PSI test REPORT MARCH 2011 G. Spiezia, P. Peronnard (EN/STI/ECE)

Slides:



Advertisements
Similar presentations
Introduction to Multisim ECE 1020 Professor Ahmadi.
Advertisements

Measuring Cosmic Ray Flux with a trigger and CAMAC readout - Page 1 Connect the Fluke 415 HV supply output to the input of the voltage distribution box.
The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System,
Transient signals EE Overview What is a TRANSIENT Signal ??? What is a TRANSIENT Signal ??? Recap Of OSCILLOSCOPE Recap Of OSCILLOSCOPE Switches.
MDT-ASD PRR C. Posch30-Aug-01 1 Radiation Hardness Assurance   Total Ionizing Dose (TID) Change of device (transistor) properties, permanent   Single.
SCIPP Summer Outreach Project July Cosmic Ray Detectors Cosmic Ray Detectors Detector Testing Detector Testing Muon Lifetime Experiment Muon Lifetime.
P-Series presentation May 2005 N191X Power Meters and N192X Power Sensors Agilent’s P-Series power meters and power sensors provide wide bandwidth, fast,
COMPONENT TEST H4IRRAD 15 TH NOVEMBER 2011 G. Spiezia, P. Peronnard, G. Foucard, S. Danzeca, P. Gander, E. Fadakis (EN/STI/ECE)
2012 H4IRRAD test campaigns Summary of results S. Uznanski CERN, Geneva, Switzerland Radiation Working Group meeting Oct 16, 2012.
OPA549 and Negative Whisker on Enable
A Serializer ASIC for High Speed Data Transmission in Cryogenic and HiRel Environment Tiankuan Liu On behalf of the ATLAS Liquid Argon Calorimeter Group.
News from ESA-CNES Final Presentation Days 2013 A Masi, News from ESA-CNES Final Presentation Days 2013 News from ESA-CNES Final Presentation Days 2013.
Summary of CMS 3D pixel sensors R&D Enver Alagoz 1 On behalf of CMS 3D collaboration 1 Physics Department, Purdue University, West Lafayette, IN
DOIM Parallel Optical Link s: TX/RX S. Hou, R.S. Lu 19-Dec-2003, Lake Geneva.
4/27 Radiation Effects in Active Optical Components Robert A. Reed, Ken LaBel, Janet Barth, Henning Leidecker, Allan Johnston, Paul Marshall and Cheryl.
DAQ Cards, or Instruments The purpose of this presentation is to familiarize new Lab View users to the different computer aided test recourses available.
1 Plans for KEK/ATF 1. Introduction 2. Related Instrumentations at ATF 3. Experimental Plans for Fast Kicker R&D at ATF Junji Urakawa (KEK) at ILC Damping.
14/02/2007 Paolo Walter Cattaneo 1 1.Trigger analysis 2.Muon rate 3.Q distribution 4.Baseline 5.Pulse shape 6.Z measurement 7.Att measurement OUTLINE.
Digital Electronics and Computer Interfacing
DCSL & LVDCSL: A High Fan-in, High Performance Differential Current Switch Logic Families Dinesh Somasekhaar, Kaushik Roy Presented by Hazem Awad.
TRAD, Tests & Radiations 13/09/2011 LHC POWER CONVERTER Radiation analysis.
Radiation Test Facilities G. Spiezia. Engineering Department ENEN Radiation tests facilities  Radiation test in the accelerator sector  External facilities.
FIPDiag PSI Radiation test Presentation Radwg meeting August 2011 Julien Palluel BE/CO/FE 1 1.Devices Under test 2.Description of the test setup 3.Beam.
7/2/2003Ivan Hruska,Francisca Calheiros1 Radiation test of components for LV power supply design  Test done in PSI verification and selection.
S.Hou, Academia Sinica Taiwan. 2Outline Optical links for ATLAS Laser-driver  fiber  PIN-driver LHC modules in service Rad-hard requirement for LHC/SLHC.
P. Denes Page 1 FPPA-Rad1 UHF1x and FPPA Radiation Hardness Radiation studies performed at OPTIS (PSI) with 72 MeV p and at 88” (LBL) with 55 MeV.
Apr, 2014 TE-EPC-CCE Radiation Tests
TELL1 high rate Birmingham Karim Massri University of Birmingham CEDAR WG Meeting – CERN – 26/03/2012.
. Load Sensors Acquisition System (LSAS) – CNRAD irradiation test ( – ) Mateusz Sosin BE/ABP/SU RADWG,
NTOF DAQ status D. Macina (EN-STI-EET) Acknowledgements: EN-STI-ECE section: A. Masi, A. Almeida Paiva, M. Donze, M. Fantuzzi, A. Giraud, F. Marazita,
TRIUMF and ISIS Test Facilities Radiation 2 Electronics (R2E) LHC Activities TRIUMF and ISIS test facilities Rubén García Alía, Salvatore Danzeca, Adam.
CEC 220 Digital Circuit Design Latches and Flip-Flops Monday, March 03 CEC 220 Digital Circuit Design Slide 1 of 19.
LHC Beam Loss Monitors, B.Dehning 1/15 LHC Beam loss Monitors Loss monitor specifications Radiation tolerant Electronics Ionisation chamber development.
1 Calorimeters LED control LHCb CALO meeting Anatoli Konoplyannikov /ITEP/ Status of the calorimeters LV power supply and ECS control Status of.
1 Electronics Status Trigger and DAQ run successfully in RUN2006 for the first time Trigger communication to DRS boards via trigger bus Trigger firmware.
Numerical signal processing for LVDT reading based on rad tol components Salvatore Danzeca Ph.D. STUDENT (CERN EN/STI/ECE ) Students’ coffee meeting 1/3/2012.
Luminosity Monitor Design MICE Collaboration Meeting 31 May 2009 Paul Soler.
IB PRR PRR – IB System.
Application & Control method for 62000B Series DC Power Supply.
Radiation 4-5 December 2005 AB/BDI/BL.
TWEPP Paris, 09 Radiation Tests on the complete system of the instrumentation electronics for the LHC Cryogenics at the CNGS test facility Evangelia Gousiou.
Evaluation of OPA569 Bridge-Tied-Load Errol Leon and Thomas Kuehl Precision Linear Analog Applications January 26,
Daniel Belver IX Workshop on RPC and Related Detectors, Mumbai February 13-16th 2008 Performances of the Front End Electronics for the HADES RPC wall in.
(1/16) 08/05/12 – RadWG meeting G. Spiezia, P. Peronnard, E. Lefteris, P. Oser, J. Mekki PSI tests - Comparator Results Devices under test and beam conditions.
MULTIDETECTOR SYSTEM FOR NANOSECOND TAGGED NEUTRON TECHNOLOGY BASED ON HARDWARE SELECTION OF EVENTS M. Karetnikov, T. Khasaev, S. Korotkov All-Russia Research.
Evaluation of OPA569 Bridge-Tied-Load Errol Leon and Thomas Kuehl Precision Linear Analog Applications February 3,
Electrical Configuration and System Protection
Leakage current test & switched HV stress test of ALICE TRD / TPC capacitors TRD status meeting,
Macom RF switches radiation-test results
DerivFIP – Radiation test
Setup for automated measurements (parametrization) of ASD2 chip
M. Manghisoni, L. Ratti Università degli Studi di Pavia INFN Pavia
Integrated Shunt-LDO Regulator for FE-I4
Why Use an instrumentation Amplifier?
Irradiation test results for SAMPA MPW1 and plans for MPW2 irradiation tests Sohail Musa Mahmood
Standard setup with Channel-Pair
A transformer is a complex protective object
LogicStudio 16 Download datasheet Download drivers Download manual
Readout board: DRS, Oscilloscope
SEE Characterization of XC7K70T, Kintex Serie7 familly FPGA from Xilinx Hello everyone, I’m ELG, I’m here today to present you a SEE ch…, performed at.
Particle Detection System for MERIT
ATLAS Tile Calorimeter Interface The 8th Workshop on Electronics for LHC Experiments, Colmar, 9-13 September 2002 K. Anderson, A. Gupta, J. Pilcher, H.Sanders,
Single atom point contact when the wires bounce out of contact.
Read Delay Simulations
High Rate Photon Irradiation Test with an 8-Plane TRT Sector Prototype
Performance test of ACEM-detector (Aluminum Cathode Electron Multiplier) Marcus Palm AB-ATB-EA M. Palm, CERN.
On behalf of the Caltech Laser Group
Mini Tower Preliminary Results
Particle Detection System for MERIT
Pulsed electron beam cooling experiments: data & preliminary results
Presentation transcript:

PSI test REPORT MARCH 2011 G. Spiezia, P. Peronnard (EN/STI/ECE)

Outline Devices under tests Experimental setup Beam setup and results Conclusions

Devices under test

Setup PIF facility at PSI Experiment 230 MeV proton beam Flux: up to 1.65E+08 p/cm2/s Experiment Power supply E3633A for the input signal and the supply voltage to monitor the Single Event Latch up (SEL) Power supply E3648A (double output) for powering the DUT Tektronix DPO7254 oscilloscope (2.5GHz, 40GS/s) to monitor Single Event Transient (SET) Data Acquistion Switch Unit Agilent 34970A for monitoring the DUT outputs. Six channels were sequentially monitored.

Setup SET: Trigger on both slope for glitches SEL: Current value to trigger the power OFF >50 mA. Monitoring the power supply output remotely (period 1 s)

Setup Run # DUT id Width (ns) Level (mV) 1 TL431 10 120 2 3 60 4 TL432 5 LM4041 6 7 INA141 8 9 OPA2227_1 11 TL072 12 OPA2227_2 20 13

Setup GUI interface for remote control and logging GPIB Instruments Ethernet to GPIB GUI interface for remote control and logging DUT Ethernet switch BEAM

Schematics TL431/TL432

Schematics LM4041

Schematics INA141

Schematics OPA2227/TL072

Beam Run Run # DUT id Input Voltage Energy [MeV] Flux Fluence TID (Gy) 1 TL431 NA 230 1.65E+08 2.00E+11 102 2 1.70E+11 93 3 1.60E+08 2.00E+10 10 4 TL432 1.57E+08 3.80E+11 203 5 LM4041 1.50E+08 6 7 INA141 300mV 3.17E+11 170 8 9.30E+10 50 9 OPA2227_1 4V 1.00E+11 53 2.80E+11 150 11 TL072 3.74E+11 200 12 OPA2227_2 1V 1.90E+11 13 0.5V 2.10E+11 117

Cummulative TID DUT id Cumulative TID (Gy) INA141 220 OPA2227_1 200 229 TL072 LM4041 333 TL431 205 TL432 203

Results - OpAmp No SEL, no SET were observed (many trigger setup were tested) Drift observed on the outputs for all DUT Drift observed on power supplies for OPA2227 and TL072 INA141 Outputs remain stables until 100Gy TID (Gy) Drift 1 (mV) Drift 2 (mV) Drift 3 (mV) 100 0.8 0.2 0.3 220 11.6 15.9 12.7

Results - OpAmp OPA2227 Decrease of the power consumption (5mA) Drift on the outputs is less than 1mV excepted for output 3 which is around 3.5mV

Results - OpAmp TL072 Decrease of the power consumption: 35mA on positive, 20mA on negative Drift on the outputs is dependent of the configuration Output 1 & 2 (+8V): ~500uV Output 3 & 4 (-8.8V): ~3.2mV from 0 to 34Gy, outputs remain stables after Output 5 & 6 (-4V): ~1mV from 0 to 34Gy, 2mV from 34 to 200Gy

Results – Reference Voltage No SEL, no SET were observed Drifts on the output were observed for all voltage references No fluctuations were observed on the power supply TL431 The outputs remain quite stable until a TID of 60Gy ~4.6mV from 60Gy to 205Gy Output 2 of the TL431

Results – Reference Voltage LM4041 Drift difficult to observe Outputs fluctuate within 1mV Drift of 2.5mV was observed on first output

Conclusions No SEL and no SET were observed Drifts were observed on both outputs and power supplies for OPA2227 and TL072 Drifts were also observed on voltage references Outputs can remain stable until a given and then degrade quickly