Uppsala Progress Report

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Presentation transcript:

Uppsala Progress Report New sample holder IV measurements and surface damage observations 5um W tip – Cu mirror surface 5um W tip – Cu etched surface NIMA XB10 proceeding was accepted 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. Last meeting (25 Jan.) Cathode: Cu etched surface (sodium persulfate, 30sec, inspired by Higashi's presentation at XB10) Anode: 0.5 um W tip Gradient: several hundred MV/m 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. New setup Basic Idea: Reproduce high gradient electric field conditions in micro meter range: 1 GV/m = 1 kV/μm New! · An inclined sample holder has been installed The piezomotor is on the ramp to avoid hitting the electron column. The new sample holder sets the sample surface perpendicular to the tip. Piezo motor W tip Cu sample 03 May 2011 T. Muranaka, Uppsala Univ. Exp. setup

T. Muranaka, Uppsala Univ. New measurements Condition 1 (17-18 Feb, 23-24 Feb) Cathode: Cu etched surface (17 Feb morning) Anode: 5um W tip Gap: 1.5um Bias: 0 - 2kV Distinct variations in the size of damaged area were observed among several measurements with same condition, although measured currents were almost the same (i.e. deposited energy on the surface were same) (see the next slide). The positive bias was put on the W tip (of 5um radius instead 0.5um in the last report) keeping the gap of 1um from the sample surface. 03 May 2011 T. Muranaka, Uppsala Univ.

Current vs time (bias step: 20V) 10-6 0.8 0.5 800V Current 720V Bias [kV] 0.6 Step 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. New measurements Condition 2 Cathode: Cu mirror surface Anode: 5 um W tip Gap: 1um Bias: 0 - 1kV Measured currents were similar to that of the condition 1 (with etched surface) but surface melting was not observed. Carbon contaminations were used as markers but dispersed after IV measurements. Whitish contaminations were observed several times. 03 May 2011 T. Muranaka, Uppsala Univ.

Current vs time (bias step: 2V) 10-6 0.6 Bias [kV] Current [A] Step 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. Before IV measurement Carbon contamination 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. After IV measurement 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. After IV measurement (the tip is retracted) 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. New measurements Before measurement After measurement 03 May 2011 T. Muranaka, Uppsala Univ.

T. Muranaka, Uppsala Univ. Summary Questions: Why the current is unstable? (even after 3h of run) Why higher gradient? Is cleaning needed? Is conditioning needed? Is there any correlation between emission current (or emission process?) and surface damage/contamination? Plan: Cleaning & conditioning process on the mirror surface 03 May 2011 T. Muranaka, Uppsala Univ.