Manufacturing of the IFMIF series power couplers

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Presentation transcript:

Manufacturing of the IFMIF series power couplers Presented by : Hassen JENHANI IRFU/CEA TTC MEETING AT SLAC, DECEMBER 1-4, 2015

IFMIF Power Coupler Layout Cooled outer conductor: Stainless steel + OFHC Copper High purity copper plating of all the RF surfaces Window : Ceramic: AL995 External conductor & inner conductor: OFHC Copper +SS Antenna: Stainless steel with high purity copper plating “T” Transition: Internal conductor: OFHC Copper (all brazed) External conductor: Aluminum (TIG welded) All brazed* 1092 mm *Ghe cicuit connectors are TIG welded RF specifications for the couplers dedicated to the first cryomodule of IFMIF : Frequency: 175MHz Qext: 6.5x104 Maximum nominal operating RF power: 70 kW CW RF power validation needs : 100 kW CW in TW and SW H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

Main validation Stages Validation of processes based on samples: Copper plating validation: RRR, thickness, adhesion TiN validation: Thickness measurements Samples for RRR measurements Samples for antenna plating validation Samples for outer conductor plating validation Validation based on muck-up: Assembling processes validation RF measurements Easy cleanability of vacuum parts Validation based on prototype coupler pair: Desorption rate measured on the final vacuum parts <<5 x 10-9 Pa.m/sec Detailed visual inspections RF conditioning up to 100 kW CW TW/SW (results were presented in TTC 2014) H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

SERIES couplers manufacturing Validation of two PC prototypes  Manufacturing of eight PCs has been lunched. The design of the coupler was validated, however new considerations related to the cryogenic system for the cryomodule suggested slight modifications The most significant change due to these new considerations impacted the copper plating acceptance criteria Prototype Couplers Series Couplers Impact on the manufacturing Copper plating Thickness ~ 40 µm From 20μm to 30µm Modification of the plating process parameters  New validation tests RRR 30 ≤ RRRCu ≤ 80 20 ≤ RRRCu ≤ 80  New samples are needed for copper plating validation Copper plating process is still the same: 1µm Nickel layer Bead blasting after copper plating 400 °C heat treatment during 2h  No additional desorption test measurements are requested as the same copper plating processes is maintained. Concerning the inspection acceptance criteria, the visual inspection report established for the prototypes is used as a baseline document for the series PCs. H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

New validation tests for the copper plating Liquid Nitrogen cooling U.S Bath cleaning at 60°C (UP water +detergent) Copper after the tests Adhesion test:  No surface degradation was observed Thickness measurements on representative sample: SS Cu  Thickness corresponds to the specification: From 20μm to 30µm RRR measurements results: RRR SS = 1.5 RRR SS-Cu not heat treated = 15 RRR SS-Cu heat treated = 32 => corresponds to the specification: 20 ≤ RRRCu ≤ 80 H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

Additional investigations: SIMS Analysis of a copper plated sample Analysis performed in the MAterial ANAlysis Platform (PANAMA) / Thanks to David LONGUEVERGNE 30µm Confocal Microscopy (KEYENCE VK-X200) Depth measurements of the crater Crater created by SIMS Analyses SIMS Analysis (HIDEN ANALYTICAL) Ni Cu O Fe ~30µm ~15µm Expected location for the SS substrate boundary Inputs: Measured depth of the crater generated by the SIMS analysis: ~30µm Expected Cu thickness: 21µm..25µm Initial Ni layer thickness: 1µm Heat treatment: 400°C (2h) Ni concentration is the same from the copper surface to 15µm depth. Concentration increases from that depth to the SS interface H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

Visual inspections on the first series PC (1) Prototype Coupler After Copper Wool burnishing After RF Conditioning Brazing roll Series Coupler No brazing roll for the first coupler inspection H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

Visual inspections on the first series PC (2) Prototype Series Dark color due to the brazing material oxidation Brazing material traces but surface was smoothed before the TiN deposition No problem encountered during RF power tests of the 2 coupler prototypes Ceramic window (Vacuum side) is clean and has the same coloration in the two case Dark color on the air side of the ceramic Can be removed by sandblasting H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

Visual inspections on the first series PC (3) Inspection of the plated antenna of the first series PC Dark color on the entire antenna seems to be due to oxidation: Chemical solution? Sulfamic acid or citric acid… Or mechanical solution? Burnishing or bead blasting. For the next couplers, we asked for photos of the antenna before and after brazing operation to check if antenna copper plating is initially ok. Traces on the antenna copper plating Antenna after the final brazing operations Ceramic wool Surface finishing proposal: Ceramic wool wiping H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

Investigation on the ceramic wool wiping impact on the copper surface Ceramic wiping applied on copper plated sample Ceramic wool wiped region SS copper plated sample Ra=1.04 NO Ceramic Wiping Ra=0.42 Light Ceramic Wiping More Ceramic Ra=0.39 Surface investigation using Confocal Microscopy (KEYENCE VK-X200) Particle counting in ISO5 clean room: Cleaning with UP water/US bath/detergent, then particle counting  The counted particles number decrease down to zero  No cleaning issues due to the ceramic wool wiping H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

We would appreciate having your experience feedback and comments. Thank you for your attention! H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015

H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015 Thanks to P. Hardy, V. Hennion, N. Berton, H. Dzitko, G. Devanz, Y. Gasser, Y. Boudigou, C. Antoine and N. Bazin from IRFU (CEA) A special thank to David Longuevergne from IPNO (IN2P3/CNRS) H. JENHANI, TTC MEETING AT SLAC, DECEMBER 1-4, 2015