ATML Status April 2008 Issue 15 An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committees

ATML ATML’s mission is to define a collection of XML-based schemas that allows ATE and test information to be exchanged in a common format adhering to the XML standard ATML defines a framework through which different architectures using XML can be implemented. defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures. Show examples of the net centric services by which this information can be exchanged across different ATS platforms as part of a maintenance process. defines the XML format that these elements. The ATML specifications will define: How to define XML schemas that represent ATE and test information. A set of XML schemas supporting the exchange of specific ATE and test information. The ATML specifications will support: services that can be used for exchanging ATE and test information in a distributed net-centric environment. services supporting the exchange of specific ATE and test information in specific common areas.

ATML ATML Overview and Architecture IEEE Std 1671 - 2006 Signal Descriptions : STD IEEE Std 1641 - 2004 Instrument Description ( 1671 . 2 ) Test Station ( 1671 . 6 ) Key : In IEEE Ballot Process Draft of the Standard Standard approved by the IEEE Errata to Standard approved by the IEEE Draft revision of a standard Started Test Adapter ( 1671 . 5 ) Diagnostics : AI - ESTATE Test Configuration IEEE Std 1232 - 2002 IEEE Std 1671 . 4 - 2008 UUT Description IEEE Std 1671 . 3 - 2008 Test Description ( 1671 . 1 ) SIMICA Maintenance Action Information ( 1636 . 2 ) SIMICA Test Results and Session Information IEEE Std 1636 . 1 - 2007 ATML Common , HardwareCommon , TestEquipment , and Capabilities ( 1671 )

SCC20 & ATML Organisations The IEEE SCC20 is the standards organisation through which the ATML components (i.e. schemas and documentation) will be published under various IEEE standards. The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML. The ATML group provides draft schemas and associated documents, examples, use cases, requirements and conducts trial use of any ATML components. Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components.

SCC20 Organisation for 2008 Common , HardwareCommon TestEquipment Key : Synthetic Instruments UpConverter DownConverter ARB Digitizer Capabilities SCC 20 Steering and Administrative Chair Mike Seavey ( Northrop Grumman ) Vice Chair John Sheppard Johns Hopkins University Secretary Dave Droste DRS - TEM Liaisons CS Joe Stanco & Mark Kaufman I M AES Bill Ross DoD Malcolm Brown MoD Les Orlidge NDIA Administrative ADMIN AAI Hardware Interfaces HI Co Mike Stora SysIntech Diagnostic and Maintenance Control DMC Tim Wilmering Boeing NWSC / Corona Johns Hopkins University Test and ATS Description TAD Ashley Hulme EADS Ion Neag Reston Software Test Information Integration TII Teresa Lopes Teradyne Chris Gorringe John Ralph IEEE 1505 Receiver Fixture Interface RFI P . 1 Common Test Interface Pin Map 1522 Testability and Diagnosability 1232 AI ESTATE 1636 SIMICA Test Results and Session Information 2 MAI 1546 DTIF Guide 1445 DTIF 1641 STD 716 C ATLAS 771 Guide to the use of ATLAS Guide to the use of STD 1671 Test Description Instrument Description ATML Overview and Architecture 3 UUT Description 4 Test Configuration 5 Test Adapter 6 Test Station ATML Component Errata Synthetic Instrument Annexes Tier RFI IEEE Staff Liaison Soo H Kim S H @ ORG Pins Ports Connectors Proposed ATML Users Guide

ATML’s 2008 Objectives & Goals To have the P1671.2 (Instrument Description) Trial-Use Standard: complete the formal ballot process by May 2008 to submit as a trial-use standard by Q3 2008 To have the P1671.5 (Test Adapter) Trial-Use Standard: complete the formal ballot process by Jul 2008 To have the P1671.6 (Test Station) Trial-Use Standard: To have the P1671.1 (Test Description) Trial-Use Standard: written, reviewed and to start the formal ballot process by May 2008 Ready for publication Dec 2008 to submit as a trial-use standard by Q5 2008

ATML’s 2008 Objectives & Goals (cont) Review associated candidate schemas for all ATML components Q1 Signal Description (STD - 1641) Errata v2 Q3 Update 1671-2006 & errata for draft full use standard Q4 Signal Description (STD - 1641) Dec 2008 Start Ballot Review All IEEE Std 1671 ATML Components (P1671.1 thru P1671.6 & P1636.1) in line with 1671 draft Full Use Standard

Standards & Schema Revisions (1 of 2)

Standards & Schema Revisions (2 of 2)

ATML Overview & Architecture (IEEE Std 1671-2006) Published December 16, 2006 Common schema Version 1.01 HardwareCommon Version 1.01 Errata Document to “replace” published Annex B Presently at Draft 10 Errata until 2009; to be posted on IEEE Errata web-site Common schema Version 2.01 HardwareCommon schema Version 2.02 TestEquipment schema Version 0.16 Published IEEE Std 1671™-2006 did not include Test Equipment

ATML Overview & Architecture (cont) ATML Capabilities Proposed as “new” Annex C Errata to IEEE Std 1671 until 2009; to be posted on IEEE Errata web-site Annex Document presently at Draft 1.1 Capabilities schema Version 0.04 ATML Pins, Ports, Connectors Material to be posted on the TII web-site Future ATML Users Guide

ATML Test Description (P1671.1) Task Date (month/day/year) Draft Standard Draft 2.0 will be available for review on 5th May 08 Upload Draft Document to IEEE MEC April 08 MEC Approval Invitation to Ballot 11th April 08 Initiate Ballot May 08 Ballot Closed Initial Ballot Results -

ATML Instrument Description (P1671.2) Task Date (month/day/year) Draft Standard Draft 6: 09/04/07 Incorporates Synthetic Instruments as Annexes: Up-converter, Down-Converter, ARB, Digitizer Upload Draft Document to IEEE MEC 09/04/07 MEC Approval 10/12/07 Invitation to Ballot 10/22/07 (Closed 11/15/07) Initiate Ballot Draft 8: 11/28/07 Ballot Closed 01/14/08 Initial Ballot Results –Passed Number of Balloters = 45 44 Responded 97.8% (≥ 75% of balloters) Affirmative = 36 Negative = 4 Abstain = 4 Approval Rate 90.0% (≥ 75% of returned ballots) Abstain Rate 9.1% Number of Comments = 553 (572)

ATML Instrument Description (cont) Task Date (month/day/year) Ballot Resolution 01/15/08-TBD Re-Circulation Ballot 17th April 2008 Re-Circulation Ballot Closes 2nd May 2008 Recirculation Ballot Results No comments – thus far IEEE RevCom Submittal Package IEEE RevCom Meeting

ATML UUT Description (IEEE Std 1671.3-2008) Task Date (month/day/year) Draft Standard Draft 3: 03/03/07 Upload Draft Document to IEEE MEC 03/03/07 MEC Approval 04/04/07 Invitation to Ballot 04/25/07 Initiate Ballot Draft 6: 06/13/07 Ballot Closed 07/13/07 Initial Ballot Results - Passed Number of Balloters = 55 45 Responded 81.8% (≥ 75% of balloters) Affirmative = 40 Negative = 2 Abstain =3 Approval Rate 95.2% (≥ 75% of returned ballots) Abstain Rate 6.7% Number of Comments = 118

ATML UUT Description (cont) Task Date (month/day/year) Ballot Resolution 07/13/07-09/05/07 All 118 comments have been addressed Regardless of classification or vote Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified. Re-Circulation Ballot Draft 8: 09/05/07 Re-Circulation Ballot Closed 09/14/07 Recirculation Ballot Results - Passed Number of Balloters = 55 48 Responded 87.3% (≥ 75% of balloters) Affirmative = 44 Negative = 2 Abstain =2 (1 Lack of time, 1 Other) Approval Rate 95.7% (≥ 75% of returned ballots) Abstain Rate 4.2% Number of Additional Comments = 22 IEEE RevCom Submittal Package 10/09/07 IEEE RevCom Meeting - Approved 12/05/07 preliminary RevCom comments received/addressed November 2007

ATML UUT Description (cont) Task Date (month/day/year) Copy-Edited Review package due 01/30/08 Comments & Corrections due 02/20/08 Target IEEE Publication date 03/28/08

ATML Test Configuration IEEE Std 1671.4-2008 Task Date (month/day/year) Draft Standard Draft 3: 03/03/07 Upload Draft Document to IEEE MEC 03/03/07 MEC Approval 04/04/07 Invitation to Ballot 04/25/07 Initiate Ballot Draft 6: 06/13/07 Ballot Closed 07/13/07 Initial Ballot Results - Passed Number of Balloters = 54 44 Responded 81.5% (≥ 75% of balloters) Affirmative = 39 Negative = 2 Abstain =3 Approval Rate 95.1% (≥ 75% of returned ballots) Abstain Rate 6.8% Number of Comments = 102

ATML Test Configuration (cont) Task Date (month/day/year) Ballot Resolution 07/13/07-09/05/07 All 102 comments have been addressed Regardless of classification or vote Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified. Re-Circulation Ballot Draft 9: 09/05/07 Re-Circulation Ballot Closed 09/14/07 Recirculation Ballot Results - Passed Number of Balloters = 54 47 Responded 87.0% (≥ 75% of balloters) Affirmative = 44 Negative = 1 Abstain =2 (1 Lack of time, 1 Other) Approval Rate 97.8% (≥ 75% of returned ballots) Abstain Rate 4.3% Number of Additional Comments = 1 IEEE RevCom Submittal Package 10/02/07 IEEE RevCom Meeting - Approved 12/05/07 preliminary RevCom comments received/addressed November 2007

ATML Test Configuration (cont) Task Date (month/day/year) Copy-Edited Review package due 03/05/08 Comments & Corrections due 03/26/08 Target IEEE Publication date 04/30/08

ATML Test Adapter (P1671.5) Task Date (month/day/year) Draft Standard Upload Draft Document to IEEE MEC 10/01/07 MEC Approval 10/12/07 Invitation to Ballot 11/28/07 (Closed 12/28/07) Initiate Ballot 13th Feb 2008 Ballot Closes 13th March 2008 Initial Ballot Results - Passed Number of Balloters = 32 31 Responded 97% (≥ 75% of balloters) Affirmative = 24 Negative = 3 Abstain =4 Approval Rate 88.98% (≥ 75% of returned ballots) Abstain Rate 12.9% Number of Comments = 73

Date (month/day/year) Task Date (month/day/year) Ballot Resolution 04/22/08-05/22/08 All 73 comments have been addressed Regardless of classification or vote Re-Circulation Ballot Re-Circulation Ballot Closed Recirculation Ballot Results - Passed IEEE RevCom Submittal Package IEEE RevCom Meeting - Approved

ATML Test Station (P1671.6) Task Date (month/day/year) Draft Standard Upload Draft Document to IEEE MEC 10/01/07 MEC Approval 10/22/07 Invitation to Ballot 11/28/07 (Closed 12/28/07) Initiate Ballot 13th Feb 2008 Ballot Closes 13th Mar 2008 Initial Ballot Results - Passed Number of Balloters = 32 31 Responded 97% (≥ 75% of balloters) Affirmative = 24 Negative = 3 Abstain =4 Approval Rate 88.98% (≥ 75% of returned ballots) Abstain Rate 12.9% Number of Comments = 105

Date (month/day/year) Task Date (month/day/year) Ballot Resolution 04/22/08-05/22/08 All 105 comments have been addressed Regardless of classification or vote Re-Circulation Ballot Re-Circulation Ballot Closed Recirculation Ballot Results - Passed IEEE RevCom Submittal Package IEEE RevCom Meeting - Approved

ATML & SIMICA(IEEE-1636.1) SIMICA:Test Results and Session Information IEEE Std 1636.1-2007 TestResults schema Version 2.03

ATML & STD (IEEE-1641) STD: (Update to IEEE Std 1641-2004) Draft updated standard under development Draft updated schemas under development Start Ballot December 2008

Balloting - Spanning Calendar Years Clarification Once the initial ballot begins, the ballot group is set until all rounds of balloting are finished. Even if a ballotter does not renew his or her IEEE membership. myProject and myBallot accounts remain active only for activities selected while IEEE membership was active. myProject will indicate that IEEE membership has expired. All votes and comments are valid, and are to be handled as any other IEEE-SA member. The IEEE does not wish to re-establish balloting constituencies.

IEEE Std1671-2006 Schema & Document Locations

2008 Meeting Schedule Face-to-Face Meetings: Additionally: Jan. 15-17; Orlando, FL (Lockheed Martin) Apr. 22nd-24th ; SCC20 08-1 St. Louis, MO (Boeing) Jul. TBA; Open - meeting presently planned for Santa Rosa 6-8th Sept.; SCC20 08-2 Salt Lake City, UT In conjunction with AUTOTESTCON (Sept. 8-11) Oct./Nov. TBD; Open - no meeting presently planned Additionally: Bi-Weekly Teleconferences 4 Meetings a year plus additional break-out working groups as necessary Synchronise with SCC20 meetings