ATML Status April 2006 Issue 7 An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committee

ATML ATML’s mission is to define a collection of XML-based schemas that allows ATE and test information to be exchanged in a common format adhering to the XML standard ATML defines a framework through which different architectures using XML can be implemented. defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures. Show examples of the net centric services by which this information can be exchanged across different ATS platforms as part of a maintenance process defines the XML format that these elements will take. The ATML specifications will define: How to define XML schemas that represent ATE and test information A set of XML schemas supporting the exchange of specific ATE and test information Example services that can be used for exchanging ATE and test information in a distributed net-centric environment. A set of services supporting the exchange of specific ATE and test information in specific common areas.

ATML Framework Instrument Description Test Station (1671.2) (1671.6) Test Adaptor (1671.5) Diagnostics (1232) UUT Description (1671.3) Test Configuration (1671.4) Test Description (1671.1) SIMICA (1636) Started Test Results (1636.1) Drafts 1 Reviewed Draft Candidate Test Candidate

SCC20 & ATML Organisations The IEEE SCC20 is the standards organisation through which the ATML components (Documents) will be published under various IEEE standards. The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML. The ATML group provides draft schemas and associated documents, examples, use cases, requirements and trials any ATML components Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components

SCC-20 Organization for 2006 Incorporating the ATML Components Steering & Administrative Chair: Les Orlidge (AAI) - Vice Chair: John Sheppard (ARINC) Secretary - Dave Droste (DRS TEM) Administrative/Procedural (ADMIN) Mike Seavey (Northrop-Grumman) Narayanan Ramachandran (TYX) Liaisons John Sheppard (CS), Joe Stanco & Mark Kaufman (I&M), Joe Stanco (AES), Bill Ross (DoD), Malcolm Brown (MoD), Les Orlidge(NDIA) Hardware Interfaces (HI) Co-Chair - Mike Stora (SysIntech) Co-Chair - Dave Droste (DRS TEM) Diagnostic and Maintenance Control (DMC) Co-Chair - Tim Wilmering (Boeing) Co-Chair - Mark Kaufman (NSWC/Corona Div) Test Description (TD) Co-Chair - Keith Ellis (ApSys) Co-Chair – Ion Neag (TYX) Test Information Integration (TII) Co-Chair – Chris Gorringe (Racal) Co-Chair – Mike Seavey (Northrop Grumman) IEEE-P1552 Structured Architecture for Test Systems (SATS) IEEE-P1522 Testability & Diagnosability IEEE-1641 Signal and Test Definition (STD) IEEE-P1671 ATML Overview and Architecture IEEE-P1505 Receiver-Fixture Interface (RFI) IEEE-1232 AI-ESTATE IEEE-716 C/ATLAS IEEE P1671.3 UUT Description IEEE-P1505.1 Common Test Interface Pin Map IEEE-P1636 Software Interface for Maintenance Information Collection Analysis (SIMICA) IEEE-771 Guide to the Use of ATLAS Test Configuration IEEE-1445 Digital Test Interchange Format (DTIF) IEEE-P1641.1 Signal and Test Definition User Guide Key Assigned within SCC20 Test Station IEEE-1546 DTIF Guide IEEE P1671.1 Test Description SCC20 IEEE Std Test Adapter IEEE-P1636.1 SIMICA Test Results and Session Information IEEE P1671.2 Instrument Description ATML IEEE Stds with PARS Expected Location Expected ATML Components without PARS IEEE-P1636.2 SIMICA Maintenance Action Information Note: 1671 dot numbers for the components are defined within the 1671 framework document

SCC-20 ATML PARs Status Project Authorisation Request (PAR) need to be approved by the IEEE NESCOM prior to any SCC-20 working group being established. ATML Framework PAR 1671 Approved Diagnostics PAR 1232 Existing & Update for ATML SIMICA PAR 1636 Approve Test Results PAR 1636.1 Approved MAI PAR 1636.2 – Submitted 2006 Test Description PAR 1671.1 Approved Instrument Description PAR 1671.2 Approved UUT Description – PAR Review 1671.3 Approved Test Configuration - PAR Review Submitted April 2006 Test Station &Test Adapter - PAR Review Submitted April 2006

ATML Objectives & Goals To have the P1671 standard written, reviewed and a ballot called by mid-2006 √ to submit as a standard by Q4 2006 To have Candidate Schemas available by End ‘05 for Test Results √ To have Final Draft Schemas available by End ‘05 and Candidate schemas for early ’06 Q1 Instrument Description √ UUT Description √ Test Adaptor √ Test Station √ Test Configuration √ Q2 Diagnostics (AI-ESTATE 1232) rev 2 Test Description To have Draft Schemas available by Late ‘06 and candidate schemas for ’07 SIMICA (TBA) MAI (Maintenance Action Information) (TBA)

ATML/IEEE Schedule (TII) TII Sub-committee Operating Instructions (April 2005) √ ATML Framework 1671 (Chris Gorringe/Mike Seavey) IEEE Par Approved (Nov 2004) √ ATML Framework Draft (Review April 2005) √ ATML Framework Requirements (Review April 2005) √ ATML Framework Draft Document (H) (Oct 2005) √ ATML Framework IEEE Editorial & Rev 2 (Jan 06) √ ATML Framework Ballot (May 2006) √ Capability (Dan Pleasant) Requirements (Sept 2005) √ Draft Schema Snippet – Component (May 2006) Finalize inputs to other groups (Jun 2006) Schema – Component Added to Hardware Common (July 2006)

ATML/IEEE Schedule (TII Cont) UUT Description 1671.3 (John Ralph) Requirements (April 2005) √ Draft Schema (Review June 2005) √ Draft 2 Schema review (Jan 2006) √ Candidate Schema (Mar 2006) √ Draft Document (Oct 2006) Ballot Date (2007) Test Configuration 1671.4 (Tim Davis) Start (April 2005) √ Requirements (July 2005) √ Draft Schema (Review Oct 2006) √ Candidate Schema (July 2006) Ballot date (2008) Test Station P1671.6 & Test Adapter P1671.5 (Tamara Einspanjer) Draft Schema (Jan 2006) √ Final Schema (Apr 2006) √ Candidate Schema (Jul 2006) Draft Standard (Jan 2007)

ATML Schedule TAD Test Description P1671.1 (Ion Neag) Draft Schema review (Oct 2005) √ The spec is developed by Mike Seavey and Ion They handle separate sections that we will merge when creating the Draft version. Draft Schema (Jan 2006) √ Draft 10 Schema (May 2006) √ Candidate Schema (May 2006) PAR (Oct 2005) √ Draft Standard (Nov 2006) Ballot Date (Jan 2007) Instrument Description P1671.2 (Teresa Lopes) Draft Schema review (July 2005)√ Final Draft Schema (Apr 2006) √ Candidate Schema (Jun 2006) Draft Standard (Apr 2007) Ballot Date (May 2007)

ATML Schedule (DMC) Diagnostics (Tim Wilmering) AI-Estate Amendment (a) AI-ESTATE (1232) is working on an update to the -2002 published standard. P1636 SIMICA Draft (b) SIMICA is working to get to an initial Ballot. Ballot (Jan 2007) Test Results 1636.1 (John Ralph) ATML Candidate (Dec 2004) √ PAR Approved (Mar 2005) √ DMC Requirements Document (Review April 2005) √ 1636.1 Draft (Review April 2005) √ Draft 2 posted with DMC (Oct 2006) √ Draft 4 Ready for BALLOT (May 1) Test Results Ballot Process (May 1st 2006)

ATML Meeting Schedule Bi-Weekly Teleconferences 4 Meetings a year plus additional break-out working group as necessary Synchronise with SCC20/01 meetings Jan 17-19th Orlando (LM) √ Late April SCC20 Pax River (Wyle Labs) √ Aug 8-10th (provisional) Santa Rosa (Agilent) ATC2006 Anaheim – SCC20, TII Management Only End Oct/Nov, San Diego (Vektrek)/Madrid (Indra)