Introduction to Statistical Analysis in PatBase AIDB 2009 Hari Chandrapal

Minesoft Ltd Overview Who? Where? Founded in 1996 Patent Information Solutions Provider Serving customers Worldwide Corporations, National Patent Offices, Patent Attorneys and Patent Searching firms 2009 Prestigious Queen’s Award winner Where? UK Germany US Italy Japan Israel; India; Korea

Created in 2003 - Designed by professional patent searchers >35 million patent family records from early 1900’s – linking bibliographical, legal and full-text patent information >25 million full-text & > 23 million patent drawings From >80 patent issuing authorities, Updated Daily Searchable by keyword or classification (IPC, UPC, ECLA and Locarno Class and the German Class, Japanese F/FI terms) Statistical Analysis functionality for identifying filing trends PatBase Express – easy-to-use interface for engineers and R&D depts RWS Group

PatBase Record Structure Single PatBase Family Record Citations etc Text Biblio RWS Group

Family record view Classifications Family All Assignee & Inventors Full Text

Analysis Tools to build on Search Strategy for final analysis Run basic assignee search in PatBase and select Snapshot (PA=Smeg)

Instant summary of breakdown by publication year and classification Snapshot View Instant summary of breakdown by publication year and classification Position mouse over bar to view definition of classification Drill down’ by clicking on interactive graph to view further breakdown of classification

Click on time period of interest to view breakdown options in menu For example, country breakdown for the 1990’s

Identify most frequently occurring country and combine with classification search to explore other companies in that area of technology for that country.

VizPat Statistical Analysis View break down of assignees, run additional searches directly from this window, use advanced options to clean up assignee list and run further analysis.

Once left with assignees of interest can produce exportable visual summary. Can also view further breakdown of assignees by country, publication year, classification, priority year

Exportable visual summaries of analysis of results

VizPat Classification Analysis View breakdown of results set by Japanese F-Terms Search on most frequently occurring/relevant F-Term View results by Classification Tree to understand area of technology Position mouse over classification number to view definition

Assignee search combined with keyword analysis to understand company activity

Quick view of results using image or scan display formats to check relevancy of results

Statistical Analysis Tools in PatBase Snapshot Instant statistical breakdown with interactive graphical visualizations. Can get immediate overview and check relevancy VizPat Stat. Analysis Classification (US, IPC, Japanese F-Terms, ECLA) Keywords (+US, DE and FR claims) Assignee VizPat Stat. Advanced Inventor, Assignee, Classification, Country, Date for further breakdowns by additional bibliographic data Additional Analysis Aids Multiple display and sort options. Keyword highlighting. Export data to generate own visualizations

Online Patent Family Database Search: Search form, Browse Index, Command line Non-Latin text, German search string using left hand truncation, Number Wizard, Quick Search View: Image, scan, full display formats and many others. Sort by most cited and additional bibliographic info Keyword Highlighting Full text Analyse: Snapshot VizPat Statistical Analysis VizPat Advanced Analysis Various viewing and display formats and on the fly machine translations Extract: Various export formats (word, PDF, HTML and many others, BizInt & Vantage Point) Shared folders Exportable visualizations

THANK YOU Questions ? Hari Chandrapal Minesoft Ltd Tel: +44 (0)20 8404 0670 Email: hari@minesoft.com www.minesoft.com