UCSB Testing 3 Stereo Modules Tested 1 SS6 Module Tested

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Presentation transcript:

UCSB Testing 3 Stereo Modules Tested 1 SS6 Module Tested 2 Grade A 1 Grade A, but has slight problem in calibration injection circuit 1 SS6 Module Tested Grade A, but had 1 short in sensor and blew a pinhole during HV ramp up at 320 V With new hybrids all modules: Have increased noise on sensor edges More CMN which required further optimization of stand

Problem with Calibration Injection 1 chip has slight problem with calibration injection Missing event or events with 0 data 1% of time Never seen previously Causes drips in pulse shape 0’s in pinhole run, which causes channels to be marked as pinholes Only has shown up on new sensors 1 of 18 chips (UCSB) 1 of 8 chips (Aachen) Not clear how/if hybrid changes caused this

Increased noise edge Changed bias return circuit Added capacitor to circuit Causes increase noise on edge of sensors 1.75 vs 1.5 ADC Caused macro to fail in failure type finding Increased noise After changing grounding/stand fixed noise and macros work

Irradiation results