiger about working further development of this document as a joint project with the EMC Society’s revision of IEEE 473, which addresses site survey measurements of ambient RF signals. C63.24 is intended to address testing of equipment for immunity to those ambient signals. Concern was expressed that techniques used by IEEE 473 are out of date and will not give useful results. We await further input as to the feasibility of this joint project approach.