Alexandre Rachevski, Francesco Prino

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Presentation transcript:

Alexandre Rachevski, Francesco Prino Status of present SDD Alexandre Rachevski, Francesco Prino ITS Upgrade Meeting (4/10/2010, 10h:00–18h:00, Salle Anderson – bld. 222)

Silicon Drift Detectors SDDs equip 2 out of 6 cylindrical layers of the ALICE ITS Silicon Drift Detectors Tot. No. Channels 133.12 ×103 Tot. No. detectors 260 Tot. sensitive area 1.37 m2 8 6 SDDs per ladder 22 14 Ladders 23.8 14.9 Radius (cm) Layer 4 Layer 3

SDD barrel trasportation to CERN (02/02/2007) OVERSIZE LOAD TRANSPORT SDD in data taking from July 2008 (Cosmic runs)

SDD commissioning and data taking Detector installation completed in June 2007 Run 1: December 2007 First acquisition tests on a fraction of modules Run 2: Feb – Mar 2008 ½ of the modules in acquisition due cooling and power supply limitations Calibration tests + first atmospheric muons seen in ITS Installation of services completed in May 2008 Run 3: June – October 2008 Subdetector specific calibration runs (Frequent monitoring of dead channels, noise, gain, drift speed ...) Cosmic runs with SPD FastOR trigger (First alignment of the ITS modules + test TPC/ITS track matching) Absolute calibration of the charge signal in SDD and SSD Run 4: August 2009 Cosmic runs with different trigger configurations Run 5: Nov – Dic 2009 p-p at √s=0.9 and 2.36 TeV Run 6: Mar 2010 – Now p-p at √s=7 TeV TIME

Layers overview

Terminal problems Problem Number of affected modules Layer 3 Layer 4 LVPS short-circuit 3+3** DCS communication lost 2 No JTAG answer 1 3 Unstable / Low rate acquisition 1 4 Noise 1 MV interruption 1+* HV interruption 3 Total 22 ** June 2010, 1 more half-ladder (6c of the layer 3) has been lost: LVPS over-current known problem * - one more module has HV but no MV. Still in acquisition. Efficiency is not assured

Run statistics RUN 104835 = TYPICAL RUN p-p 2009 ----------------------Summary---------------------- ---- Layer 3 ---- # of bad modules = 5 # of bad chips in good modules = 4 # of bad hybrids = 11 # of bad anodes in good hybrids = 323 Fraction of Good modules = 0.940476 Fraction of Good hybrids = 0.934524 Fraction of good anodes in good modules = 0.985685 Fraction of good anodes in good hybrids = 0.991964 Fraction of bads (anodes+chips+mod) = 0.072986 ---- Layer 4 ---- # of bad modules = 11 # of bad chips in good modules = 12 # of bad hybrids = 25 # of bad anodes in good hybrids = 1595 Fraction of Good modules = 0.937500 Fraction of Good hybrids = 0.928977 Fraction of good anodes in good modules = 0.972029 Fraction of good anodes in good hybrids = 0.980947 Fraction of bads (anodes+chips+mod) = 0.088723 RUN 114630 = RUN p-p 27/03/2010 RUN 133544 = RUN p-p 27/03/2010 ---- Layer 3 ---- = 7 = 4 = 15 = 350 = 0.916667 = 0.910714 = 0.984629 = 0.991064 = 0.097424 ---- Layer 4 ---- = 17 = 20 = 39 = 756 = 0.903409 = 0.889205 = 0.974990 = 0.990565 = 0.119185 = 8 = 4 = 17 = 330 = 0.904762 = 0.898810 = 0.984940 = 0.991463 = 0.108863 = 20 = 39 = 763 = 0.903409 = 0.889205 = 0.974904 = 0.990478 = 0.119263

SDD status during 2009 data taking SDD in acquisition vs. time Run 2009: p-p at √s=0.9 and 2.36 TeV SDD status during 2009 data taking Fraction of modules in acquisition: 94% on layer 3 ; 91.5% on layer 4 Fraction of good channels in good modules = 98.3% 20/11/2009 17/12/2009 Run 2010: p-p at √s=7 TeV Fraction of active channels Stably close to 90% during 6 months of data taking in 2010 30/09/2010 27/03/2010 8

SDD calibration vs. time SDD anode calibration quantities remarkably stable during 6 months of p-p data taking (27/03/2010 – 30/09/2010) Baselines, noise and gain measured online with dedicated DAs and stored in the OCDB Baseline Noise Gain 9

SDD drift speed vs. time Drift speed vs. time (from dedicated injector runs) during p-p run in Dec. 2009  drift speed stability better than 0.15% for most SDD modules Run 2009: p-p at √s=0.9 and 2.36 TeV Run 2010: p-p at √s=7 TeV Drift speed stable over periods with stable ITS configuration. Layer 3 drift speed sensitive to SPD cooling status 27/03/2010 30/09/2010

SDD injectors vs. time Decreasing trend? Under investigation Run 2010: p-p at √s=7 TeV 27/03/2010 30/09/2010 Periods (up to 24h) for complete injector recovering after HV switching OFF/ON 11

SDD upgrade. SuperCARLOSrx: 9Ux400mm VME board Thanks to Davide Falchieri, Luca Toscano, Samuele Zannoli, Alessandro Ascari CARLOSrx upgrade with 5 Xilinx Virtex5 FPGA Same I/O interfaces as CARLOSrx, much higher processing power Goal: to implement an on-line digital filter with common mode noise rejection Two prototype boards received at the end of May 2010: one in Torino and one in Bologna

Now under the tests with SDDs 2 SDD ladders: one for layer 3 one for layer 4 … DAQ PC SuperCARLOSrx A firmware version for the SuperCARLOSrx board has been designed with the same features of the one installed on the CARLOSrx boards at CERN: now the boards are interchangeable. Next step: to implement to the SuperCARLOS FPGAs some features of CARLOS and AMBRA chips: to equalize baselines to develop a 2D compression algorithm

SDD radiation hardness P. Giubellino, et al., ALICE-INT-2001-003, January 2001: 3rd layer of the ITS has to withstand in 10 years of operation a total ionizing dose of 14 krad (charged pions) plus a neuron fluence of 3.5 x 1011 cm-2 C. Piemonte, V. Bonvicini, A. Rashevsky, A. Vacchi, R. Wheadon “Electric performance of the ALICE Silicon Drift Detector irradiated with 1 GeV electrons”, Nucl. Instr. and Meth. A 485 (2002) 133

NIEL normalized to 1 MeV neutron in silicon for different particles Electron fluence equivalent to the radiation produced in 10 years of ALICE operation is Φe =10 ∙ Φπ + 20 ∙ Φn = 10 ∙ 5 ∙ 1011 + 20 ∙ 3.5 ∙ 1011 = 1 ∙ 1013 e-/cm2

Leakage current after irradiation with 1 GeV electrons

Voltage drop distribution on the integrated divider after irradiation with 1 GeV electrons (NO SUPPORT OF THE EXTERNAL VOLTAGE DIVIDER) Φe = 1 ∙ 1013 e-/cm2

END

SDD readout architecture (each half-ladder) PASCAL AMBRA CARLOS (data compression) GOL (Gigabit Optical Link) + QPLL 40 MHz clock Programming & monitoring Data output & monitoring

SDD front-end and readout electronics PASCAL (64 channels) Preamplifier (t ~ 40ns, RC-CR2 shaping) Analog memory (64 256 cells) 32 10-bit linear ADC (1 every 2 channels) ) AMBRA (64 channels) Four 16 kB buffers Baseline equalization 10 to 8-bit compression CARLOS (1 for 8 AMBRAs) Zero suppression and Compression of data from 1 SDD with a 2D – 2-Threshold algorithm (programmable parameters) Interface with AMBRAs, GOL and CARLOS-rx (FPGA based board, in counting room, which links to DDLs) FEE monitoring (SEU) time-multiplexed with data on the 16-bit output data bus Protections against radiation effects (parity check) SDD front-end and readout electronics Design specifications dynamic range: up to 8 MIPs noise: 250 e- readout time < 1ms power consumption: <5 mW/channel chips thinned to 150mm