IEEE SCC20 Standards Status

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Presentation transcript:

IEEE SCC20 Standards Status Standards Coordinating Committee 20 SCC20 IEEE SCC20 Standards Status With emphasis on the IEEE-1671 (ATML) Series of Standards September 15, 2010 Mike Seavey SCC20 Chair & 2010 Member of the IEEE Standards Board AUTOTESTCON 2010

ATS Elements Supported by the Automatic Test Markup Language (ATML)

ATML Framework and Sub Domains

ATS Sub Domains

Present ATML Series of Standards: IEEE-1671 ATML Overview and Architecture IEEE Std 1671-2006 Full Use ATML: Test Description IEEE Std 1671.1-2009 Trial Use ATML: Instrument Description IEEE Std 1671.2-2008 ATML: UUT Description IEEE Std 1671.3-2007 ATML: Test Configuration IEEE Std 1671.4-2007 ATML: Test Adapter IEEE Std 1671.5-2008 ATML: Test Station IEEE Std 1671.6-2008 SIMICA Standards: IEEE-1636 Software Interface to Maintenance Information Collection and Analysis IEEE Std 1636-2008 Trial Use SIMICA: Test Results and Session Information IEEE Std 1636.1-2007 SIMICA: Maintenance Action Information IEEE P1636.2 -----

Some of the other SCC20 Standards AI-ESTATE IEEE Std 1232-2002 Full Use STD IEEE Std 1641-2010 RFI IEEE Std 1505-2006 A revision to the Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) standard is in process. It will be submitted to the IEEE Standards Board for approval in the near future A revision to the Receiver Fixture Interface (RFI) standard is on the IEEE Standards Board agenda for approval

IEEE Download site for IEEE-1671 Series XML Schemas

What’s on the Horizon ? ATML Overview and Architecture A revision to the 2006 publication (and associated XML schemas) has completed the IEEE ballot process On the IEEE Standards Board agenda for approval ~120 page document is now over 420 pages Each of the IEEE-1671 “dot” Standards Revisions to each of the six standards and their associated XML schemas will be made “simultaneously” SIMICA A revision to the Test Results (IEEE Std 1636.1) publication (and associated XML schemas) has begun IEEE-P1636.2 is on the IEEE Standards Board agenda for approval