Submission Title: [Resolving the Ambiguity in IMST Measurements] <month year> doc: IEEE 802.15-05-0394-00-003c May 2006 Project: IEEE P802.15 Working Group for Wireless Personal Area Networks (WPANs) Submission Title: [Resolving the Ambiguity in IMST Measurements] Date Submitted: [May 2006] Source: [Alexei Davydov, Alexander Maltsev, Ali Sadri ] Company: [Intel Corporation] Address: [Intel Corporation, 13290 Evening Creek Drive, San Diego , CA 92128-3419, USA] Abstract: [Proposed the procedure for resolving the ambiguity in IMST measurements] Purpose: [Contribution to 802.15 TG3c at May 2006 meeting in Jacksonville, USA] Notice: This document has been prepared to assist the IEEE P802.15. It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein. Release: The contributor acknowledges and accepts that this contribution becomes the property of IEEE and may be made publicly available by P802.15. Alexei Davydov (Intel Corporation) <author>, <company>

Agenda IMST measurement scenarios review May 2006 Agenda IMST measurement scenarios review Comparison of results for angle measurements with and without ambiguity Description of simplified three-dimensional ray-tracing model Cluster identification methodology Inter-cluster time of arrival statistics Summary Alexei Davydov (Intel Corporation)

Measurement scenarios plan <month year> doc: IEEE 802.15-05-0394-00-003c May 2006 Measurement scenarios plan LOS NLOS Edge Alexei Davydov (Intel Corporation) <author>, <company>

Measurements Scenarios <month year> doc: IEEE 802.15-05-0394-00-003c May 2006 Measurements Scenarios Library environment with tables, chairs and metal bookshelves with books 3 main types of measurement scenarios LOS: unobstructed line of sight conditions Edge: partially obstructed line of sight by the edge of a metal bookshelf NLOS: non line of sight obstructed by a densely filled bookshelf 3 types of RX antennas (horn, wideband dipole array antenna, biconical) Fixed TX lens antenna position at the suspended ceiling, RX measurements range ~2-5m Time resolution is 1/960MHz ≈ 1ns Two types of virtual uniform antenna arrays for direction of arrival analysis 501x1 uniform linear array with 1mm antenna spacing (los scenarios) 301x51 uniform planar antenna array with 1mm antenna spacing (edge scenario) Alexei Davydov (Intel Corporation) <author>, <company>

Direction of arrival measurements (Edge scenario) May 2006 Direction of arrival measurements (Edge scenario) Planar array: non-ambiguous azimuth angle measurements Linear array: ambiguous azimuth angle measurements 1 2 3 4 5 6 7 8 9 10 11 12 1 2 3 4 5 6 7 8 9 10 11 12 Black dots represent the rays positions reconstructed from the simplified geometry-based tracing model. Low order reflected rays are only shown. Note: rays #1,5,9 are appearing from another angles in the right figure. Alexei Davydov (Intel Corporation)

May 2006 Illustration of simplified three-dimensional geometry-based ray-tracing model 1 2 3 4 5 6 7 8 9 10 11 12 Note: rays #1,5,9 (for scenarios cx,cy,cz) and rays #1,2,3,4 (for scenarios ew,ex,ey,ez) are only the rays which are arrived from the backside of the linear antenna array Alexei Davydov (Intel Corporation)

Direction of arrival measurements (LOS scenario) May 2006 Direction of arrival measurements (LOS scenario) Linear array: ambiguous azimuth angle measurements Reconstructed non-ambiguous rays positions from the simplified geometry-based tracing model 1 2 3 4 5 6 7 8 9 10 11 12 Note: rays #1,5,9 incident from the backside of the linear antenna array may be easily recognized in the left figure by the using the rays positions from the simplified geometry-based tracing model shown in the right figure. Alexei Davydov (Intel Corporation)

Cluster identification procedure (1) May 2006 Cluster identification procedure (1) 2D Gaussian Kernel Density Estimation (KDE) for rays time-angle of arrivals was used for assisting the cluster identification process by visual inspection Alexei Davydov (Intel Corporation)

Cluster identification procedure (2) May 2006 Cluster identification procedure (2) Projections of the identified cluster positions on the time-angular channel power profiles Alexei Davydov (Intel Corporation)

Inter-clusters time of arrival statistics May 2006 Inter-clusters time of arrival statistics Note: Exponential distribution of inter-arrival delays indicates that Poisson process can be used for modeling of clusters time of arrival Alexei Davydov (Intel Corporation)

May 2006 Summary For all IMST measurement scenarios the cluster angle of arrival ambiguity can be successfully overcome with help of simplified geometry-based ray-tracing model In most of the situations the ambiguity doesn’t affect intra-cluster multi-path components angle of arrival distribution Alexei Davydov (Intel Corporation)

May 2006 Backup Alexei Davydov (Intel Corporation)

Power Delay Profile (biconical antenna, aver. over all scenarios) May 2006 Power Delay Profile (biconical antenna, aver. over all scenarios) Experimental average PDP Delay breakpoint K Δ τ γ Model PDP K, [dB] τ, [ns] Δ, [dB] γ, [ns] Λflat [ns-1] Λexp [ns-1] 8 30 6 10 0.3 1 Alexei Davydov (Intel Corporation)

Power Delay Profile (biconical antenna, alternative approximation) May 2006 Power Delay Profile (biconical antenna, alternative approximation) Model PDP Alexei Davydov (Intel Corporation)

May 2006 Direction of arrival / Time of arrival observations (biconical antenna) ~Rician fading ~Rayleigh fading Alexei Davydov (Intel Corporation)

May 2006 Direction of arrival / Time of arrival observations (biconical antenna) near rough reflector ~ Rayleigh distribution Alexei Davydov (Intel Corporation)