Mission Profile Aware IC Design - A Case Study -

Slides:



Advertisements
Similar presentations
18 July 2001 Work In Progress – Not for Publication 2001 ITRS Test Chapter ITRS Test ITWG Mike Rodgers Don Edenfeld.
Advertisements

IRC Roll-Out/Plenary 4/4 Technology Node identified by xx90 –Minimum Half-Pitch of Metal 1 of either DRAM or Logic –Logic node presently being represented.
RF and AMS Technologies for Wireless Communications Working Group International Technology Roadmap for Semiconductors Radio Frequency and Analog/Mixed-Signal.
More than Moore ITRS Summer Meeting 2008 July 14, 2008 San Francisco, CA.
ITRS Roadmap Design + System Drivers Makuhari, December 2007 Worldwide Design ITWG Good morning. Here we present the work that the ITRS Design TWG has.
Practical Aspects of Reliability Analysis for IC Designs T. Pompl, C. Schl ü nder, M. Hommel, H. Nielen, J. Schneider.
Kwangok Jeong and Andrew B. Kahng UCSD VLSI CAD Laboratory
ATSN 2009 Towards an Extensible Agent-based Middleware for Sensor Networks and RFID Systems Dirk Bade University of Hamburg, Germany.
Electronics Cooling Mechanical Power Engineering Dept.
DENSO Organization.
Intel ® Research mote Ralph Kling Intel Corporation Research Santa Clara, CA.
Proton Source Workshop December 7 & 8, 2010 John Reid December 8, 2010.
UC San Diego / VLSI CAD Laboratory Reliability-Constrained Die Stacking Order in 3DICs Under Manufacturing Variability Tuck-Boon Chan, Andrew B. Kahng,
ACTION PROPOSAL FOR FLYWHEEL ENERGY TECHNOLOGY Enhance future grid reliability, interoperability, & extreme event protection In 20 years, the flywheel.
1 POWER MANAGEMENT FOR SUSTAINABLE ENERGY SYSTEMS Graham Town Electronic Engineering Macquarie University.
Bridging Theory in Practice Transferring Technical Knowledge to Practical Applications.
BS Test & Measurement Technique for Modern Semi-con devices & PCBAs.
Presented By : LAHSAINI Achraf & MAKARA Felipe.  Introduction  Difficult Challenges : > Difficult Challenges between 2013 – 2020 > Difficult Challenges.
CMP 4202: VLSI System Design Lecturer: Geofrey Bakkabulindi
Hsinchu, Taiwan December 6, International Technology Roadmap for Semiconductors (ITRS 2000) Assembly & Packaging International Technical Working.
Digital Micromirror Device
J1879 Robustness Validation Hand Book A Joint SAE, ZVEI, JSAE, AEC Automotive Electronics Robustness Validation Plan The current qualification and verification.
Delivered as part of the RAPRA technical session at the Plastics Design & Moulding (PDM) Tradeshow 2015.
CS 546: Intelligent Embedded Systems Gaurav S. Sukhatme Robotic Embedded Systems Lab Center for Robotics and Embedded Systems Computer Science Department.
Name Of The College & Dept
M.Nuzaihan DMT 243 – Chapter 5 Fundamental Design For Reliability What is Design for Reliability, Microsystems Failure & Failure Mechanisms, Fundamental.
University of Rostock Institute of Applied Microelectronics and Computer Engineering Monitoring and Control of Temperature in Networks-on- Chip Tim Wegner,
-1- UC San Diego / VLSI CAD Laboratory Optimal Reliability-Constrained Overdrive Frequency Selection in Multicore Systems Andrew B. Kahng and Siddhartha.
BLDC Motor Speed Control with RPM Display. Introduction BLDC Motor Speed Control with RPM Display  The main objective of this.
Smart Grid Big Data: Automating Analysis of Distribution Systems Steve Pascoe Manager Business Development E&O - NISC.
Soikot Sengupta London, 4 th February 2004 The European Market for Mechatronics in Passenger Cars © 2003 Frost & Sullivan. All rights reserved. This document.
Failure Modes, Effects and Criticality Analysis
Background Data Centre (DC) energy consumption doubled between 2000 and 2005 and grew by 50% from 2005 to 2010, consuming 1.5% of global primary energy.
Sensing and Measurements Tom King Oak Ridge National Laboratory April 2016.
Reliability and Performance of the SNS Machine Protection System Doug Curry 2013.
Chapter 1: Roles and Opportunities for Information Technology in Meeting Sustainability Challenges Helynranta Viola Parkkila Vilma
Thermal Aware EM Computation
Business Areas Information Source DNJP Corporate Slides (PPT),
PCIM Europe 2016 Power Conversion and Intelligent Motion
Modular Power Conversion Cabinet for Future Warships
BURGLAR ALARM ON WINDOW GLASS BREAKING
B-11 Subcommittee/Task Group 3D Package Technology Meeting
An Unobtrusive Debugging Methodology for Actel AX and RTAX-S FPGAs
ULTRASONIC DISTANCE METER USING 8051
Photovoltaic Systems Engineering Electronic Control Devices (ECDs)
MICROCONTROLLER BASED SPEEDOMETER CUM ODOMETER
Maieutic Parataxis.
ANTI LOCK BRAKING SYSTEM
P FORMULA SAE ECU ENGINE CONTROL UNIT
Martin Shaw – Reliability Solutions
WIRE LOOP BREAKING ALARM SYSTEM
POWER MANAGEMENT FOR SUSTAINABLE ENERGY SYSTEMS
Power Market Drivers Developing leading-edge technology to exceed current and future design trends Energy efficiency as a major design specification Regulations.
© 2016 Global Market Insights, Inc. USA. All Rights Reserved Fuel Cell Market size worth $25.5bn by 2024 Molded Interconnect Devices.
Dependable, secure and time-aware sensor networks - Overview
Repair Solutions for a Legacy Network
Lecture #17 OUTLINE pn junctions (cont’d) Reverse bias current
J1879 Robustness Validation Hand Book A Joint SAE, ZVEI, JSAE, AEC Automotive Electronics Robustness Validation Plan Robustness Diagram Trends and Challenges.
Charles V. Trappey, National Chiao Tung University
Name Of The College & Dept
Status of the INL High-Temperature Electrolysis Research Program
A. Aal (VW), Shalabh Tandon (Intel), Khai Nguyen (NVIDIA)
Trends in Electronics Reliability Testing
Introduction to Embedded Systems
Martin Shaw – Reliability Solutions
Managing and Improving Reliability across the Entire Life Cycle
Technology leadership Manufacturing competence
© 2016 Global Market Insights, Inc. USA. All Rights Reserved Fuel Cell Market size worth $25.5bn by 2024 Industrial Ethernet Market.
© 2016 Global Market Insights, Inc. USA. All Rights Reserved Global Electronic Design Automation Market to hit $14 Bn by 2024: Global.
Presentation transcript:

Mission Profile Aware IC Design - A Case Study - Goeran Jerke, Robert Bosch GmbH, Automotive Electronics Andrew B. Kahng, University of California, San Diego This research project is supported by the German Government, Federal Ministry of Education and Research under the grant number 16M3195C

Overview Introduction Design Challenges Mission Profile Aware Design Case Study – Electromigration Aware IC Design Summary and Conclusion 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Introduction Tier 2 Tier 1 OEM OEM – Original Equipment Manufacturer ECUs, mechatronics sensors MEMS sensors Tier 2 Tier 1 Semiconductors OEM OEM – Original Equipment Manufacturer 17-Sep-18 17-Sep-18

Introduction Electronic Control Unit for ESP 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Introduction Tier 2 + Tier 1 ECU for Driver Assistance Acceleration Sensor Module 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Introduction Temperatures Responsibility Parameters Ambient Temperature (Car) OEM Environment Installation Location (Car) ECU Housing Tier 1, OEM System Design Packaging Constraints ECU (internal) Tier 1 Component Pin Tiers 1 and 2 Foundry Functional Load Constraints Tier 2 Foundry Device Junction 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Introduction IC Technology Node Evolution 17-Sep-18 Smart-Power HV-CMOS CMOS automotive CMOS leading edge (ITRS) 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Design Challenges Aggressive technology scaling Time to market  co-design System partitioning and integration Robustness Application requirements: Origin and cause of requirements  replicability, quality Impact on application design and technologies Application use  operating conditions, environmental load Functional loads  thermal, current, voltage, ... Reliability  dominant failure mechanisms Complex, heterogeneous and fragmented design flows 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Design Challenges Aggressive technology scaling Time to market  co-design System partitioning and integration Robustness Application requirements: Origin and cause of requirements  replicability, quality Impact on application design and technologies Application use  operating conditions, environmental load Functional loads  thermal, current, voltage, ... Reliability  dominant failure mechanisms Complex, heterogeneous and fragmented design flows 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Overview Introduction Design Challenges Mission Profile Aware Design Case Study – Electromigration Aware IC Design Summary and Conclusion 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Supply Chain OEM Tier 1 Tier 2 ... Tier n ... 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Design Chain OEM MP MP MP MP Tier 1 MP MP MP MP Tier 2 ... Tier n ... Requirements, Constraints, Functional Loads, Environmental Loads 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Design Chain OEM MP MP MP MP Tier 1 MP MP MP MP Tier 2 ... Tier n ... NEW: Achieved Robustness, Dominant Failure Mechanisms  RIF 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Design Flow Overview 2 1 5 3 3 4 4 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Consistent consideration of mission profiles (MP) in supply chain Reduction of design uncertainty More precise requirements and stress factors Better understanding of system (failure mechanisms) Formalized and improved communication OEM  Tier n and Tier n  OEM Standardization of structure and content of MPs Electronic format  MP documents RMP Framework (Tool-independent platform for mission profile aware design) 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Mission Profile Document Document header Operating states definition Component definition Property definition Back-annotation data 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Mission Profile Document Document header Author Timestamp Document history Mounting location Operating states definition Component definition Property definition Back-annotation data 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Mission Profile Document Document header Operating states definition Generic data container for operating states Manufacturing, assembly, storage, ... Car: start, acceleration, breaking, stop&go, freeway cruising, ... IC: power-up, idling, power-down, mode_1, mode_2, ... Component definition Property definition Back-annotation data 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Mission Profile Document Document header Operating states definition Component definition Type  e.g. ECU, passive component, IC, sensor, ... Device I/O port definition (*) Operating state dependent environmental and functional loads Heat flow Transient/effective voltages and currents ... Profiles Property definition Back-annotation data (*) A port is a generic object: thermal port or electrical port 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Source: ZVEI Handbook RV EE Modules 2012 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Mission Profile Document Document header Operating states definition Component definition Type Device I/O port definition Profiles: Temperature histogram, gradient and cycling Humidity vs. temperature histogram Vibration ... Property definition Back-annotation data 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Source: ZVEI Handbook RV EE Modules 2012 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Mission Profile Document Document header Operating states definition Component definition Property definition Back-annotation data Reliability: Robustness Indication Figures (RIF) of dominant failure mechanisms Robustness: Enhanced Worst-Case Distance (WCD) 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Mission Profile Aware Design Component Properties Component Parameter ECU TEEM_Package, TVMLA, TEEM_internal , TComp.Package , ... Board TBoard , ... Package TComp.Package, TComp.Pins, Rth, ... Chip TJunction, ... Sensor Discrete device, ... Source: ZVEI Handbook RV EE Modules 2012 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Overview Introduction Mission Profile Aware Design Case Study – Electromigration Aware IC Design Summary and Conclusion 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Quality of Functional Load Data Classic Design Flow Current Aware Design Flow 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Cell-Level Current Aware Design Flow 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Block-Level Current Aware Design Flow 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Electromigration (EM) Quality of Functional Load Data I I = 1A DC EM EOS RPP Voids Voids Hillock Hillock AE/QMM Electrical Overstress (EOS) t Abnormal peak event AE/QMM I Imax = 1A + Duty cycle Repetitive Power Pulsing (RPP) EM EOS RPP t 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego AE/QMM

EM Aware Design – Case Study Current (Density) Aware Routing to prevent EM and EOS 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Effective Design Parameters 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Electromigration Aware Design Flow 1 3 2 4 4,5 5 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Current Density Critical Nets – Automotive IC A Different Mission Profile Next technology node Base node 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

EM Aware Design – Case Study Current Density Critical Nets – Automotive IC B Next technology node Different Mission Profile Base node 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Overview Introduction Design Challenges Mission Profile Aware Design Case Study – Electromigration Aware IC Design Summary and Conclusion 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Summary and Conclusion Consideration of robustness as design target is essential for automotive electronic designs Consistent consideration of mission profiles within the design chain is required (bi-directional flow) Current aware design is driven by mission profiles Mission profile aware design: Vendor- and EDA tool-independent  focus on design flow Reduction of design uncertainty Formalized and improved communication 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego

Thank You! 17-Sep-18 Goeran Jerke, Robert Bosch GmbH; Andrew B. Kahng, University of California, San Diego