Craig Olson, Tina Tanaka, Tim Renk, Greg Rochau, Robert Peterson

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Presentation transcript:

Craig Olson, Tina Tanaka, Tim Renk, Greg Rochau, Robert Peterson Exposures of FW candidate materials on Z (x-rays - single shot) and on RHEPP (ions - 100s of shots) Introduction Craig Olson, Tina Tanaka, Tim Renk, Greg Rochau, Robert Peterson HAPL Meeting at UCLA June 2-3, 2004 Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.

Philosophy of using x-rays on Z to test laser IFE dry-wall materials Then: Use as single-shot test bed for initial screening of candidate wall materials, and compare with Bucky code calculations Advantages: wide fluence range ( 1 J/cm2 to  1000 J/cm2) very uniform fluence (large distance from “point source”) ~1 keV x-rays for tungsten wire array tailored line radiation to 4 keV, and higher, if wanted Disadvantages: debris, exact spectra, add-on shots hard to acquire Now: Finalize understanding of roughening Normalize results on Z with results on XAPPER Test materials with many keV spectra (closest to threat spectra) if desired Test “final” candidate material

Tungsten exposure to x-rays on Z shows that x-ray damage should not be a problem (single shot) threat threat (154 MJ) (400 MJ)

Philosophy of using ions on RHEPP to test laser IFE dry-wall materials Then: Use as single-shot test bed for initial screening of candidate wall materials, and compare with Bucky code calculations Advantages: power plant relevant ion fluences (up to ~10 J/cm2) uniform fluence, choice of ions effect of Bragg peak easy access, fast turn around Disadvantages: ~ 100 ns (whereas threat is ~ s) Now: Principle facility for ion testing of candidate wall materials for HAPL Extensive studies of ablation, roughening, cracking, valleys, exfoliation, etc. Extensive studies of aging (above ~ 100 shots) 100s to 1000 or more shots Extensive range of candidate materials are being tested

FW material exposure to ions on RHEPP shows that ion damage is still an issue Ablation Depth (mm) Net Ablation No net ablation, but surface roughening F(J/cm2) Threshold for roughening Threshold for ablation Threats: 154 MJ 400 MJ 8.5 J/cm2 21.1 J/cm2 (1.82 J/cm2) (4.54 J/cm2) For W:  1.25 J/cm2  6 J/cm2  2 J/cm2 (current tests)