Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting

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Presentation transcript:

Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Progress in Ultra-Fast Silicon Detectors Hartmut F.-W. Sadrozinski SCIPP, Univ. of California Santa Cruz, CA 95064, USA Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Measurement of the LGAD gain with 3 different methods Development of a UFSD test station based on 90Sr β Measurement of the timing resolution of 75µm thick LGADs

Gain Measurement: 3-ways (Luke Hibbard) Motivated by the presentation of Sofia Otero Ugobono at the 27th RD50 Meeting Compare the determination of gain by 3 different charge collection methods of two LGAD from wafers 7 & 8 of CNM run 6474: α from the back, works only for depleted sensors and exposed back side Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting β has low signal-to-noise for thin sensors, use separate detector to trigger only on high energy β. IR laser (needs opening in metal) uses detector w/o gain for comparison

Gain Measurement: α Back Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting α from the back exhibits characteristic shape of initial electrons+multiplication holes. Gain can be read-off directly. (Irradiated LGAD need simulation for gain extraction)

Gain Measurement: β from 90Sr β exhibits a shape mixing early initial electrons and late multiplication holes. Gain measured through the collected charge and can be verified by comparison with non-gain device. (Irradiated LGAD need simulation for gain extraction) Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting

Gain Measurement: IR Laser Particulars TCT set-up IR similar to β exhibits a shape mixing early initial electrons and late multiplication holes. Gain measured through the comparison of the collected charge with non-gain device. Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Very different pulse heights from different days result in same gain!

Gain Measurement: 3-ways (Luke Hibbard) Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Good agreement between β, IR gain measurements. α back shows systematic uncertainty depending on the method used to extract the gain (comparison with no-gain sensors vs. ratio of total charge / initial electron charge)

Conclusions on Gain Measurements Find good agreement between α, β, IR gain measurements pre-rad Different methods have different restrictions α back needs depleted sensors and no support wafers like epi or SoI but it is self-calibrating evaluation of α front is in the works β is reliable when compared to no-gain sensor, still needs correction from simulations IR requires second no-gain sensor for comparison to suppress dependence on laser intensity, couplings etc Need to extend this to post-rad detectors, most likely will require pulse shape analysis Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting

LGAD Timing Resolution The timing resolution in silicon sensors can be expressed as the sum of four terms   time walk sTW, time jitter sJ, Landau fluctuations sL and TDC binning sTDC: The first two terms are inversely proportional to the slope dV/dt -> need fast (i.e. thin sensors) and large pulses (i.e. gain) . One reason for thin sensors and low thresholds are the Landau fluctuations seen in beam tests and simulated with WF2: Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Weightfield2 (WF2) simulations of 75 and 300µm LGAD reproduce the observed pulse shapes 75 µm LGAD, ‘s G ~ 5, τRise = 500ps 300 µm LGAD, 120 GeV π’s G ~ 10, τRise = 5ns WF2: N. Cartiglia et al,

Slew-rate (Slope) dV/dt Good agreement for the timing resolution between data (beam test & laser) and simulations Weightfield2 (WF2) for 300um LGAD thickness. For 300um LGAD with gain G=10, the timing resolution has been measured: test beam (120 GeV π’s): 120ps, laser: 57ps. Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting For 75um LGAD with gain G=5, scaling dV/dt results in expected timing resolution 50 ps We now have new timing data from two 75µm LGAD with Gain G=5. We used a 90Sr β telescope with an ultra-fast Quartz & SiPM trigger.

90Sr β Telescope (A. Zatserklyaniy, Z. Galloway) Stack of LGAD planes and the trigger plane Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Self-shielded LGAD Quartz-SiPM Trigger Reduced Inductance

Ultra-Fast Trigger counter Sensl S-MicroC series evaluation board http://sensl.com/downloads/ds/DS-MicroCseries.pdf Trigger: 3x3x10 mm Quartz & SiPM sensl MicroFC-SMA-30050r Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting 3mmx3mmx10mm quartz block

75µm LGAD (6827-W11) in 90Sr -source σTime= 63ps (Preliminary) Recall timing resolution: time walk sTW, is compensated for in both LGAD and trigger with CFD at ≈ 40% Landau fluctuations sL are small for thin sensor. Might be able to get a first evidence of the effect of the TDC binning sTDC Data show Landau distribution: Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Time difference between one LGAD & trigger: 75µm LGAD (G=5) , ‘s σTime= 63ps (Preliminary)

2 LGAD’s: Pulse Height of Maximum Time vs Pulse height LGAD #1: arms the trigger blue: all events red: side bands green: subtraction Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Time vs Pulse height LGAD #2: not in trigger blue: all events red: side bands green: subtraction Time vs Pulse height Trigger has to be treated like data, correct for time walk (CFD)

 Coincidence Data of 2 Thin LGAD Plot time differences between: between 2 LGADs average: 57±9ps 2. between average of 2 LGADs and trigger: 40±6 ps Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Timing Resolution (preliminary) using Scope (sampling 20GS/s = 50ps) : LGAD (75µ,G=5) , σTime= 41±7ps using SamPic (sampling 6.4 GS/s=156ps): LGAD (75µ,G=5) , σTime= 85ps Quartz&SiPM Trigger:σTime= 28ps

Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Conclusions On two non-irradiated LGAD with gain of 10 and 2, respectively, we compared 3 different methods to extract the gain and found consistent answers. We developed a laboratory test set-up based on a 90Sr source and a fast trigger counter of 20-30 ps timing resolution to develop and test readout modules for beam tests evaluate DAQ systems beyond the DigScope for fast sensors: is 10GS/s of SamPic good enough? measure the timing resolution of LGAD: for LGAD of gain = 5 and 75µm thickness we find a timing resolution of ~ 40ps, consistent with the 50ps predicted by WF2 We are looking forward testing the new generation of thin LGAD from CNM and FBK being presented at this meeting. Thanks to the contributors to this work (next slide) and the organizers of this RD50 Collaboration Meeting. Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting

Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Contributors A. Anker, J. Chen, V. Fadeyev, P. Freeman, Z. Galloway, B. Gruey, H. Grabas, L. Hibbard, C. Labitan, Z. Liang, R. Losakul, Z. Luce, N. Maher, S. N. Mak, C. W. Ng, H. F.-W. Sadrozinski, A. Seiden, E. Spencer, M. Wilder, N. Woods, A. Zatserklyaniy SCIPP, Univ. of California Santa Cruz, CA 95064, USA B. Baldassarri, N. Cartiglia, F. Cenna, M. Ferrero Univ. of Torino and INFN, Torino, Italy G. Pellegrini, S. Hidalgo, M. Baselga, M. Carulla, P. Fernandez-Martinez, D. Flores, A. Merlos, D. Quirion Centro Nacional de Microelectrónica (CNM-CSIC), Barcelona, Spain Students in bold Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting

Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting Your hosts hard at work! Hartmut F.-W. Sadrozinski, UFSD, 28th RD50 Meeting